DOI,paragraph,compound,extracted_value,wavelength
10.1016/j.ijleo.2018.09.026,", respectively. Refractive index achieved is 1.93 for Ta2O5 and 1.43 for SiO2 at 532 nm wavelength due to proper maintenance of evaporation rate, temperature and oxygen partial pressure during deposition process. Extinction coefficient is very small (≈0.0025) for both the materials. The film structures were simulated with root mean squared (RMS) error values. The simulated results along with RMS values are shown in ",SiO2,1.43,nan
10.1016/j.ijleo.2018.09.026,", respectively. Refractive index achieved is 1.93 for Ta2O5 and 1.43 for SiO2 at 532 nm wavelength due to proper maintenance of evaporation rate, temperature and oxygen partial pressure during deposition process. Extinction coefficient is very small (≈0.0025) for both the materials. The film structures were simulated with root mean squared (RMS) error values. The simulated results along with RMS values are shown in ",Ta2O5,1.93,nan
10.1016/j.cap.2010.11.048,"As shown in , the reflectance approached to zero at a wavelength which equals to 4n1d1. And the wavelength where the reflectance is zero shifted to the right as the increase of the SiNx thickness. From the above reflectance analysis, the optimum refractive index and the thickness of the ARC layer are generally determined before depositing SiNx film. Since the wavelength at the maximum spectral irradiance of the sunlight is 639 nm and the refractive index of silicon at that wavelength is 3.85, the refractive index and the thickness of the SiNx film for the efficient ARC layer are 1.96 and 82 nm, respectively.",silicon,3.85,nan
10.1016/j.jpcs.2012.12.019,"V2O5 nanowires (NWs) were grown on Si (100) and quartz substrates using evaporation–condensation method with the VLS growth technique. The chemical composition of the synthesized nanostructures was analyzed using energy dispersive analysis of X-ray (EDAX). The surface morphology and crystal structure of the synthesized NWs were characterized by scanning electron microscope (SEM) and X-ray diffraction (XRD), respectively. The XRD pattern revealed an orthorhombic symmetry of the deposited NWs while the SEM showed randomly distributed NWs with diameters of 50–200 nm and lengths in the range of 0.8–1.5 μm. The spectroscopic ellipsometry data for V2O5 NWs films were acquired in the wavelength range 400–2100 nm. The thickness and optical constants were obtained from the data fits. The estimated refractive index for V2O5 NWs was found to be 2.24 at λ=626.30 nm. The indirect and direct band gap values were calculated and found to be 2.26±0.02 eV and 2.83±0.02 eV, respectively. The Urbach energy Eu value was 286 meV.",V2O5,2.24,nan
10.1016/j.jpcs.2012.12.019," shows the refractive index (n) and the extinction coefficient (k) at the measuring wavelength from 400 to 2100 nm of the V2O5 nanowire film. The refractive index follows the anomalous dispersion in the strong absorption region from 400 to 640 nm. The descending course of the curve, above 640 nm, is characteristics of normal dispersion. The calculated refractive index was found to be 2.24 at λ=626.30 nm. This value is lower than the value 2.45 (λ=626.30 nm) reported for V2O5 films prepared by the evaporation technique and annealed at 300 °C . This may be attributed to the low packing density for the films obtained by the used CVD technique for V2O5 films. The k values of V2O5 film decrease with increasing wavelength and became much closer to zero at higher wavelengths.",V2O5,2.24,nan
10.1016/j.sse.2012.04.012,". Refractive index of Al2O3 has been reported to be 1.74 at 1550 nm. In the prepared ALD samples the index is measured 1.63 and the ‘k’ value is 0.0009. AlN layers deposited with 300, 750, and 1000 cycles have a thickness of 14.2 nm, 32.2 nm and 44.9 nm. As shown in ",Al2O3,1.74,nan
10.1016/j.foodres.2015.05.008,"Particle size and ζ-potential of the silica nanoparticles, Si–EPL microparticles and emulsion were measured using a particle size and ζ-potential analyzer (Malvern Zetasizer, MA). The settings were — material: oil, dispersant: water, measurement angle: 90°, measurement duration: automatic. Particle refractive index for silica suspensions was 1.537 and for oil droplets was 1.45.",silica,1.537,nan
10.1016/j.cap.2011.03.082,"However, InGaN-based UV-LEDs have still yet to reach their full potentials. In order to get to those points and realize the substitution of GaN based UV-LEDs for the conventional UV-lamp sources, we must further improve the external quantum efficiency (EQE) and light output of UV-LEDs. One of the main factors that UV-LEDs yield low light output is associated with difficulty in obtaining highly reliable p-type ohmic electrodes, which have high transmittances over 70% and refractive index similar to that of GaN (n = 2.5). Currently, for fabrication of InGaN-based UV-LEDs, Pd-based semi-transparent electrodes as well as Ag-based reflective electrodes are widely used . However, these electrodes suffer from several problems, such as the absorption of a significant amount of light emitted from active layers and the low refractive index of the electrodes. Thus, to increase EQE of UV-LEDs, the development of p-type ohmic electrodes that have a high light transmittance and a refractive index similar to that of GaN is essential. To meet these conditions, TCOs such as indium tin oxides (ITO) should be considered as a transparent p-type electrode for UV-LEDs. However, ITO based electrode has not yet been studied in detail, since the optical band gap of the conventional ITO layer is normally lower than 4.0 eV, which may result in a significant absorption of light emitted from active layers of UV-LEDs.",GaN,2.5,nan
10.1016/j.foodres.2015.04.022,"The particle size distribution of the emulsions was measured using a laser light scattering instrument (Mastersizer 2000, Malvern Instruments, Worcestershire, UK). To avoid multiple scattering effects, emulsions were diluted using buffer solution at the same pH as the sample being analyzed. The particle size is reported as the surface weight mean diameter (D32) and the volume-weighted mean diameter (D43). The refractive indices of the phosphate buffer solution and fish oil used in the particle size analysis calculations were 1.330 and 1.481, respectively.",phosphate,1.33,nan
10.1016/j.cap.2010.12.021,"PMMA (polymethylmethacrylate) sheets of 1 mm thickness (GoodFellow Ltd.) were utilized as the upper and lower plastic sheets in the present study. Several micro-holes were fabricated on the upper sheets by a precision mechanical drilling process with a micro-drill of 300 μm in diameter. For the realization of microlenses, LOCTITE® UV adhesive 352 was used as the UV curable resin. The refractive indices of the completely cured UV resin and the PMMA were about 1.51 and 1.49, respectively. The difference of the refractive indices between the resin and PMMA is small, thereby enabling us to expect the better optical performance of the final structure.",PMMA,1.51,nan
10.1016/j.vacuum.2004.01.030,"All designs are of multi-cavity, Fabry–Perot-type filters. The number of layers thus exceeds 100. The reduction of the bandwidth without increasing the number of layers too much, using a high-order spacer and a reflector, has been addressed . Polarization-insensitive designs that involve an absentee layer inserted into the layer near the spacer have been proposed for filters used at a high angle of incidence . A design with a symmetric structure, using high-order reflectors and applying a 2L absentee layer combined with a 2 H spacer, has been found to be an effective design . Let Ta2O5 be high and SiO2 be low-index materials with refractive indices of 2.13 and 1.45, respectively, and H be quarter wave layers made of high refractive index material and L be low refractive index material. The design is sub/L[(HL)7 2L2H2L (LH)7 L] [(HL)8 2L2H2L (LH)8 L]3 [(HL)7 2L2H2L (LH)6 0.656L 1.526H] /air, where sub stands for substrate with a refractive index of 1.656 (Ohara glass WMS-02). WMS-02 was chosen here as a substrate in order to reduce the thermal shift . The last two layers act as an antireflection coating. Such a design provides the advantage of reduced polarization loss since an absentee layer is inserted near the spacer structure, yielding 3L2H3L or 3H2L3H, making the filter less polarization dependent . ",SiO2,2.13,nan
10.1016/j.vacuum.2004.01.030,"The deposition rate, vacuum conditions, working conditions of the ion source, the layer thickness and the substrate temperature are all important parameters in the fabrication of a good filter. Any fluctuation in these parameters during coating can cause the filter to fail to meet its specifications. Accordingly, before the coating process was performed, the substrate, WMS-02, was baked at 200°C for 1 h and cleaned using an ion beam for 3 min at a beam voltage of 500 V and a beam current of 400 mA to ensure stability. A quartz monitor was used to control the deposition rate and an optical monitor was used to monitor the thickness of the layers. The bandwidth of the monitoring light was 0.12 nm, corresponding to 0.03 mm wide slit in the monochromator at 1550 nm.The monitoring light was aimed 7 mm from the center of the substrate that rotated at 800 rpm during the coating. A specially designed heater was used to maintain the temperature of the substrate at 200°C. The fluctuation in the temperature during the coating of Ta2O5 and SiO2 was less than 10°C. The ion beam voltage and ion beam current of the oxygen ions were set to 600 V and 450 mA so that the refractive indices of Ta2O5 and SiO2 were 2.13 and 1.45, respectively. The vacuum pressure was 1.8×10−2
Pa during the deposition.",SiO2,2.13,nan
10.1016/j.radphyschem.2005.04.010,". While the source stays in the gas phase, the amplitude of scintillation signal remains independent of the liquid level. However, when the liquid covers the source, the amplitude abruptly decreases due to the fact that the scintillation light, emitted in the liquid phase, has now to cross the interface of two media with very different refraction indexes (the refractive index of liquid xenon for its scintillation light is 1.69, as measured in , while that of the gas phase is very close to 1), resulting in a significant decrease of the solid angle. This solid angle increases as the liquid height increases and consequently, the signal amplitude also increases. The rise of amplitude stops when the liquid reaches the PMT window.",xenon,1.69,nan
10.1016/j.eurpolymj.2015.12.016,"In this study, we report the synthesis of 1,5-bis(2-acryloylenethyl)-3,4-ethylenedithiothiophene (BASEDTT) as one of the photo curable acrylate monomers. The high sulfur content and low molar volume of BASEDTT can improve refractive indices of acrylic resin. The acrylate resin exhibited high refractive index (1.6443) with high glass transition temperature (>134 °C), high optical transparency, and low birefringence (0.0043). The effects of polymer structure on these important characteristics are discussed in detail.",acrylate,1.6443,nan
10.1016/S0925-4005(00)00707-3,"Multimode optical fibers, PUV 400 BN (CeramOptec, GmBH, Bonn), were used in these experiments. They present a pure silica core diameter of 400 μm, with a refractive index of 1.4571 (at 633 nm) and a cladding diameter of 440 μm, with a refractive index of 1.4011 (at 633 nm). Their black nylon jackets were stripped away from a 1-cm long optical fiber tip, which was then used for the immobilization of bioluminescent cells .",silica,1.4571,nan
10.1016/j.optlaseng.2015.06.001,"To access the quantitative measurement ability of the proposed method, a phase plate etched in BK7 glass with a refractive index of 1.5168 is used as the specimen. The step height of the specimen is about 580.22 nm supplied by BRUKER Atomic Force Microscopy (AFM). Based on the proposed setup, three phase-shifted interferograms are acquired in one shot as shown in ",BK7,1.5168,nan
10.1016/j.optlastec.2015.07.004,"where λ is the wavelength, n is the refractive index of the media and l is the plate thickness. We found in our earlier experiment stated in scheme-1 that peak λ was nearly 576.8 nm at 60.15 mJ/cm2 for S1. The refractive index of quartz at that wavelength is nearly 1.5448 . Now, by this if we calculate FSR we get a value of 0.0957 nm which is very close to the experimental value.",quartz,1.5448,nan
10.1016/j.saa.2009.10.019,. It is seen that the refractive indices of heat-treated samples of 2 and 50 h increases rapidly as compared to precursor glass. These are due to the formation of KNbO3 crystals having high refractive index (2.2912 at 600 nm ).,KNbO3,2.2912,nan
10.1016/j.saa.2009.10.019,"The uplifting of the base line for glass–ceramic sample due to scattering imparted by the nanocrystallite phase is discussed as follows. Normally the decrease of optical transmission of the glass–ceramics happens mainly because of two reasons, one is the crystallite size and the other is the refractive index difference between crystalline and residual amorphous phase. In this system, the crystallite size is found to be in nanometric (7–15 nm) scale which smaller than the visible wavelength. But the refractive index of the formed KNbO3 phase is found to be considerably higher (Ri
= 2.2912 at 600 nm ) than the residual glassy phase (Ri
= 1.7681 at 632.8 nm, see ); hence the later case may be responsible for changes observed in the measured optical absorption spectra. This is in accordance to the Rayleigh scattering model since the crystallites (7–15 nm) are smaller than λ/20 for visible wavelengths. The scattering loss τ, is given by :",KNbO3,2.2912,nan
10.1016/j.vacuum.2004.03.006,". The highest refractive index (2.71) is observed for films deposited from acetylene without hydrogen. The refractive index drops down with increase in hydrogen ratio in the deposition gas mixture over the whole hydrogen concentration range. The lowest refractive index was observed for films deposited from hexane and hydrogen mixture (1.94). As it is known, the density and refractive index are closely correlated and the decreasing tendency of the refractive index is related to the formation of a less dense network because of higher hydrogen content in the film . Schwarz-Selinger et al. found the correlation between the refractive index of refraction and hydrogen fraction in the a-C:H, deposited by plasma CVD. We can estimate that our films, deposited without hydrogen, have <5–8% hydrogen. The a-C:H films with lowest refractive index have ∼40% hydrogen.",acetylene,2.71,nan
10.1016/j.physe.2015.06.035,"We calculate the linear and nonlinear properties of the DWELL structure using the carrier density, σ=3×1022
(m−3), damping rate, γ=1012
(1/s) same for all relaxation rates and refractive index of GaAs as a constant value nr=3.2. Based on the dipole moment matrices we will obtain susceptibilities to explore the linear and nonlinear properties of the DWELL structure.",GaAs,3.2,nan
10.1016/j.optmat.2017.12.023,"The considered refractive indices of the SnS2 film have been nω = 2.82 and n3ω = 3.7 at λω = 1550 nm and λ3ω = 517 nm, respectively []. The corresponding phase mismatch and the coherence length are Δk ∼105 cm−1 and LC ∼300 nm, respectively. We can notice the high value of Δk, leading to low values of the conversion efficiency.",SnS2,2.82,nan
10.1016/j.dyepig.2006.07.022,"For comparison purposes, it was reported that films of pure Al2O3 have refractive index values of 1.58 (at 1000 nm) and 1.68 (at 250 nm) . Also, electron beam evaporated Al2O3 films were reported to possess refractive index value of 1.56 (at 830 nm) measured by ellipsometry . Generally, slight dissociation and oxygen loss occurs during evaporation, and the films grow with a crystalline microstructure with low packing density. The refractive indices are dependent on the degree of oxidation, the substrate temperature and the lattice parameters matching between the substrate and material deposited, affecting the film density achieved.",Al2O3,1.58,nan
10.1016/j.saa.2009.11.032,", curve a) shows six sharp absorption bands due to their 4f intrashell transitions arising from the ground state 6H5/2 of Sm3+. The energies associated with these transitions were recognized as per Carnall's convention . The Au0 and Sm3+ co-doped nanocomposites (, curves b, c and d) displays broad plasmon (SPR) absorption bands (Lorentzian curves) characteristic of nano sized Au0 in addition to the inherent absorption peaks of Sm3+. The position of plasmon peak is influenced by the refractive index of the host . Sodalime silicate glasses with refractive index around 1.5 features plasmon peak of Au0 NPs at 525 nm . Our KBS antimony glass with refractive index around 1.947 shifts Au0 plasmon peak to 613 nm. The SPR peak of non-spherical NPs is also red-shifted compared to spherical NPs . The maxima of the plasmon peaks (λmax) as listed in experiences a distinctive red-shift towards higher wavelength (from 613 to 678 nm) with increase in Au concentration (from 0.003 to 0.3 wt%). The SPR bands gradually red-shift, broaden, become asymmetric with their tails extending up to 1100 nm manifesting decrease in Au–Au interparticle spacing from 135 Å down to 29 Å (see ",silicate,1.5,nan
10.1016/j.carbon.2014.04.067,"Prior to measurements, dispersions of GO and rGO were sonicated for 30 min. The disc was loaded with a sucrose gradient (8% and 24% sucrose in water, CPS Instruments), which comprised of 10 layers, each with a total injection volume of 1.8 mL. The average density, refractive index and viscosity values of the sucrose gradient fluid were 1.02 g/mL, 1.35 and 0.95 cps, respectively. Dodecane (0.75 mL) was added as an evaporation barrier and a disc rotational frequency of 21,000 rpm was used. The sample (0.1 mL) was then injected into the disc for analysis. Measurements were performed in triplicate and before each run a 0.475 μm polyvinyl chloride (PVC) latex calibration standard (0.1 mL) was injected. Particles were assumed to have a density of 2.267 g/mL, a refractive index of 2.42, zero absorption and a non-sphericity factor of 1.5 for cubic/irregular-shaped particles. The CPS instruments software was used to generate the PSD data with an accuracy of ±0.5%.",sucrose,1.02,nan
10.1016/j.optmat.2017.12.041,"Hybrid inorganic/organic one dimensional photonic crystal based on alternating layers of Si/HMDSO is elaborated. The inorganic silicon is deposited by radiofrequency magnetron sputtering and the organic HMDSO is deposited by PECVD technique. As the Si refractive index is n = 3.4, and the refractive index of HMDSO layer depend on the deposition conditions, to get a photonic crystal with high and low refractive index presenting a good contrast, we have varied the radiofrequency power of PECVD process to obtain HMDSO layer with low refractive index (n = 1.45). Photonic band gap of this hybrid structure is obtained from the transmission and reflection spectra and appears after 9 alternative layers of Si/HMDSO. The introduction of defects in our photonic crystal leads to the emergence of localized modes within the photonic band gap. Our results are interpreted by using a theoretical model based on transfer matrix.",HMDSO,1.45,nan
10.1016/j.optmat.2017.12.041,"Finally, the silicon which refractive index is 3.4 will be considered as the high index material, we will choose as low material index the HMDSO layer obtained for RF power 20 W and corresponding to an index to 1.45. The photonic crystal will consist of an alternating Si/HMDSO layers with best a refractive index contrast Δn = 1.95.",HMDSO,1.45,nan
10.1016/j.optmat.2017.12.041,"By respect the Bragg mirror law (nSidSi = nHMDSOdHMDSO = λ0/4), which gives for λ0=1,55 μm and for the refractive indexes nSi = 3.4 and nHMDSO = 1.45, we obtain for Si and HMDSO respectively dSi = 115 nm and dHMDSO = 265 nm corresponding to a time deposition tSi = 1 min 30s and tHMDSO = 2 min. We present in (b) transmission spectra for layers of Si and HMDSO, where we note that these layers transmit light in the visible and infrared range with however, a higher transmission for the HMDSO layer in this wavelength range.",HMDSO,1.45,nan
10.1016/j.optmat.2017.12.041,"Hybrid inorganic/organic one dimensional photonic crystal based on alternating layers of Si/HMDSO is elaborated. The inorganic silicon is deposited by radiofrequency magnetron sputtering and the organic HMDSO is deposited by PECVD technique. As the Si refractive index is n = 3.4, and the refractive index of HMDSO layer depend on the deposition conditions, to get a photonic crystal with high and low refractive index presenting a good contrast, we have varied the radiofrequency power of PECVD process to obtain HMDSO layer with low refractive index (n = 1.45). Photonic band gap of this hybrid structure is obtained from the transmission and reflection spectra and appears after 9 alternative layers of Si/HMDSO. The introduction of defects in our photonic crystal leads to the emergence of localized modes within the photonic band gap. Our results are interpreted by using a theoretical model based on transfer matrix.",HMDSO,3.4,nan
10.1016/j.optmat.2017.12.041,In this work we are interested to the elaboration of an hybrid one-dimensional photonic crystal based from an inorganic material the silicon and the pure organic compound (hexamethyldisiloxane: HMDSO) deposited alternatively by sputtering and PECVD with high and low refractive index of 3.4 and 1.4 for respectively Si and HMDSO.,HMDSO,3.4,nan
10.1016/j.optmat.2017.12.041,"Finally, the silicon which refractive index is 3.4 will be considered as the high index material, we will choose as low material index the HMDSO layer obtained for RF power 20 W and corresponding to an index to 1.45. The photonic crystal will consist of an alternating Si/HMDSO layers with best a refractive index contrast Δn = 1.95.",HMDSO,3.4,nan
10.1016/j.optmat.2017.12.041,"By respect the Bragg mirror law (nSidSi = nHMDSOdHMDSO = λ0/4), which gives for λ0=1,55 μm and for the refractive indexes nSi = 3.4 and nHMDSO = 1.45, we obtain for Si and HMDSO respectively dSi = 115 nm and dHMDSO = 265 nm corresponding to a time deposition tSi = 1 min 30s and tHMDSO = 2 min. We present in (b) transmission spectra for layers of Si and HMDSO, where we note that these layers transmit light in the visible and infrared range with however, a higher transmission for the HMDSO layer in this wavelength range.",HMDSO,3.4,nan
10.1016/j.optmat.2017.12.041,"Hybrid inorganic/organic one dimensional photonic crystal based on alternating layers of Si/HMDSO is elaborated. The inorganic silicon is deposited by radiofrequency magnetron sputtering and the organic HMDSO is deposited by PECVD technique. As the Si refractive index is n = 3.4, and the refractive index of HMDSO layer depend on the deposition conditions, to get a photonic crystal with high and low refractive index presenting a good contrast, we have varied the radiofrequency power of PECVD process to obtain HMDSO layer with low refractive index (n = 1.45). Photonic band gap of this hybrid structure is obtained from the transmission and reflection spectra and appears after 9 alternative layers of Si/HMDSO. The introduction of defects in our photonic crystal leads to the emergence of localized modes within the photonic band gap. Our results are interpreted by using a theoretical model based on transfer matrix.",silicon,3.4,nan
10.1016/j.optmat.2017.12.041,In this work we are interested to the elaboration of an hybrid one-dimensional photonic crystal based from an inorganic material the silicon and the pure organic compound (hexamethyldisiloxane: HMDSO) deposited alternatively by sputtering and PECVD with high and low refractive index of 3.4 and 1.4 for respectively Si and HMDSO.,silicon,3.4,nan
10.1016/S0925-4005(01)00762-6,The refractive index of the surrounding sample is set to be n5=1.333 for the purpose of monitoring the aqueous environment. The SPR is supposed to be excited by light rays impacting on the core–metal interface in the fiber with an incident angle between 76.5 and 89.5°. This angle range is determined by taking into account the totally internal reflected condition given by the refractive indices of the fiber core (1.457) and cladding (1.407) and the reflected angle distribution of skew rays propagating through the fiber. Other parameters such as those of silver film (52 nm thick with dielectric constant of −19+1.2i at the wavelength of 670 nm) and thiol layer (1.77 nm thick with refractive index of 1.463) are used in calculations. Since the imaginary part of d4 (noted as d4i) is very small in contrast to its real part (see ,thiol,1.463,nan
10.1016/j.optmat.2018.01.024,"Radius of curvature of the ring that we had considered was 15 μm, separation between ring and bus waveguide was 0.5 μm, and waveguide width was 3.5 μm. The tail of the evanescent field of the bus waveguide was ∼1.25 μm, which is enough to couple light into the MRR. The computed power coupling coefficient between ring and bus waveguide at the chosen radius was 0.541,607 and propagation power loss coefficient per round trip in the ring was 0.0134,767. This power loss coefficient includes both bending loss and propagation loss. The calculated bending loss at 15 μm radius was 10−4 dB/μm while propagation loss value was taken from our own experimental result, which was 0.5 dB/mm []. Since air-cladded SU-8 ridge waveguides are high-contrast waveguides, bending loss is low even for 15 μm bending radius. Whereas, as propagation loss is dependent on sidewall roughness for these photonic wires, these are relatively higher. In all our computations we had taken SU-8 refractive index as 1.574 [], and SiO2 refractive index as 1.447 [], around 1550 nm wavelength of light. The computed through port notch of the structure was −87.98 dB at a resonating wavelength of 1550 nm; and the computed free spectral range (FSR). Quality factor (Q) and extinction ratio (ER) of the designed resonator were 16.79 nm, 30,312 and 13.745 dB respectively for transverse electric (TE) mode using the following equations []:",SiO2,1.574,nan
10.1016/j.jtherbio.2018.07.014,"The physical parameters were as follows. The refractive index of chitin is 1.57 and the extinction coefficient was determined from FTIR measurements (see the corresponding spectrum in (c)) and found to vary from 0.008 to 0.001 (within a 8–14 μm range) and from 0.013 to 0.0016 (within a 3–5 μm range). The corresponding reflection spectra were calculated for a range of angles of incidence and averaged to simulate the diffuse environmental radiation in the beetle's habitat. Averaged absorption spectra after single and triple reflections are shown in (d). Three reflections were chosen as an average between a minimum of two and a maximum of four possible reflections (see rays in ). Both spectra are compared to the reflection spectrum of an unpatterned (flat-surface) scale, shown in the same graph. It is obvious that patterning doubles the amount of absorbed radiation. This is the consequence of the strong electromagnetic-field localization within the cuticular scale, as illustrated in (c). This makes this insect very efficient in capturing direct and diffused solar radiation and using it to heat its body.",chitin,1.57,nan
10.1016/j.sse.2012.04.041,"The refractive index (n) of the TiO2 film measured by ellipsometry was found to be 2.33 and optical dielectric constant could be determined from the refractive index of TiO2 εopt
=
n2
= 2.332
= 5.4389. The Raman spectrum of TiO2 nanocrystalline film annealed at 550 °C is shown in ",TiO2,2.332,nan
10.1016/j.optmat.2017.12.021,"The refractive index of pristine PMMA is closely equal to glass i.e. 1.5. However, at a single wavelength it gradually increases with increasing ion fluence. a shows the variation in refractive index of implanted PMMA at different ion fluences at 632.8 (visible, He-Ne laser) and 900 nm (near IR), respectively. It can be seen that at 632.8 nm there is a minute increase in the refractive index of implanted PMMA with rising ion fluence from 9.3 × 1013 to 4.7 × 1014 ions/cm2. However, a further increase in ion fluence to 6.5 × 1014 and then 8.4 × 1014 ions/cm2 increases the refractive index of PMMA up to 1.93 and 2.51, respectively. Generally, the modification in refractive index depends on changes in chemical structure and material density . On increasing ion fluence, concentration of carbon contents increases at a specific depth which increases not only the density of material but also modifies its structure. Structural changes in PMMA during ion implantation are related to the generation of sp2 carbonaceous clusters , also confirmed by Raman spectroscopy. As a result of increasing carbonaceous structures the incoming light is more scattered which affects the refractive index of implanted PMMA. It is observed that the refractive index of implanted PMMA is high for high frequency light (short wavelength i.e. 632.8 nm) than for low frequency (long wavelength i.e. 900 nm). This type of increasing trend in refractive index is in favor of Cauchy dispersion relation ",PMMA,1.5,nan
10.1016/j.optmat.2017.12.021,"The refractive index of pristine PMMA is closely equal to glass i.e. 1.5. However, at a single wavelength it gradually increases with increasing ion fluence. a shows the variation in refractive index of implanted PMMA at different ion fluences at 632.8 (visible, He-Ne laser) and 900 nm (near IR), respectively. It can be seen that at 632.8 nm there is a minute increase in the refractive index of implanted PMMA with rising ion fluence from 9.3 × 1013 to 4.7 × 1014 ions/cm2. However, a further increase in ion fluence to 6.5 × 1014 and then 8.4 × 1014 ions/cm2 increases the refractive index of PMMA up to 1.93 and 2.51, respectively. Generally, the modification in refractive index depends on changes in chemical structure and material density . On increasing ion fluence, concentration of carbon contents increases at a specific depth which increases not only the density of material but also modifies its structure. Structural changes in PMMA during ion implantation are related to the generation of sp2 carbonaceous clusters , also confirmed by Raman spectroscopy. As a result of increasing carbonaceous structures the incoming light is more scattered which affects the refractive index of implanted PMMA. It is observed that the refractive index of implanted PMMA is high for high frequency light (short wavelength i.e. 632.8 nm) than for low frequency (long wavelength i.e. 900 nm). This type of increasing trend in refractive index is in favor of Cauchy dispersion relation ",PMMA,1.93,nan
10.1016/j.seppur.2010.11.012,"Fourier transform infrared attenuated total reflectance (FTIR-ATR) analyses were performed using a Thermo Nicolet 6700 apparatus to assess water diffusion. 50 scans were recorded in the 4000–400 cm−1 range with 2 cm−1 resolution. The internal reflection element crystal was made from zinc selenide (ZnSe), having a refractive index of 2.42. Thin films of PDMS/SPA-15 were directly cured onto the ATR crystal. The thickness of the films was typically about 50 μm. The penetration depth of the evanescent wave, Dp, calculated from the Harrick's formula was 7 μm at 3400 cm−1.",ZnSe,2.42,nan
10.1016/S0925-4005(01)00559-7,"The operating wavelength of the sensor is determined by the refractive index profile of the waveguide, properties of the SPR-active metal layer, and the refractive index of the sensed medium. In biosensing applications the sensor is desired to be sensitive in a particular region of refractive indices, usually around 1.33 (aqueous environment) in a particular wavelength region (usually between 0.6 and 0.9 μm). In this wavelength range, SPR sensors based on K+↔Na+ ion exchanged waveguides in BK7 exhibit SPR at the refractive index around 1.44 (). In order to shift the operating point of the sensor towards aqueous environment, a thin high refractive index dielectric overlayer can be employed . In this work we use tantalum pentoxide which was chosen for its high refractive index and good environmental stability. ",BK7,1.44,nan
10.1016/j.radphyschem.2005.12.028,"The second experiment in Novosibirsk, in which Cherenkov counters were used, was one with the MD-1 detector at the collider VEPP-4 (Table ). A specific feature of these counters was the use of pressurized ethylene with the refractive index n=1.02. A series of experiments was performed with the MD-1 detector on Υ-resonance and γγ physics in 1980–1985. A review of obtained results was published in Physics Reports ().",ethylene,1.02,nan
10.1016/j.geothermics.2018.10.008,"Particle diameters of polysilicic acids in brine samples were determined at the Sumikawa geothermal station with DLS (Malvern Zetasizer NANO ZSP ZEN-5600). The laser wavelength, detection angle and laser output are 633 nm (He-Ne laser), 173°and 4.0 mW, respectively. The viscosity of the brine is selected as water to be 0.887 cP. The refractive indices of brine and silica particles are taken to be 1.33 and 1.46, respectively, from the database (Malvern; Sample dispersion and refractive index guide, MAN0396 Issue 1.0 April 2007). In this DLS method, the shape of the silica particle is assumed to be spherical and the diameter of the particle is calculated from the observed data. Immediately thereafter, the brine was sampled with a 10 mL syringe and passed through a 0.2 μm membrane filter into a quartz cell, because the raw brine from a vapor-liquid separator sometimes contains fine particles of rock fragments. The particle diameter was measured by DLS.",silica,1.33,nan
10.1016/j.infrared.2015.12.015,"The obtained experimental results were compared with calculated optical spectra. Numerical calculations were performed using the CST Microwave studio 2015 software. The Frequency Domain Solver was used, and periodic boundary conditions were adopted. As a model object, a grating made of a material with a refractive index of 1.5 and having a rectangular profile with geometric parameters taken from AFM measurements was adopted. The geometric parameters of the grating were as follows: grating period – 190 nm, relief depth – 155 nm, groove width – 80 nm, gold metallization thickness – 50 nm. In the case of four-layer structures, the thickness of the SU-8 layer was assumed equal to 300 nm, and the refractive index, equal to 1.57. As the excitation source of electromagnetic waves, Floquet ports with 18 Floquet modes were used. The optical constants of gold included in the model were borrowed from . In the calculations, the polymer substrate was considered semi-infinite. For comparison with the experiment, it was necessary to take into account the Fresnel reflection at the polymer-air interface. To this end, the calculated transmission coefficient of the polarizers had to be multiplied by a factor T=4∗n1∗n2(n1+n2)2=0.96 for the two-layer polarizer and by a factor 0.962
= 0.9216 for the four-layer polarizer (see ",SU-8,1.57,nan
10.1016/j.pnucene.2014.08.005,"The measurement principle of an optical probe is on the basis of the refraction and reflection laws. Since the core refractive index of silica fiber is 1.46, the theoretical reflection coefficients calculated by Eq. for the water phase (the refractive index is 1.33) and air phase (the refractive index is 1.00) are 0.00217 and 0.0350, respectively.",silica,1.46,nan
10.1016/j.cemconres.2015.04.017,"The particle size distributions (PSD) were measured with a Malvern Mastersizer type S laser beam granulometer. The cement was dispersed in isopropanol, whereas the kaolinitic clays, the reference metakaolin, and the thermally and mechanochemically activated kaolinites were dispersed in a solution of water with 0.01% polyacrylic acid dispersing agent. 15 min ultrasonication was carried out on all suspensions before the PSD measurements. The real and imaginary refractive indices of cement were considered to be 1.7 and 0.1, respectively, while the refractive index of isopropanol was 1.39. In the case of the kaolins and the reference metakaolin, the real and imaginary refractive indices used were 1.529 and 0.01, dispersed in water with a real refractive index of 1.33.",isopropanol,1.39,nan
10.1016/j.saa.2010.04.040," for a given value of JO parameters and λ. It is interesting to note that going from a borate-silicate glass (with refractive index n
= 1.51) to tellurite glasses (with refractive index > 2.1) the transition probability increase by a factor more than 2 and hence the radiative lifetime will decrease by a factor more than 2 and the emission cross-section will increase by more than 50%.",tellurite,2.1,nan
10.1016/j.msec.2017.04.039,"For DLS measurement , the polyplex solution (10 μg of siRNA and the calculated amount of polymer at N/P 16 in a total volume of 50 μL of 20 mM HEPES pH 7.4 buffer) was diluted 1:20 with buffer and measured in a folded capillary cell (DTS1060) with laser light scattering using a Zetasizer Nano ZS with backscatter detection (Malvern Instruments, Worcestershire, UK). The size measurements was performed at 25 °C and using an automatic attenuator. The refractive index of the solvent was 1.330 and the viscosity was 0.8872. For polyplex analysis of the particles the refractive index of polystyrene latex (1.590) was used as the reference. Each sample was measured 3 times with 10 subruns. The zeta potential was calculated by the Smoluchowski equation. Therefore 10 up to 30 subruns of 10 s at 25 °C (n
= 3) were measured.",polystyrene,1.59,nan
10.1016/S0006-3495(99)77222-X,"Equation shows clearly that it is very important to accurately know the mean-square electric field amplitudes along the x, y, and z axis to perform orientation measurements by ATR spectroscopy. Since the mean-square electric field amplitudes depend on the film thickness as well as on the refractive indexes of the ATR crystal, film, and environment, it is important to use proper values for these parameters. The refractive index of germanium is equal to 4.0 and is fairly independent of the wavelength in the infrared region (). The complex refractive index of water in the infrared region has recently been accurately determined by . To our knowledge, the infrared dependence of the complex refractive indexes of phospholipid bilayers have not yet been published. We have thus determined these parameters for a DMPA bilayer, as described in the following section.",germanium,4,nan
10.1016/S0921-5107(00)00487-6,"Obviously, the energy of the ions plays an important role in the growth of carbon films using the ECR-MPCVD method. At lower rf biases (0 and 40 V), the films are transparent polymer-like carbon films with a lower refractive index (1.6), higher optical bandgap (2.0), and lower internal stress (1×108 Pa). This is attributed to the lower energy of ion bombardment on the growing films, which is similar to the polymer-like carbon films prepared by rf plasma deposition at |VB|<100 V [13]. At higher rf biases (80, 120 and 160 V), the films are semi-transparent DLC films with higher refractive indices (>1.8), lower optical bandgaps (<1.4 eV) and higher internal stresses (>5×108 Pa). This is due to the high-energy bombardment of ions on the growing films.",carbon,1.6,nan
10.1016/j.plefa.2007.05.001,"Epinephrine, isoprenaline, tetraethoxy propane and cholesterol were obtained from M/s. Sigma Chemical Company, St. Louis. MO, USA. Squalene (Specific gravity: 0.853; Refractive index: 1.493; Saponification value: 30; Iodine value: 344; Boiling point: 240–245 °C) was prepared from the shark liver oil of Centrophorus sp. caught in the Andaman waters . All the other chemicals used were of analytical grade.",Squalene,1.493,nan
10.1016/j.optlastec.2015.07.024,"The uniform subwavelength grating was fabricated on SOI. As a material used in waveguide devices, SOI displays superiority. It is a well-known platform for microelectronics and optoelectronics. Extremely small devices can be fabricated on SOI substrates because of the ultrahigh refractive index between Si and SiO2. All devices were fabricated on a 200 mm SOI wafer with a 220 nm-thick Si guiding layer on top of a 2 μm-buried SiO2 layer. The refractive indices of the silicon layer and the buried oxide layer were 3.46 and 1.45, respectively.",silicon,3.46,nan
10.1016/j.rser.2017.05.062,"Sergeant modelled a DMD multilayer stack in very interesting way using the standard transfer matrix method where MgF2 and TiO2 with refractive index 1.37 and 2.75 at 1 μm respectively, served the function of dielectrics in the same coating, while Mo and W was used as the metal substrate as well as metallic layer, sandwiched between dielectrics. The combination of MgF2 and TiO2 was preferred as dielectric due to contrast in their refractive index (Δn =1.38; λ=1 μm) and high thermal resistance. Two sets of four DMD coatings made of Mo, MgF2, TiO2 and W, MgF2, TiO2 with no of layers =5,7,9,11 have been optimized at 720 K. The coating structures are presented in ",TiO2,1.37,nan
10.1016/j.sse.2012.06.016,"Examining all switching cycles, κPF was found to be between 26 to 54, whereas κS was found to be between 4 and 7. κE was estimated to be 3.24 from the square of the refractive index of ZTO, nZTO (measured via ellipsometry to be 1.8). Whereas κE is comparable to κS, it is much smaller than κPF, suggesting that P–F emission can be eliminated from consideration as the conduction mechanism for the HRS at higher negative biases. Schottky conduction is consistent with our analysis and involves emission over a barrier, suggesting a role for an interfacial barrier in these devices, analogous with studies reporting the formation of an IL at the Al/metal oxide interface .",ZTO,1.8,nan
10.1016/j.mee.2004.12.078,"For the fabrication of dielectric chiral structures, nanoimprint was carried out at room temperature on flowable oxide, hydrogen silsequioxane (HSQ). HSQ after curing at temperature beyond its transition temperature (Tg), turns into silica with refractive index of 1.39. Replicating the chiral patterns on the HSQ layer by RTNIL naturally forms the dielectric chiral structures on silicon substrates.",silica,1.39,nan
10.1016/j.optmat.2018.04.015,"Bringing the UCNPs in direct contact to a noble metal, does not result in a significant enhancement as non-radiative transitions from UCNPs to the metal is expected. This can be suppressed by an additional dielectric layer between the metal and the particle as shown by Wang et al. []. They used Ta2O5 as spacer because of the high refractive index of 2.1 which closely matches the refractive index of NaYF4 of 1.95. An overall upconversion intensity of the Er3+ emission was 145-fold enhanced by excitation at 980 nm with a power density of 73 W cm−2. It is reported that this complex hybrid system can easily be assembled on flexible substrates by inkjet printing and therefore this method might become of importance for future bioanalytical applications. Hu et al. have developed a biochip-based application for bare eye detection of mRNA in patient samples for early diagnosis of cancer, presented in ",Ta2O5,2.1,nan
10.1016/j.optmat.2018.04.015,"Bringing the UCNPs in direct contact to a noble metal, does not result in a significant enhancement as non-radiative transitions from UCNPs to the metal is expected. This can be suppressed by an additional dielectric layer between the metal and the particle as shown by Wang et al. []. They used Ta2O5 as spacer because of the high refractive index of 2.1 which closely matches the refractive index of NaYF4 of 1.95. An overall upconversion intensity of the Er3+ emission was 145-fold enhanced by excitation at 980 nm with a power density of 73 W cm−2. It is reported that this complex hybrid system can easily be assembled on flexible substrates by inkjet printing and therefore this method might become of importance for future bioanalytical applications. Hu et al. have developed a biochip-based application for bare eye detection of mRNA in patient samples for early diagnosis of cancer, presented in ",NaYF4,1.95,nan
10.1016/S0141-3910(02)00338-5,"The equipment used was a FTIR-spectrometer from BOMEM (Quebec, Canada), model DA8. Spectra were recorded with a resolution of 2 cm−1 using Bartlet (triangular) apodization; 128 interferogram scans were averaged to give spectra from 400 to 5000 cm−1 when recorded in transmission and from 650 to 5000 cm−1 when using the ATR technique. For detection a thermal DTGS-detector (deuterated triglycine sulfate doped with alanine in CsI windows) was used. The ATR accessory was from Spectra-Tech (Shelton, CT, USA), model 300 allowing a variable angle of incidence for the reflection measurements between 30 and 60°; crystals of ZnSe (refractive index nZnSe=2.4 at 1000 cm−1, useful range 20,000–700 cm−1, mean refractive index 2.42) and of Germanium (refractive index nGe=4.0 at 1000 cm−1, useful range 5000–900 cm−1, mean refractive index 4.0).",Germanium,2.42,nan
10.1016/j.optmat.2018.01.029,"Sol-gel method is used to prepare silica sol: (I) preparation of silica sol under base-catalyzed hydrolysis, the SiO2 sol with the refractive index is 1.26 and 1.12 are prepared that the reactant are mixed in required amounts with a volume ratio of TEOS:EtOH:H2O: NH3·H2O to 4.7:43.3:2.7:1 and 3:30:2:1. And then, the solution is vigorously sired at 3 h and age at room temperature for 7 days; (II) preparation of silica sol under acid-catalyzed hydrolysis, firstly, measure out 2 mL HCl dilute 150 times with water and the volume ratio of TEOS:EtOH:H2O: HCl is 5:30:4:1 which is sired 2 h at room temperature. Secondly, putting PEG2000 into solution until it is completely dissolved that the mass ratio of TEOS: PEG2000 is 1:1 and then age at room temperature with 1day; (III) preparation of multi-antireflection thin film under dip-coatings technique: SiO2(H+)/SiO2(OH−)/SiO2(OH−) films are deposited on glass substrates with the withdrawal speed is 1000 μm/s, SiO2 (H+) layer is heated at a temperature of 150 °C for 5 min and SiO2(OH−) layers are dried at a temperature of 40 °C for 10 min; (IV) the surface optimization of BARCs is achieved by placing BARCs into trimethyl chlorosilane (TMCS) with 20 min and then clean up with acetone, ethanol and deionized water.",SiO2,1.26,nan
10.1016/j.optmat.2018.01.029,"For the design of broadband anti-reflection coatings (BARCs), the refractive index of prepared BARCs decreases along glass substrate to air that the reflection waves can occur offset interference []. However, the conventional SiO2 thin film has a refractive index of 1.46 which cannot achieve the change of the refractive index gradient, therefore, the nano-structure that is nano-particle [], oblique-angle [] and nanotip arrays [] of surface of SiO2 thin film is needed to increase its porosity to decrease refractive index. In this paper, nano-particle is selected to design BARCs as middle and surface layer with low refractive index. The structure of designed BARCs is presented in ",SiO2,1.46,nan
10.1016/j.mee.2004.12.075,"A 360-nm thick layer of Su8-2000 negative resist has been spin coated on the 6, 5 pairs DBR and then it has been lithographically patterned and cured in order to create a mold for the following imprint process. The pattern consisted of a 1D periodic sequence of 25 μm wide stripes, with a period of 250 μm. The mold became part of the final sandwiched structure, acting as a spacer between the two DBRs. Its depth was therefore responsible of the microcavity length LC. Rubrene has been dispersed in a PMMA-950K matrix (0.5 mg of rubrene in 1 ml of PMMA) and deposited by spin coating on the 5, 5 pairs DBR, obtaining a 330-nm thick layer. The refractive index of the blend was the same of PMMA (n
= 1.49).",PMMA,1.49,nan
10.1016/j.eurpolymj.2016.03.004,Conversion was measured by mass balance using GC on the collected resin and unreacted monomer using a Waters 2695 Separations Module equipped with a Waters 2487 Dual Absorbance Detector and Waters 2414 Refractive Index Detector. Molecular weight data were obtained by size exclusion chromatography (SEC) from a Waters 2695 instrument coupled with a Waters 2410 Refractive Index Detector with THF as eluent at 1.2 mL/min. A pair of Styragel® HT 6E columns with a guard column was used. Empower 3 software was used to determine the number-average (Mn) and weight-average (Mw) molar masses of the polymer obtained from the CSTR. Calibration was performed with polystyrene standards (Agilent EasiVial and EasiCal) with a low MW cutoff of 270 Da.,THF,1.2,nan
10.1016/j.optmat.2018.05.016,"(a). A hexagonal array of Au cylinders as resonators which are periodically arranged in both the x- and y-directions, and an Au film at the bottom, is deposited on the SiO2 substrate. A monolayer graphene is placed on top of the whole structure. (b) shows the side view of the proposed absorber. The radius and period of the microcylinders, and the height of the Au cylinder are denoted r, p, and h, respectively. The thickness of the bottom Au film (t) is fixed at 85 nm. It should be noted that t has no influence on the absorption properties, and the SiO2 substrate has no influence on the optical properties of the absorber. The optical properties of the presented structures is simulated with the FDTD method [,], perfectly matched layer boundary condition is used for the boundary in z-direction, while periodic boundary condition is used in x/y-direction. Plane wave as light source normally incidents to the arrays, except as otherwise noted, the electrical vector of plane wave is parallel to x-direction in simulation. The refractive index of SiO2 is taken to be 1.45, and the dielectric function of Au was given by the Drude model as ε(ω) = ε∞-ωp2/(ω2 + iγω) with ε∞ = 1.0, ωp = 1.37 × 1016 s−1 and γ = 8.17 × 1013 s−1 [].",SiO2,1.45,nan
10.1016/j.micromeso.2004.10.026,"Large-pore mesoporous silica thin films have been synthesized by using poly(alkylene oxide) triblock copolymers (Pluronic F127) with poly(propylene oxide) (PPO) as a swelling agent. Various synthesis parameters such as the addition of PPO, the condensation catalyst (NH3) and the aging time have been systematically investigated in order to explore their influence on the formation of mesostructure as well as thickness and refractive indices of the mesoporous thin films. Mesoporous silica thin films with a uniform pore size as well as a large diameter of 12.5 nm were obtained by optimization of these parameters, resulting in a pseudocubic phase with a cage-like pore structure. However, the broad distribution of pore entrance size with a large diameter is observed at high concentrations of PPO. Porosity (vol.%) values calculated by the refractive indices of mesoporous silica films were well correlated with their pore volumes obtained by the BET analysis. Reflectometry using UV–visible light has been newly applied to investigate the cumulative effect of synthesis parameters on the porosity, thickness and refractive index of the formed mesoporous film. It was confirmed by reflectometry measurement that the resulting pseudocubic mesoporous silica film with a thickness of 392 nm exhibits a refractive index of 1.21 and a total porosity of 49 vol.%.",silica,1.21,nan
10.1016/j.micromeso.2004.10.026,". UV reflectometry results indicate that the refractive index values of the obtained films varied from 1.435 to 1.210. NH3 treatment and the addition of a swelling agent decrease the refractive indices but increase the porosity of the mesoporous silica films. However, thermal treatment at 450 °C leads to only a slight decrease in the porosity of the film prepared using the swelling agent upon NH3 vapour treatment. The NH3-treated and calcined sample (A8/R0.5/N/C) containing the swelling agent has the lowest refractive index (1.210) and the highest porosity (49 vol.%) among the samples, whereas the uncalcined sample without NH3 treatment (A8/R0.5/WN) has a much higher refractive index (1.435) and lower porosity (4 vol.%). The sample (A8/R0.5/N/WC) has an unusually high porosity (42 vol.%) and low refractive index (1.240), assuming that it may be due to the as-synthesized film cracks by the rapid condensation of the inorganic silica skeleton with NH3 treatment and the weak template-silica interaction. The porosity data of the mesoporous silica films obtained by reflectometry are close to their pore volumes measured by N2 adsorption isotherms. ",NH3,1.435,nan
10.1016/S0927-7765(98)00039-3,"Planar waveguide chips (8×12 mm2) were purchased from Balzers, Liechtenstein, and consisted of a waveguiding layer of Si(Ti)O2 of thickness dF=150 nm with a refractive index nF=1.8. The waveguiding layer was deposited onto a supporting glass substrate (nS=1.52578) and a grating embossed in the surface layer (grating constant L=833 nm) to enable light to be coupled into the waveguiding layer. The surfaces were subsequently sputter coated with an additional 10 nm thick layer of pure TiO2. Prior to depositing the coating, the surfaces were cleaned using Balzers substrate cleaner solution (Balzers, Liechtenstein) and exposed to an Ar plasma for 5 min in the sputter chamber. The TiO2 coatings were produced in a Leybold d.c. magnetron Z600 sputtering chamber. The d.c. power supply was pulsed (the frequency was 20 kHz, i.e. a negative voltage was applied to the cathode for 37.5 μs followed by a positive voltage for 12.5 μs) in order to reduce poisoning of the Ti targets by O2. Moreover, arcs were suppressed. The magnetrons (area 488 mm×87.5 mm) were operated at a power of 2 kW. The gas flows were 12 sccm for Ar and 17 sccm for O2, resulting in partial pressures PAr=7.7×10−4
mbar and pO2=3.4×10−4
mbar. By means of a Tencor P2 long scan profiler, the thickness d of a test coating was determined to be 7.3 nm for a sample that passed the sputter target n=5 times with a drive speed v=0.75 m min−1. Based on this calibration, the waveguides were coated with nominal thicknesses of 2.0, 4.0, and 10.0 nm TiO2 by varying n and v appropriately. Further instrumental details are given in Ref. .",Si(Ti)O2,1.8,nan
10.1016/S0927-7765(98)00056-3,"Perfluorohexyl iodide (PFHI, density=1875 kg m−3, refractive index=1.3275) was supplied by Aldrich. Highly purified soybean phospholipids (Epikuron-200) were purchased from Lucas Meyer and stored at 4°C; according to the manufacturer this product contains more than 95% of phosphatidyl choline (PC). Chapman calculated that the average molecular mass of soybean phosphatidyl choline is ∼772 g mol−1. The same batch of phospholipids was used throughout the study.",PFHI,1.3275,nan
10.1016/j.pmatsci.2016.02.001,"In 2011 Ohsawa et al. reported the synthesis of a Nb12O29 thin films (with a thickness of 120 nm) which have shown a high transmittance in the visible range (∼50% in the red and ∼70% in the blue regions), with a refractive index n
= 2.2 at 400 nm. The films were deposited on a glass substrate with a transmittance between 90% and 95%. The high transparency, allied to the high electrical conductivity of about 300 S/cm (even after annealing at 1000 °C in vacuum) without the need of doping, makes Nb12O29 a new class of transparent conductive oxides (TCO). Classified by the authors as an “intrinsically doped d-electron-based TCO” , and though there is no evidence if it has a direct or indirect band gap, the Nb12O29 may be a promising material for use in high-performance and low-cost optoelectronic devices.",Nb12O29,2.2,nan
10.1016/S0254-0584(02)00542-4,"where T is the absolute temperature and CTMS the concentration of TMS (in ml per 100 g of water). A partial molar volume of the solute of Vm=1.53 m3
mol−1 and a solute concentration in the crystal of Cs=1.718×104
mol m−3 were used in the simulation. The dependence of the refractive index on KDP concentration was dn/dC=1.4×10−5
m3
mol−1. According to a previous work , the diffusion coefficient D of KDP in TMS gel was almost the same like in the solution, i.e. D=(5±1)×10−10
m2
s−1. The kinetics coefficient B of KDP growing in a gel-free solution for the (1 0 0) surface was from 0.06×10−8 to 0.1×10−8
m4
mol−1
s−1. Our calculations were performed for B values from 0.001×10−8 to 1×10−8
m4
mol−1
s−1.",KDP,1.4,nan
10.1016/S0927-0248(02)00473-7,"The wide range of refractive indices achievable for TiO2 films lead to the concept of creating a DLAR coating from a single material by simply varying the deposition and sintering conditions . TiO2 DLAR coatings were fabricated by initially depositing the bottom TiO2 layer by pyrolysis at 450°C onto a polished silicon wafer. The as-deposited, bottom TiO2 film exhibits a refractive index of about 2.1 (at ",TiO2,2.1,nan
10.1016/j.optlaseng.2015.12.012,"To further verify the quantitativeness of the phase reconstruction, we measured a well-characterized plano-convex microlens array (SUSS, pitch 250μm, fused silica, refractive index 1.46 at 550 nm). To assess the accuracy of the phase measurement, the same specimen was measured using a white-light interferometer (WLI, Veeco NT9000), as shown in (e). Note the WLI can only provide an incomplete lens profile with the phase information unrecoverable at the larger phase gradient area due to the very high fringe density. Thickness profiles for a single lens from the array taken along the red-dashed line in (d) and the blue solid line in (e) are compared quantitatively in (f). The height of the microlens was measured to be 25.76μm with the PAM, which is in reasonable agreement with the WLI result of 26.22μm, demonstrating its quantitative phase retrieval capability. The fitted radius of curvature (ROC) of our line profile is 286.6μm, which slightly underestimated the ROC value compared with the manufacturer specifications (297μm±5%). This small discrepancy can be attributed to the inaccurate determination of the NAill or the optical imperfection present in the 4f imaging system.",silica,1.46,nan
10.1016/S0927-0248(02)00375-6,"The ratio of to shows the transmittance of light through the sphere is 1.55 times larger than that through the flat plate. For the refractive index of 2.0 (it corresponds to the case that the cell is covered with anti-reflection coating Si3N4), the ratio is 1.523.",Si3N4,2,nan
10.1016/j.physe.2016.01.001,The proposed structure consists of 2D photonic crystal with square lattice which consists of silicon dielectric rods with refractive index of 3.46 and radius of 0.2a (110 nm) that are embedded in the air background with refractive index of 1. ,silicon,3.46,nan
10.1016/j.rinp.2018.11.043,"We propose a passive photonic design for an optically pumped laser system and tunable dual-wavelength generation application by employing optical nonlinear mode coupling of two coupled III–V semiconductor microring resonators, which is connected to a pump and drop waveguide buses. One of the two rings contains a grating, whereas the other has a planar surface. The mechanism underlying the dual-wavelength generation can be explained via the resonance detuning of the spectra that results in nonlinear mode mixing. The tunability of the wavelengths can be achieved by altering the grating depth of the microring resonator and the power coupling coefficients. In the grating design of the microring resonators, we have selected a trapezoidal-profiled apodized grating to obtain low reflectivity at the sidelobes. A time-domain traveling wave (TDTW) analysis yields an InGaAsP core refractive index of 3.3. This core is surrounded by a grating InP cladding with a refractive index of 3.2. We further confirm that the propagation of a Gaussian pulse input with a power of 10 mW and a bandwidth of 0.76 ps is well confined within the system mode propagation. The results show a 2:1 fan-out of two spectrally separate signals, which can be employed for compact and high functional sources on chips.",InP,3.2,nan
10.1016/S0022-4073(02)00313-8,"Fractal BCCA aggregates modeled by Haudebourg et al. have 512 grains (size range: some tens nanometers), the aggregates are micron sized. With a refractive index of 1.5, the aggregates characteristics are close to our silica samples (n=1.45, grains size 12 and ",silica,1.5,nan
10.1016/j.clay.2013.06.004,"There were many research works focused on the preparation of UV-shielding materials such as TiO2, ZnO and CeO2, as they have good UV protection ability (). The high photocatalytic activity of TiO2 and ZnO facilitated the generation of reactive oxygen species, which raised safety concerns (). Furthermore, the high refractive index of TiO2 (anatase n
= 2.5 and rutile n
= 2.72) and ZnO (n
= 2.2) compared to CeO2 caused an unnatural look to the skin when these materials were used in cosmetic products (). CeO2 had better properties since it appeared naturally on the skin, without imparting an excessively pale white look, and had excellent ultraviolet absorption compared to those of TiO2 and ZnO. However, because of its high catalytic activity on the oxidation of organic materials, CeO2 had seldom been used as a sunscreen material (). In order to overcome this problem, CeO2 was doped with metal ions having larger ionic size and/or lower valency, such as Ca2 +, Zn2 +, Ba2 +, Sr2 + and Mg2 +, to reduce the oxidation catalytic activity and to increase its UV-shielding effect compared to pure CeO2 (). As doping CeO2 with such metal ions improved the UV-shielding effect, further developed new materials, which also had excellent UV-shielding effect, by using ceria as a dopant to zirconia. A citric acid complexion route was used to synthesize Zr1 −
xCexO2, with x
= 0.1, 0.2 and 0.3. The UV absorbance property of Zr1 −
xCexO2 was compared to pure ceria and zirconia, also prepared in the same manner, and it was found that Zr0.7Ce0.3O2 showed the best UV absorbance property.",TiO2,2.5,nan
10.1016/j.saa.2011.06.055,"The thin-layer system consists further of two infrared radiation transparent ZnSe windows having a refractive index n
= 2.4 and a diameter of 32 mm (Pike Technologies). A Teflon ring has been used as a spacer to provide 15 μm optical pathlength. The liquid cell was mounted in the sample holder in front of a curved mirror, which collimates the infrared radiation onto a deuterated ",ZnSe,2.4,nan
10.1016/j.optlastec.2015.11.016,". According to our atomic force microscope (AFM) measurement results of the mold for the PDMS photomask, the inclination angles of the cone shape are on the order of 50°, which should guarantee the condition of TIR. We tried to simulate the cross-sectional geometry of the PDMS photomask as shown in (a). The refractive index of the PDMS and PR are 1.4 in the simulation. (b) and (c) show the ray-tracing results. Note that the color indicates the traveling time of the rays and absorption effects were not considered in the PR and the complete results of (c) may be messy to the eyes. Therefore, we intentionally stopped them at 17 fs to highlight the neck effects in (b). As we predicted in (b) of , the PR in contact with the PDMS is exposed by the normally incident rays. Some other light rays, hitting the proximity of the flat region of photomask, transmit into the PR and lead to “neck effect”. They do not directly expose the PR right below the air cone of the photomask. Some other fewer light rays leak into the “blocking region” beneath the air cone, and decrease the contrast between the exposing and blocking region.",PDMS,1.4,nan
10.1016/j.optlastec.2015.11.021,". It consists of a double-groove grating anti-reflective layer, a double-groove grating and a planar waveguide layer with the materials of a-Si backed with a silica substrate. The refractive indexes of a-Si are taken from Ref. . The material of anti-reflective structure is indium tin oxide (ITO) with a refractive index of 2. The refractive index of SiO2 is 1.46. Generally speaking, in practical application, the refractive indexes of these materials are usually frequency dependent. However, the conclusions obtained by the simplified model remain unchanged for real application though with a small change in absorption spectrum. The grating period is d; h1 is the thickness of anti-reflective layer; h3 is the thickness of grating layer; h2=h3−h1; h4 is the thickness of waveguide layer; f1 and f2 are duty cycles of the two ridges, d1 is the separation of the two ridges.",SiO2,1.46,nan
10.1016/S0022-2313(98)00146-X,"Amorphous hydrogenated silicon oxide (a-SiOx
: H) thin films deposited on single crystalline silicon substrates were prepared by dual-plasma CVD. The details of deposition conditions and the general properties of the films are described elsewhere . Sample 81 with a refractive index of about 1.46 as determined by ellipsometry is a nearly stoichiometric silica film (O/Si≈2), as confirmed by XPS and FTIR . Samples S181 (n=1.98) and S162 (n=2.2) are Si-rich SiOx thin films. The experimental setups are described elsewhere . Follow Pai's method for IR analysis, the oxygen content x for samples S81, S181 and S162 has been estimated to be 2, 1.65 and 1.35, respectively. Auger emission spectroscopy data confirm that sample S81 is stoichiometric, but indicates a lower oxygen content for samples S181 (53%) and S162 (31%) presumably due to a clustering of the silicon atoms. In ",silica,1.46,nan
10.1016/S0016-2361(99)00183-0,"In our case, the ATR objectives for the i.r. microscope were manufactured with an angle of reflection 45°. The refractive index of silicon is 3.42. Van Krevelen gives data indicating that the refractive index of coal vitrinite varies from 1.75 when the carbon content is 75% (d.a.f.) to 1.79 when the carbon content is 83% (d.a.f.). Hence, it would seem reasonable to take an average refractive index for the coals under study to be approximately 1.77. Using this value the penetration depth for the silicon IRE can be calculated to be about λ/10, i.e. in the range 0.25–1.33 μm for the whole i.r. spectrum. The radiation therefore probes only the near surface layer of the sample. While this appears to be a small penetration depth, it is important to realise that it is considerably more than the penetration depth of a specular reflectance measurement which is the standard technique for i.r. microspectroscopy of coal.",silicon,3.42,nan
10.1016/S0016-2361(99)00183-0,"Using the Harrick equation, it can be calculated that the penetration depth for the germanium internal reflection element (refractive index 4.01) will be 0.73 of that of the silicon internal reflection element shows ATR spectra of Samples 3 and 7 taken with a germanium internal reflection element. The spectra are less intense than those shown in for the silicon internal reflection element, as would be expected from the difference in penetration depths. Hence better quality spectra of higher intensity are obtained with the silicon IRE which therefore makes a better general purpose choice for coal. However, if both silicon and germanium elements are available, comparison of the spectra may allow depth profiling and characterisation of surface features such as, for example, those due to oxidation.",germanium,4.01,nan
10.1016/j.atmosenv.2013.05.057,", we consider a PhC structure with three regular grating segments assigned by N, L and M-segment with number of cells in each of them is 4, 6 and 2, respectively. We inserted the two defect cells between N-L and L-M segments, such that there are 28 stacked layers in this configuration including the defects. The regular unit cell in each segments consist of two dielectric materials namely OS-5 (alloy of ZrO2 and TiO2) and MgF2 with refractive indices of 2.1 and 1.38 and layer thickness of 66 nm and 100 nm, respectively. The OS-5 layer in the first defect cell is set to different thickness namely 132 nm, while a layer in the second defect cell is set as a receptor to be filled by an analyte. In both defects the thickness of MgF2 layer is similar to regular cell. Here, we used the variation of PPB peak with respect to the change of analyte as a sensing signature, where its fixed position allows us to use a low cost photo detector. This is in contrast with previous sensing mechanism that use the shifting of PPB peak as its signature (). The transfer matrix method based simulation () of PPB variation with respect to the change of analyte along with its Q-factor (λpeak/ΔλFWHM) is given in ",MgF2,2.1,nan
10.1016/S0925-4005(01)00960-1,"To fabricate channel-planar COWGs, single-mode straight channel waveguides were prepared on a soda-lime glass substrate by the potassium ion exchange method; RF sputtering technique was then used to deposit the thin film of TiO2 onto the glass substrate containing the straight channel waveguides. To taper the TiO2 film during sputtering, a mask made of a 0.75 mm thick Al2O3 ceramic plate with a 5 mm wide window was fixed at a 2 mm distance below the substrate. The resulted film of TiO2 has two 1 mm long tapered ends perpendicular to the straight channel waveguides. The mask also offers a good area-selective deposition with an accuracy of 1 mm. Using ellipsometry the tapered TiO2 film were measured to have a maximum thickness of 27 nm and a refractive index of 2.33. Using , the smallest thickness of the TiO2 film on a glass substrate (ns=1.515) for guiding the TE0 mode was calculated to be 32.5 nm for air cladding (nC=1), and 21.9 nm for water cladding (nC=1.333) in case of λ=0.633 μm.",TiO2,2.33,nan
10.1016/j.rinp.2018.12.084,"The morphology and chemical composition of the substrates were studied using scanning electron microscopy (SEM, Zeiss EVO LS10) at 25 keV and energy dispersive X-ray spectroscopy (EDX, Bruker). The X-ray thin film diffraction pattern was recorded with a Rigaku SmartLab diffractometer operating at 40 kV and 30 mA by using Cu Kα radiation source and a scanning rate of 5°/min in the range of 35–70°. UV–visible spectroscopy (Perkin Elmer Lambda 25) was recorded in the wavelength range of 355–575 nm to monitor the catalytic degradation of MO. The thickness of the grafted P2VP layer was measured via an ellipsometer (Gaertner LSE Stokes). The refractive index of P2VP was assumed as 1.595. The compositions of Pt seeds and Ag nanostructures were examined with X-ray photoelectron spectroscopy (XPS, Specs-Flex) using XRm50 M (UXC1000) source exciting radiation (1486.71 eV). All binding energies were referenced with respect to the C 1s peak at 284.8 eV.",P2VP,1.595,nan
10.1016/S0254-0584(02)00492-3,"Clearly, there is a great deal of novel work that can be performed in the area of self-assembled 3D photonic crystals simply by choosing different material systems. Van Blaaderen et al. have produced a number of interesting emissive materials as monodisperse colloidal spheres including Er3+-doped SiO2, dye-doped PMMA , and SiO2/ZnS core/shell structures . ZnO is another promising candidate for optically-active self-assembled photonic crystals because of its interesting optical properties. First, ZnO has a higher refractive index (2.1–2.2 in the visible regime) than other materials (1.4–1.5 for SiO2 and most polymers). In addition, ZnO has been found to be an efficient emitter, exhibiting lasing behavior in the near UV (λ∼385 nm) .",ZnO,2.1,nan
10.1016/S0254-0584(02)00492-3,". shows a plot of gap position (d/λ) in the (1 1 1) direction and 6(b) a plot of the gap width (%) normalized by the center frequency, each as a function of refractive index and r/d. For a refractive index of 2.1 (approximate bulk value for ZnO) the results indicate that d/λ can be approximated as 0.35, while in our case the ratio was close to 0.45. This discrepancy implies that the effective refractive index of the photonic crystal structure differs significantly from the bulk value. Packing density was estimated from SEM images to yield r/d in the 0.45–0.50 range. Restricting the packing parameter to this interval, and keeping d/λ=0.45 (bold segment on , gives us an effective index in the 1.5–1.7 range. This value is further supported by the calculations of relative gap width. As can be found in , the width is predicted to lie between 5.5 and 7.8%. The value observed in our single-domain reflection measurements, approximately 4%, is smaller than the above prediction. This reflects the presence of the residual disorder, inevitable in the experimental photonic crystal structures studied here.",ZnO,2.1,nan
10.1016/j.colsurfb.2010.07.030,"The thicknesses of the BrC10TCS and grafted polymer layers present on the silicon wafers were determined under dry conditions using a spectroscopic ellipsometer (GES5E, SOPRA, Courbevoie, France). The bare silicon wafer, BrC10TCS-immobilized substrate, and each polymer-grafted substrate were measured at an incident angle of 70° in the visible region. The thickness of BrC10TCS and the grafted polymer layers was determined using the Cauchy layer model with an assumed refractive index of 1.45 and 1.49, respectively. The graft density (σ (chains/nm2)) was calculated from the ellipsometric thickness determined for each grafted polymer layer using the equation",BrC10TCS,1.45,nan
10.1016/j.optlastec.2016.01.036," shows the air-hole distribution of the PCF where three missing air holes in the 1st ring make the triangular core. d0 represents the diameter of the 1st ring, whereas d denotes the air-hole diameter of 2nd, 3rd and 4th rings. The material of the cladding is silica with a refractive index of 1.45. The air-holes are arranged in hexagonal rotation withun-symmetry in the fiber cladding and a common pitch Λ.",silica,1.45,nan
10.1016/j.wasman.2018.10.016,"The size of the micelles was determined by measuring the hydrodynamic diameter by dynamic light scattering (DLS) (Malvern Zetasizer NANO ZS, Malvern Instruments Limited, UK). The machine had a 4 mW He-Ne red laser at 633 nm and an avalanche photodiode (APD) detector. Samples were prepared 24 h before analysis for settlement of the particles in the solution (). The surfactant concentrations used were higher than the CMC to ensure monodispersity of the sample (i.e. homogeneous presence of micelles after CMC). Samples were filtered through a Minisart 0.25-μm syringe filter (Sartorius), and transferred to polystyrene latex disposable cuvettes (refractive index = 1.590; absorption = 0.010) using a 3-ml sterile syringe connected to the filter. The Stokes-Einstein equation (Eq. ) was used for calculating the hydrodynamic diameter of the micelles ().",polystyrene,1.59,nan
10.1016/S0006-3495(02)75493-3," shows the escaping force as a function of laser power for a 4.5-μm polystyrene bead with a refractive index of 1.6 placed at a height of 5
μm from the coverslip. There was a linear relationship between the escaping force and laser power and the trapping stiffness (i.e., the slope of Fes versus P) was ∼1.3 pN/mW.",polystyrene,1.6,nan
10.1016/j.vacuum.2007.04.028," shows a typical YSZ-film BLS spectrum and the evolution of the obtained elastic constant C11 with the yttria content in the ZrYO-films series. As has been described above, from the position of the BLS peaks it is straightforward to determine the sound propagation velocity in the film . The relationship between sound velocity and elastic constants is density mediated: C11=ρVS2. Obviously, it is necessary to have information about the density of the studied material in order to assess the evolution of the elastic constant. In isotropic media there exists a well-established relationship between density and refractive index known as Lorentz-Lorentz relation . In the case of the ZrYO-films, the density was calculated by interpolation between the pure ZrO2 and Y2O3 corresponding values . The BLS refractive index for pure Y2O3 film is in agreement with that reported in the literature (n=1.79) while the value obtained for pure ZrO2 film is extremely low (1.73) when compared with its usual value of 2.2 . This fact indicates that also the density of the ZrO2 film has to be lower than the expected one. Using the Lorentz-Lorentz relation, it is possible to estimate the film density to be 4.337 g/cm3. This is the value used for the calculation of the corresponding elastic constant. The BLS-obtained elastic constant values show the same behaviour as the nanoindentation Young's modulus; furthermore, the absolute values are clearly lower than the single-crystal corresponding ones . The BLS results confirm the considerations made by taking into account the nanoindentation technique.",Y2O3,1.79,nan
10.1016/j.rinp.2018.11.091,". Two ideal electric boundaries are used in normal to x-axis, and two ideal magnetic boundaries are applied in normal to y-axis . The refractive index of CaCO3 particles is set by 1.49. VO2 particles are described through the Bruggeman–Drude model :",CaCO3,1.49,nan
10.1016/j.apmt.2018.06.009,"which has a pole at the TO phonon frequency ωTO and a zero-point crossing at ωLO. c shows the refractive index (the absorption is given in the inset) of SiC for ε∞
= 6.56, ωLO
= 969.9 cm−1, ωTO
= 797 cm−1 and γ
= 4.76 cm−1.",SiC,6.56,nan
10.1016/j.solmat.2003.06.004,"The materials most widely used as AR coatings are dielectric materials: silica, titania and alumina with refractive indices of 1.45, 2.3 and 1.65, respectively, although silica is the most ideal material due to its low refractive index, good durability and environmental resistance. However, silica AR properties could be improved by modifying the porosity or using a refractive index-graded material.",alumina,1.45,nan
10.1016/j.vacuum.2006.09.007,"Test patterns were fabricated on SiON wafers. Using a PECVD system, SiON films were deposited of about 4.09μm thickness at 150 W rf power, 135 sccm N2O flow rate, and 45 sccm SiH4 flow rate, 350 °C substrate temperature, and 0.2 Torr pressure. The refractive index of the deposited SiON films was about 1.46. To fabricate a Ni mask layer, photoresist patterns were first formed. A magnetron sputtering method was used to subsequently deposit Ni film of about 0.3μm thickness on the patterned photoresist. The sputtering continued for 1 h at 8 mTorr pressure, 100 W rf power, and 6 sccm Ar flow rate. By removing the photoresist with acetone, a Ni mask layer was formed. The SiON films were etched in a C2F6 ICP. In all experiments, the etching time was set at 10 min. The surface roughness was measured by using the AFM. Both etch rate and profile for the same etching were investigated experimentally and by constructing a predictive computer model .",SiON,1.46,nan
10.1016/S0006-3495(02)75612-9,"in which A was the integrated area of the amide I band (1600–1700 cm−1), N was the number of internal reflections, Cb was the bulk protein concentration, and ∈ was the molar absorptivity determined from the transmittance spectrum. The penetration depth (dp) and the effective thickness (de) were calculated from the equations given by . The thickness of the OTS monolayer was determined by ellipsometry and did not exceed 3 nm. Using a dp value of ∼500 nm at 1650 cm−1, the effect of the coated OTS on the attenuation of the evanescent wave at the buffer/silicon interface, with a refractive index of 1.3 (buffer) and 3.4 (silicon), was neglected. We assumed that the buffer refractive index was not significantly changed by the dilute concentrations of proteins used, so that the protein surface density (Γ) could be determined on line during adsorption. The amide I′ band was used to determine Γ, as the amide II region varies over time because of the slow NH/N2H exchange.",silicon,1.3,nan
10.1016/j.mssp.2018.04.037,"In this paper, we present the elastic, optoelectronic, and transport properties of Sr3SnO under pressure by using the first-principles method within density functional theory (DFT) . We have found that SSO becomes metallic above 12 GPa pressure (at low temperature, below 50 K) and n-type material. Above this pressure, the Seebeck coefficient (S) still remains high although metallic conductivity observed at low temperature. Since thermoelectric generator requires both p-type and n-type materials , therefore, SSO is a promising material for thermoelectric generator applications. The refractive index of SSO has been found to be 3.14 which is smaller than that the value (5.974) for Ge but close to the value for GaAs (3.29–3.857) at 632 nm wavelength and 0 GPa pressure.",SSO,3.14,nan
10.1016/j.mssp.2018.04.037,". The maximum peak of absorption is obtained at 11 eV photon energy and 16 GPa. We see that the absorption increases with pressure for certain energy range and also decreases for other energy. This is true for other optical parameters of SSO. We see that the optical conductivity of SSO is high and the maximum value is 4465.5 S/cm at 6.13 eV and 16 GPa. The reflectivity of SSO is small comparatively to other typical semiconductors, Si, Ge, and GaAs . The refractive index of SSO at different pressure is illustrated in (d). We see that the refractive index of SSO is smaller (3.139) than that of Ge (5.974) but very close the value of GaAs (3.29–3.857) (at 632 nm wavelength and 0 GPa). The joint density of states (JDOS) is defined as ",SSO,3.139,nan
10.1016/j.talanta.2009.07.026,"The refractive index of glass is 1.5 and ZnO is ∼2.0, therefore, the net refractive index or composite refractive index nnet of sensing element (U-shaped nano-crystalline ZnO film) is increased. It further decreases after adsorption of H2O molecules with refractive index 1.33. In any medium, when water vapor content increases, the amount of oxygen and nitrogen decreases per unit volume and the density will decrease because the mass decreases as dry air is denser than the humid. It is also a common fact that in all transparent medium the optical density is in direct proportion to its mechanical density and also the RI of the medium. Since the optical density of the humid medium is inversely proportional to magnitude of its humidity. In other words, as the humidity of the medium increases, its rarity increases. This in turn causes nnet change as result of which NA will decrease (cf. Eq. ). Thus, on the other side of the optical fiber, less light will be able to pass through.",H2O,1.33,nan
10.1016/S0254-0584(02)00552-7,"ZnO waveguiding layers deposited onto soda lime glass were produced from the thermal oxidation of ZnS thin films elaborated by a carefully conducted chemical bath deposition (CBD) method. X-ray diffraction indicated that ZnO films possessing a polycrystalline hexagonal structure were obtained. M-line spectroscopy was used to determine the refractive index and the thickness of ZnO films which were 1.90 at wavelength λ=632.8 and 130 nm, respectively. These analyses were also conducted on the ZnS elaborated films before annealing treatment. The ZnO films presented waveguiding properties and optical losses of 3.0±0.5 dB cm−1 at λ=632.8 nm were measured. The waveguide Raman spectrum of the ZnO films mainly exhibited a broad band at 558 cm−1 which corresponds to longitudinal optical phonon and a large band which is assigned to amorphous ZnO material.",ZnO,1.9,nan
10.1016/S0254-0584(02)00552-7,"Using the above model and assuming a homogeneous layer with stepwise refractive index and constant thickness, refractive index of the ZnS films averages 1.96 while the corresponding thickness is around 190 nm. The ZnO films provide an average refractive index of 1.90 with a corresponding thickness around 130 nm. Typical graphical resolutions are shown in . Refractive indices in the range 1.95–2.09 have been reported in literature for ZnS films grown on glass and a value in the range 1.84–1.92 for ZnO thin films grown on the same substrate . We also observe a decrease in the thickness of the films in transforming from ZnS to ZnO, probably due to the densification of the layers during heat treatment.",ZnS,1.96,nan
10.1016/j.carbpol.2010.02.015,"From the ellipsometric angles, Δ and Ψ, and a multilayer model composed of silicon, silicon dioxide, polysaccharide layer, and air, it is possible to determine only the thickness of the polysaccharide layer, dpoly. The thickness of the silicon dioxide layers was determined in air, assuming a refractive index of 3.88–0.018i and infinite thickness for silicon (). The refractive index for the surrounding medium (air) was taken as 1.00. Because the native silicon dioxide layer is very thin, its refractive index was taken as 1.462 () and only the thickness was calculated. The mean thickness of the native silicon dioxide layer was 2.0 ± 0.2 nm. After determining the thickness of the silicon dioxide layer, the mean thickness of adsorbed SSP layers was determined in air by means of ellipsometry, considering the refractive index of 1.50. The mean thickness of adsorbed LYS onto SSP films was determined, considering the refractive index of 1.52 (.",LYS,1.52,nan
10.1016/j.rinp.2019.01.027,". We observe clear peaks which are originated from the excitonic transitions at the E0 edges. As one proceeds from x = 0 (ZnSe) to x = 1 (BeSe), these peaks shift towards lower or higher energies. The shift depends strongly on the alloys content x. The most important peak in the refractive index spectra is essentially related to the 2 D exciton. transition (E1). Its position depends also strongly on the alloy concentration x. It has been reported in the literature that the excitonic effects have tendency to increase the oscillator strength at the critical points M0 and M1. This gain must be compensated by losses elsewhere. For ZnSe (x = 0), the static refractive index is found to be about 2.57, whereas for BeSe (x = 1), its value has been determined to be around 2.9. Our obtained static refractive index for ZnSe agrees well with that of 2.51 calculated by Hannachi and Bouarissa using the empirical pseudopotential method and that of 2.5 quoted in Ref. . As far as our static refractive index for BeSe is concerned, our result is only for reference.",ZnSe,2.57,nan
10.1016/j.rinp.2019.01.027,". We observe clear peaks which are originated from the excitonic transitions at the E0 edges. As one proceeds from x = 0 (ZnSe) to x = 1 (BeSe), these peaks shift towards lower or higher energies. The shift depends strongly on the alloys content x. The most important peak in the refractive index spectra is essentially related to the 2 D exciton. transition (E1). Its position depends also strongly on the alloy concentration x. It has been reported in the literature that the excitonic effects have tendency to increase the oscillator strength at the critical points M0 and M1. This gain must be compensated by losses elsewhere. For ZnSe (x = 0), the static refractive index is found to be about 2.57, whereas for BeSe (x = 1), its value has been determined to be around 2.9. Our obtained static refractive index for ZnSe agrees well with that of 2.51 calculated by Hannachi and Bouarissa using the empirical pseudopotential method and that of 2.5 quoted in Ref. . As far as our static refractive index for BeSe is concerned, our result is only for reference.",ZnSe,2.51,nan
10.1016/j.optmat.2018.05.039,"where Iarea is the area under the corresponding peak in the PL spectrum, whose vertical axis is proportional to the photon flux. By using Eq. –(3), not only the Judd-Ofelt intensity parameters, Ω2 and Ω4, but also the spontaneous emission rates, AR (7FJ) (J = 1, 2, 4), were calculated. The Judd-Ofelt parameter Ω6 is usually calculated for the 4f-4f transitions of lanthanides except for trivalent europium. The 5D0→7F6 emission transition of Eu3+ is too weak to be detected and the |⟨S',L'J'‖U6‖S,LJ⟩|2 REM is much smaller than other RMEs, |〈(S',L')J'‖Ut‖(S,L)J〉|2 (t = 2, 4) [,,]. This is why Ω6 and AR (7F6) were not calculated, and the total spontaneous emission rate AR (= ARED + ARMD) did not contain the contribution of the 5D0→7F6 transition. For these calculations, the following values of refractive index were used: n (YSiO2N) = 1.94 [], n (Y2Si2O7) = 1.76 [], and n (CaSiO3) = 1.62 []. Although they were obtained by the first-principle calculation, these values are reasonable enough, considering the refractive index of SiO2 (n = 1.46) [] and Si3N4 (n = 2.05) []. Furthermore, the radiative lifetime, τR, was estimated from Eq. :",SiO2,1.46,nan
10.1016/j.jasrep.2016.07.006,"For grain-size determinations, samples were taken at 5 cm intervals. Many displayed fine particles, with general size below 200 μm. Organic matter was removed for laser-diffraction particle size study. The grain-size distribution was measured using a Beckman Coulter LS 13 320 laser granulometer with a range of 0.04 to 2000 μm, in 132 fractions. The calculation model (software version 5.01) uses Fraunhöfer and Mie theory. For the calculation model, we used water as the medium (RI = 1.33 at 20 °C), a refractive index in the range of that of kaolinite for the solid phase (RI = 1.56), and absorption coefficients of 0.15 for the 780-nm laser wavelength and 0.2 for the polarized wavelengths (). Samples containing fine particles were diluted, measuring between 8 and 12% of obscuration and between 45 and 70% PIDS (Polarization Intensity Differential Scattering) obscuration.",kaolinite,1.56,nan
10.1016/j.rinp.2019.01.068,". The gold microring is wrapped by the pulley-type curved silicon waveguide. The background is water. The refractive index of silicon, water and gold is 3.48, 1.318 and 0.583 + 9.864i, respectively. The light at the wavelength of 1550 nm is launched into the dielectric waveguide. The electric field of the light is in the plane of the propagation. The width of the dielectric waveguide is varied to have the single mode operation in the curved region as the radius of the curvature is 6 μm. We obtain the width of the dielectric waveguide to be 200 nm. The corresponding incident angle of the propagating light to the side wall of the waveguide, θ as illustrated in is calculated by the conformal transformation and the Helmholtz equation . The result is shown in ",silicon,3.48,nan
10.1016/j.optmat.2018.06.013,"The simulation was done in three steps. First, we build the layout and define the parameters of object such as refractive index, thickness, width and size of the sample. In this study, we use ITO as a transparent conductive substrate with refractive index of 1.92 and acts as an optimized anti-reflection coating. The active region (350 × 350 × 1500 nm) with 3D mesh grid of 1 nm spacing. The dielectric functions of Au and anatase TiO2 were extracted from the data of Johnson and Christy (1972) and Jelison, Siefke et al., 2016, respectively. The time step of simulation was set up for 1500. The last process is analyzing the post data using OptiFDTD analyzer. In FDTD simulation, periodic boundary conditions (PBC) are used for the side boundaries to model the periodic nature of nanoparticles while perfect match layer (PML) boundary conditions are used for upper and lower boundary. The use of perfect match layer eliminates the reflection of light from the propagation direction. Symmetric and anti-symmetric boundary conditions are used to reduce the required memory size and computation time. To model the sunlight, a normally incident plane wave with a wavelength range from 500 nm to 1100 nm was used.",ITO,1.92,nan
10.1016/j.ijbiomac.2015.08.019,"Determination of the molecular weight was performed according to Mohammad Amini et al. . The solution preparation procedure for molecular weight determination was the same as described in Section , except all the solutions were double filtered through 0.45 μm syringe filter with cellulose acetate membrane (Macherey–Nagel, Germany) to remove any insoluble particulate matter. The concentration of the stock solution was 0.05 g/ml. The stock solution was diluted to a series of three lower concentrations ranging from 0.0025 to 0.01 g/ml. The molecular weight was determined from the intensities of the scattered light by plotting the excess Rayleigh factor (R ̄θ) as a function of polymer concentration (c) by means of a Zetasizer (Nano ZS, Malvern Instruments, UK) with the following specifications: standard medium, Toluene; refractive index, 1.330; scattering angle, 90°; temperature, 25 °C. Before the test, the device was calibrated using well-filtered toluene with a known Rθ of 1.352 × 10−5
cm−1 at 633 nm. Mw was measured through the following equations:",Toluene,1.33,nan
10.1016/S0925-4005(01)00998-4,". For highly acidic solution (pH=2), it’s value is 26×10−14
cm6
M−1 and for highly basic solution (pH=12), its value is 84×10−14
cm6
M−1. The spectroscopically calculated values of corresponding critical transfer distances (R0A) calculated from , assuming fluorescence quantum yield of acriflavine as 0.9 and refractive index 1.45, are also given in . As expected, (R0A) also increases linearly with pH. Its value for pH 2 is ≈56 Å and for pH 12 ≈68 Å, respectively. Spectroscopically calculated value of overlap integral and critical transfer distance for intermediate pH ranges have been given in table . Energy transfer efficiency (η) and reduced concentration (γcal) calculated from , respectively are also given in and these also increase by and large linearly with increasing pH. Thus, ΩDA,R0A, ηT and reduced concentration γcal are good parameters for the measurements of pH using the sensor film.",acriflavine,1.45,nan
10.1016/j.ijheatmasstransfer.2014.12.062," shows the experimental setup, which consists of the test section, the lower tank, the upper tank, the two high-speed video cameras (Integrated Design Tool, M3), the two LED light sources, the two optical filters, the four z-axis stage actuators (SUS Corp., SA-S6AM) and the digital fiber sensor. The test section was the vertical pipe of 12.5 mm diameter D and 2000 mm long. The pipe was made of fluorinated-ethylene-propylene (FEP) resin, whose refractive index is close to that of water, i.e. the refractive indexes of FEP resin and water are 1.338 and 1.333, respectively. The FEP pipe was installed in the acrylic duct. Water was filled in the gap between the duct and the pipe. Hence the optical distortion at the pipe surface was negligibly small.",FEP,1.338,nan
10.1016/j.solener.2008.12.009,"Measurements were made using a Shimadzu UV-3600 UV–Visible Spectrophotometer with an operating range from 0.170 to 3.300 μm encompassing 98% of the incident solar energy at air mass 1.5. The fluids were enclosed in Spectrosil® (synthetic fused silica) cuvettes with pathlengths of 0.1, 2 and 10 mm. All the measurements were made at ambient temperature, 25 °C. The cuvettes limit the operating wavelength range to 0.170–2.700 μm. Because of the extremely strong infrared absorption bands in water and the two glycols the wavelength range of interest was limited to 200–1500 nm. The solar energy in this wavelength range is still nearly 85% of the total energy (). The spectrophotometer produces values of transmittance, for a given pathlength cell, as a function of wavelength. proposed a method for iteratively calculating the optical constants of organic fuels using transmittance measurements of two pathlength cells via Fourier Transfer Infrared Spectroscopy (FTIR). An important difference between Tuntomo et al.’s and the present work is Tuntomo et al.’s use of a cell with a refractive index close to 1, allowing the cell to be treated as a single slab since this eliminates any reflected or absorbed energy from the air to the window. Because the cuvettes used in this analysis are quartz, with a real refractive index near 1.5 for the majority of the spectrum, the multiple reflections at the interfaces between the air and the window and the window and the fluid sample can’t be ignored. The system used here is a 3-slab system (",quartz,1.5,nan
10.1016/j.rinp.2018.11.070,"The samples to be trapped were identical polystyrene spheres (4 um in diameter, refractive index 1.6, DAE Scientific Inc., China) which were monodispersed in water solution at different concentrations. The density of polystyrene spheres is 1.05 g/cm3, which is slightly higher than water. The sample chamber was a customized culture dish with a bottom of 200 um in thickness and a lid. During the experiments, the bottom of the culture dish was covered with a slight sample liquid film which was diluted using distilled water. The lid was put up to eliminate the interference of air motion. Then the dish was fixed on a XYZ manual translation stages (ULTRAlign Model M-561D, Newport) and let stand. The vortex beam could be focused right at the air-water surface by adjusting the height of the culture dish.",polystyrene,1.6,nan
10.1016/j.vacuum.2008.05.029,"where T is the average transmittance in the wavelength range of the visible spectrum, and Rs is the sheet resistance. For the single AZO film with the thickness of 40 nm, the merit figure of 0.0069 × 10−2
Ω−1 is obtained with an average transmittance as high as 93% and a resistivity of 2.8 × 10−2
Ω cm. For the AZO/Cu and Cu/AZO bi-layer films, the FTC is larger than that of the single AZO film, the resistivity is as low as 6.24 × 10−5 and 5.28 × 10−5
Ω cm, respectively, but the average transmittance is only 62 and 74%, respectively. The resistivity of bi-layer films is very low because Cu is superior conductor, and the low average transmittance results from the mirror reflection and the absorption in Cu layers . In order to enhance the transmittance of bi-layer films, the tri-layer films are designed. For the structure of tri-layer films, the top and bottom layers with high refractive index are beneficial to suppress the reflection from the metal layer . Hence, the high transmittance of AZO/Cu/AZO tri-layer films can be obtained due to high refractive index of ZnO (n
= 1.96) .",ZnO,1.96,nan
10.1016/S0022-2313(99)00015-0,"The quantum yield of the ligand-centred fluorescence QFL was measured relative to quinine sulphate 6.42×10−6 M in 0.05 M H2SO4 (refractive index: 1.338, absolute quantum yield: 0.546) for both free L1 and 1 : 1 and 1 : 3 La-complexes by using instrumentation and procedures similar to those described for the determination of QEu,Lrel. The emission spectra were corrected for Rayleigh and Raman diffusion bands. Measurement of QFL in the complexes had to take into account the effect of decomplexation. At the selected concentration of 10−4 M, the average number of complexed ligand molecules per LaIII ion amounts to 0.46 (log K=4.2, see above) and 2.85 (log K's=8.9, 7.9, 6.5 ) for 1 : 1 and 1 : 3 complexes, respectively. To avoid exciting free ligand molecules, the excitation wavelength was chosen to coincide with the low energy side of the lowest *π←π transition, taking advantage of the bathochromic shift of this transition upon complexation . Lifetimes of the L1 singlet state in solutions of L1, [La(L1)(NO3)3] and [La(L1)3]3+10−4 M were determined at the Institut de Génie de l'Environnement from the Swiss Federal Institute of Technology (Lausanne). The intensity of the ligand-centred phosphorescence was measured at 77 K on frozen solutions in acetonitrile. The water content of the solutions was checked before and after the measurements by Karl Fischer titrations and never exceeded 50 ppm.",H2SO4,1.338,nan
10.1016/j.jasrep.2016.09.016,"Grain-size determinations were conducted at CEREGE. Samples were collected at 5-cm intervals. Many samples were fine grained with a general grain size < 2 mm. Organic matter was removed prior to analysis (), and the samples were dispersed using 0.3% sodium hexametaphosphate. The grain-size distribution was measured using a Beckman Coulter LS 13320 laser granulometer with a range of 0.04 to 2000 μm, in 132 fractions. The calculation model (software version 5.01) uses the Fraunhöfer and Mie theory. For the calculation model, water was used as the medium (RI = 1.33 at 20 °C), a refractive index in the range of that of kaolinite for the solid phase (RI = 1.56), and absorption coefficients of 0.15 for the 780-nm laser wavelength and 0.2 for the polarized wavelengths (). Samples containing fine particles were diluted, measuring between 8 and 12% of obscuration and between 45 and 70% PIDS (Polarization Intensity Differential Scattering) obscuration.",kaolinite,1.56,nan
10.1016/j.rser.2017.10.041,"). As a binary metal oxide, the ratio of Ni:O deviates from 1:1 making it non-stoichiometric most times. NiO stoichiometry is shown by the colour variation . NiO can either be a black or green crystalline powder. Density of NiO is 6.67 g/cm3 and the melting point is 1955 °C . Nickel chemical composition of NiO is 78.55% while oxygen is 21.40%. It has a molar mass of 74.6928 g/mol. It has magnetic susceptibility of +660.0·10−6
cm3/mol. The refractive index of NiO is 2.1818. The toxicity of nickel oxide depends on the quantity inhaled . It exists in various oxidation states. The states are nickel trioxide or sesquioxide (Ni2O3), nickelous oxide (NiO), nickel dioxide (NiO2), nickelosic oxide (Ni3O4), and nickel peroxide (NiO4). NiO has rhombohedral or cubic structure referred to as Bunsenite. NiO is a p-type semiconductor with a wide band gap between 3.5 and 4.0 eV . NiO finds useful application in solar cells and UV photo-detectors due to its high durability and excellent chemical stability. Other applications include electrochromic devices , anti-ferromagnetic layers , and chemical sensors .",NiO,2.1818,nan
10.1016/j.polymer.2015.11.011,"). Cd(C2H5)2, ZnC and Hg(SC4H9)2 served as the catalysts. Low molecular weight homopolymers and copolymers (containing oligoethylene sulfide blocks) were obtained. In 2007, Nozaki and co-workers investigated the coupling of propylene sulfide with CS2 to yield a well-defined poly (propylene trithiocarbonate) and cyclic propylene trithiocarbonate. This process was optimized to provide a high molecular weight copolymer with 92% selectivity. Since no oxygen-containing monomer existed in the reaction, O/S scrambling was not an issue, and this polymer was completely alternating. Because of the high sulfur content of the copolymer, it possessed a very high refractive index of 1.78 (measured by Abbe's refractometer, cast film, 20 °C), which could be classified into the highest values among those of the reported sulfur-containing polymers .",sulfur,1.78,nan
10.1016/j.optmat.2018.07.037," (b) for an example of a mode pattern]. The detailed description of the design process is provided in Ref. []. The key aspects of this design were ensuring a single-fundamental-mode operation, and the minimization of the effective mode area through a proper selection of the material composition and waveguide dimensions. In (a), we show the structure of the designed waveguide. This waveguide has relatively large dimensions compared to those of more compact “deeply etched waveguides” []. It also requires a relatively shallow etch depth, and it is known in reports as a strip-loaded waveguide []. The fundamental modes in such waveguides are well confined within the guiding layer [see (b)]. Therefore, the optical field does not “see” much of the fabrication imperfections, and the propagation loss is thus relatively low. The composition of the guiding layer was selected to be In0.63Ga0.37As0.8P0.2 with the corresponding refractive index of 3.58 at 1550 nm []. The refractive index of InP claddings was 3.17 [], resulting in the index contrast of 0.41 at 1550 nm between the core and claddings. The minimal effective mode area achievable with our design was around 1.7 μm2 at 1550 nm for a 1.7-μm-wide waveguide. The designed waveguide can potentially operate at a broad range of wavelengths spanning from the telecom C-band to around 3 μm [].",InP,3.17,nan
10.1016/j.mee.2005.12.017," depicts the possibilities. Staying at sin
θ
= 0.95, a fluid with n
= 1.56 moves the limit to NA = 1.482. Because the refractive index of fused quartz is about 1.56 and that of CaF2 is lower, an immersion fluid with index higher than 1.56 cannot support higher NA with a flat lens bottom. For example, at n
= 1.66 the maximum realistic NA is still 1.482, except that due to a smaller angle in the fluid, DOF is larger. Staying with n
<1.56 in the lens material, the only way to increase NA beyond 1.482 is to bend the last lens surface as shown in ",quartz,1.56,nan
10.1016/j.vacuum.2008.11.005,"GeC films were prepared on ZnS substrates by reactive RF magnetron sputtering in Ar and CH4 mixtures with a Ge disc as the target. H content in the films was studied as a function of the deposition parameters. IR transmission spectra showed that the bonds between C and H caused strong IR absorptions in the bands of 3000–2800 cm−1 and 1500–1200 cm−1. Moreover, sp3 and sp2 C as well as C–Ge bonds existed in the GeC films and H combined mainly with C. RF power had a little effect on H content, indicating that H was mainly incorporated into the GeC films in the form of CH4 or CHx. IR absorption of the GeC film increased a little with the increase in partial pressure of CH4 as well as total pressure of gas mixture. Increase in substrate temperature decomposed CH4 and CHx into C and H and H was desorbed from the GeC film, lowering the IR absorption. However, high substrate temperature prevented CH4 or CHx from adsorbing onto the substrate, which decreased C content in the GeC film and increased the film's refractive index. Higher annealing temperature of the GeC film reduced H content, but high annealing temperature (500 °C) caused the graphitization of the GeC film and destroyed its continuity. Finally, low H content GeC film with refractive index of about 1.8 was obtained.",GeC,1.8,nan
10.1016/j.matlet.2012.05.025,"The BFZOx thin films have been deposited on LNO/Si (100) substrates by PLD. All films are (101) orientation and show smooth surface. Eight Raman-active modes and two second order peaks are observed. With increasing the Zn amount, the Raman active modes of the films shift to larger wavenumbers, and the FWHM becomes smaller. At the photon energy of 2 eV, the refractive index of BFO films is 2.71, and it decreases with increasing the Zn amount. The extinction coefficient is close to zero at the range of 0–2 eV. The absorbing edge appears at about 2.73 eV, and it shifts to higher energy side with increasing the Zn amount. The band gap of BFO films is 2.74 eV. It increases with the Zn amount, which may be caused by Burstein–Moss effect.",BFO,2.71,nan
10.1016/j.photonics.2014.09.001,"LSPs are charge density oscillations confined to the metallic nanostructures . LSP resonant wavelength and electric field distribution are strongly dependent on the shape, size, and elements of the metal structures , making tuning the resonant wavelength and varying the electric field distribution possible by altering the metal structure. In addition, the resonant wavelength depends on the environment of the surrounding media , which has drawn much attention in sensor applications using nanostructures with different topologies or different arrangement, such as nanospheres , nanodisks with missing wedge-shaped slices , dolmen nanostructures , and array of gold nanorods . According to other research reports, the figure of merit (FoM) (FoM = (1/fwhm) × (Δw/Δn), where fwhm is the full width at half maximum, Δω and Δn represent the variation of frequency and refractive index, respectively) of a single silver nanocube on dielectric substrate can reach 5.4 . At optimized conditions, which formed a Fano resonance in the nanocube, it can produce a higher FoM ranging from 12 to 20 .",silver,5.4,nan
10.1016/j.vacuum.2008.11.010," presents the refractive index n and the extinction coefficient k of the thin films as a function of wavelength λ. As can be seen, the extinction coefficients k of the thin films are very small at long wavelengths, showing that the thin films are highly transparent. In addition, the curves of the extinction coefficient k are fairly flat above 600 nm and rise rapidly at shorter wavelength. Similar to the curves of the extinction coefficient k, the refractive indices n decrease linearly with increasing wavelength for the thin films, indicating the typical shape of the dispersion curve near an electronic interband transition. At wavelength λ
= 510 nm, the complex refractive indices n* of thin films Alq3, ADN and BAlq are 1.7057-i0.0111, 1.7271-i0.0059 and 1.6915-i0.0054, respectively. The results obtained in the present work are in agreement with the previous researches .",BAlq,1.7057,nan
10.1016/j.ijheatmasstransfer.2015.01.063,"where ω is the angular frequency, ωp is the plasma frequency, and ωj is the resonance frequency, fj is the strength, and Γj is the damping constant of the jth oscillator. These coefficients are obtained from , and the refractive index of SiO2 is assumed to be constant value of 1.45 in the considered wavenumber range.",SiO2,1.45,nan
10.1016/j.vacuum.2009.11.014,"High-quality CuCrO2 films were prepared by pulsed laser deposition (PLD). The film deposited with the pulse energy density (PED) of 2 mJ/cm2 is highly c-axis oriented. The refractive index of the CuCrO2 films is about 1.29 obtained by transmission spectra of the films, which implies that the CuCrO2 film will be a potential antireflection coating in visible light. The films prepared with different PEDs show different conduction mechanism, which suggested the different band structure between these CuCrO2 films.",CuCrO2,1.29,nan
10.1016/j.vibspec.2016.03.009,"with the radial parameter r=r'-r0, the refractive index of InP n0
= 3.06, the substrate thickness dsub and the metamaterial thickness dmet. The refractive index can also be expressed with the hole diameter b(r) and the hole period dr
= 1.8 μm as follows",InP,3.06,nan
10.1016/j.commatsci.2013.11.041,". At zero frequency, the refractive index n(0) of the tetragonal NaZnP is about 2.62. The refractive index increases from the static value to attain a maximum of 3.97 at 3.85 eV then decreases rapidly to its minimum value which is smaller than 1. From (b), one can say that the tetragonal NaZnP shows small reflectivity at low energies then a rapid increase of the reflectivity occurs in the energy range 4–14 eV. A reflectivity maximum occurs between 5.5 and 7.0 eV which coincides with the lower negative values of ɛ1(ω). The energy-loss function L(ω) is a physical parameter describing the energy-loss of a fast electron traversing a material. Its main peak occurs at the energy ħωP, where ωP is called screened plasma frequency . From (c), we can see that the main sharp structure of L(ω) is located at about 15 eV, corresponding to a rapid decrease of reflectance.",NaZnP,2.62,nan
10.1016/j.talanta.2010.05.060,"The biomolecular immunoaffinity reactions were studied using SPR analyzer (Nano-SPR, USA) and gold-coated slides from the same company. The resolution of the resonance angle reading of the instrument is 0.003° with a maximal angle scan range of 17°. The SPR analyzer employed here is equipped with a flow system and dual channel. The SPR sensor was composed of prism (65°, F8 glass, refractive index 1.61, GaAs laser 650 nm), a microtube peristaltic pump and a flow cell. The gold slide (10 mm × 10 mm × 1 mm) was matched to the prism using a refractive index matching liquid. A silicone flow cell of 10 mm thickness having a cylindrical cavity (10 mm diameter and 50 μl volume) was placed over the gold slide. Red light emitting from GaAs laser (2 mW, 650 nm) was reflected at the gold slide from the backside at attenuated total reflection angles, and the reflected light intensity was recorded as a function of the incident angle or of the time using a semiconductor photodiode. Four gold slides was used, one for calibration curve, the second one for thiol deposition and thickness estimation, the third one for bacteria detection with the self-assembled monolayers method, the fourth one for bacteria detection with gold nanoparticles. All the experiments were performed at a room temperature of 25 °C with sterile PBS solution.",GaAs,1.61,nan
10.1016/j.optmat.2018.09.049,. The extinction coefficient spectrum also indicates peaks at energy positions mentioned above for ɛ2-spectrum. Extinction coefficient value is very small (k < 0.23) below the band gap region as expected theoretically. Refractive index of the Ga2S3 was determined from the associated plot as 2.67 at band gap energy of 2.48 eV and between 2.60 and 2.75 in the visible spectral region (1.77–3.26 eV).,Ga2S3,2.67,nan
10.1016/j.mssp.2018.04.019," shows the optical constants calculated by this model. The anomalous dispersion appears in visible region. The refractive index of the film reaches the maximum at a wavelength of about 0.8 μm. Besides, the refractive index of the germanium films in the infrared band is greater than 4.0. The extinction coefficient gradually decreases with the increase of the wavelength, and the extinction coefficient in the transparent region is on the order of 10−4. The transmission spectrum of the infrared band of the germanium thin films of the ZnS substrate based on the Cody-Lorentz model which is shown in the ",germanium,4,nan
10.1016/j.vacuum.2012.02.025," shows the reflectance and the refractive index of films deposited on a wafer at each temperature. The reflectance values of films at 300 and 350 °C are smaller than that at room temperature due to surface roughness, and that at 400 °C increased again because of a smoother surface than that at room temperature. This effect can be confirmed by the results of refractive index in (b). The refractive index of pure ZnO is 1.99 for the wavelength of 600 nm, but the refractive index of the deposited AZO film at room temperature was 2.02. It increased to 2.18 and 2.17 at 300 °C and 350 °C respectively, and decreased to 2.04 at 400 °C because of a smoother surface. The change of the refractive index is potentially caused by the properties of the material and the surface morphology. From Figs. and ",ZnO,1.99,nan
10.1016/j.optmat.2018.09.016,"The impact of PBG range while varying radius of the rod is shown in (b), by increasing the radius of the rod, the PBG frequency is shifted to the lower values. From this analysis, the radius of the rod as 130 nm is accounted for sensor design and it is highlighted by green color over the first TE PBG region. The refractive index of circular rods are silicon (n = 3.5), and the background index is air (n = 1). Hence, the refractive index difference between silicon and air is termed as delta (Δ = 2.5). The delta value is represented by green color over the first TE PBG region, and its wavelength range lies between 1351.5 nm and 2203.1 nm. , it is observed that the bandgap frequency is shifted to the lower values while increasing the delta.",silicon,2.5,nan
10.1016/j.atmosres.2006.02.003,"Aerosols with a size distribution ranging from 1 to 5 μm were generated at room temperature (∼ 18 °C) under normal pressure from the dilute MgSO4 or NaClO4 solutions of ∼ 0.5 mol l− 1 through the ultrasonic humidifier. After that, the aerosols passed (with the clean air as carrier) along the pipeline system, and some particles were deposited on the surface of an ATR crystal IRE for spectroscopic investigations, i.e., the ZnSe crystal IRE (refractive index: 2.4) in our experiments, as shown in . To ensure a low coverage on the surface of the ZnSe crystal IRE, the amount of deposited aerosol particles has been carefully controlled to obtain an apparent absorbance of no more than 0.1 for the v3 vibrations of SO42− and ClO4− in measurements. Shown on the top left of is an image of deposited MgSO4 aerosol particles on the surface of the ZnSe crystal IRE, as observed by a Leica microscope at room RH (∼ 50%). According to the image, the deposited aerosol particles usually range from a few micrometers to over ten micrometers, and apparently spread on the surface.",ZnSe,2.4,nan
10.1016/j.vacuum.2010.07.003,", respectively. indicates that for films deposited in compound mode there is a shift towards lower n values as the silicon content increases. For films deposited at metal mode there is a shift towards higher n and k values, which indicates a more metallic film. In the literature bulk titania and silica have refractive indices of about 2.5 and 1.45, respectively. The films deposited with oxygen addition in the sputter ambient all have refractive indices in this interval. For films deposited with only argon the refractive indices exceed the n value of TiO2, but below and about the same as pure silicon, which is ∼4 in the visible range. For films deposited in compound mode their refractive index decreases with increasing silicon content, while in metal mode there is a increase in refractive indices as the silicon content increases. As discussed, in principle, by Bakr et al. and several others the variations of refractive index for different films of supposedly known composition may be both due to changes in the film density, porosity and changes in the stoichiometry. However, since the process parameters such as ion bombardment and temperature are invariable between the depositions, the porosity is assumed not to vary significantly between the samples. The change in composition is concluded to be the main source of variations of the refractive indices, and is consistent with the variation of the Si/Ti content in the films.",silica,2.5,nan
10.1016/j.mee.2007.01.027,"As an epoxy-based resist, SU-8 has been widely used in the manufacture of MEMS (microelectro mechanical systems), lab-on-chip systems and dry etch masks due to its excellent chemical resistance, mechanical and optical properties . SU-8 exhibits is optically transparent (over 98%) at wavelengths above 400 nm and the refractive index is 1.59 at λ
= 600 nm. These optical properties make SU-8 an ideal material for optically transparent gratings and other nanophotonic structures. To date, it has electron beam lithography (EBL) has not been successfully used to replicate grating structures in SU-8 on the nanometre scale. One of the reasons is that SU-8 is extremely sensitive to electron beam irradiation and the patterned structures by EBL suffer serious proximity effect so that high density gratings are always irresolvable . As described in this paper, conventional nanoimprint lithography without UV curing also fails to generate high resolution gratings with good contrast due to the difficulty in forming imprinted shapes because of the very low viscosity of the SU-8. In this paper, we describe a novel technique which uses nanoimprinting in combination with UV curing, and enables fabrication of well resolved SU-8 gratings with high density, high resolution and high aspect ratio. The technique is performed at low temperature, low pressure and has good uniformity. The imprinting properties of SU-8 were investigated and the remaining issues encountered in this work are discussed. This preliminary results presented here present an opportunity for the fabrications and applications of nanostructures in SU-8 at an economic cost.",SU-8,1.59,nan
10.1016/j.ejpb.2012.08.014,"The polyplex solution was diluted 1:20 with buffer and measured in a folded capillary cell (DTS1061) with laser light scattering using a Zetasizer Nano ZS with backscatter detection (Malvern Instruments, Worcestershire, UK). The viscosity influences the diffusion of the particles, hence the hydrodynamic diameter, and therefore, an accurately known viscosity and constant temperature was needed. For size measurements, the equilibration time was 0 min, the temperature was 25 °C, and an automatic attenuator was used. The refractive index of the solvent, in our case water, was 1.330, and the viscosity was 0.8872 mPa/s. The DLS setup for the size measurements was calibrated with narrow distributed polystyrene latex nanoparticles with a size of 60 and 200 nm and a refractive index of 1.590 from Thermo Scientific (formerly Duke Scientific Corp.). Each sample was measured three times with 10 subruns of 10 s. A single exponential was fit to the correlation function with Cumulants analysis to obtain the Z-average diameter and the polydispersity index (PdI). The standard deviation after data analysis was not the distribution of the size around the mean, but the variation of the median among n measurements of the same sample . The DLS setup for the zeta potential measurements was calibrated with a zeta potential transfer standard of -50 mV from Malvern Instruments. The zeta potential was calculated by the Smoluchowski equation . Therefore, 10 up to 30 subruns of 10 s at 25 °C (n
= 3) were measured.",polystyrene,1.59,nan
10.1016/j.cap.2011.06.028,"Aluminum fire-through was not observed for the slow-deposited a-SiNx:H thin film with a refractive index of 2.0. Therefore, longer firing was tested. The firing profile of 750 °C for 5 s after the burn-out at 550 °C for 2 min was extended by increasing the holding at 750 °C to 15 s. ",Aluminum,2,nan
10.1016/j.cap.2011.06.028,"The deposition rate increased with increasing refractive index, while the etching rate decreased. Varying deposition rates of a-SiNx:H thin films with similar refractive indexes were also examined. Aluminum fire-through occurred in all but four samples (KU#01, KU#02, KU#06, KU#07) and was shown to be related to both refractive index and deposition rate. Aluminum fire-through was not observed during firing by RTP when the refractive index was lower than 2.05. However, when KU#01 and KU#02 (which did not exhibit aluminum fire-through) were fired for longer, aluminum fire-through occurred. Therefore, aluminum immediately started to react with the SiNx:H thin film as soon as the firing started. Its reaction rate depended strongly on the refractive index and weakly on the rate of deposition.",Aluminum,2,nan
10.1016/j.cap.2011.06.028," show cross-sectional SEM images of the Al-BSFs of KU#03 and KU#04 (n = 2.26 and 2.36, respectively) at each firing temperature. Neither showed aluminum fire-through at 660 °C, the lowest firing temperature. The reaction between the aluminum and the silicon occurred during firing at 690 °C and above. The thickness of the Al-BSF varied. KU#03 had very small Al-BSFs of ca. 1–2 μm at all temperatures except 660 °C. However, KU#04 showed very thick Al-BSFs at higher temperatures. The cross-sectional SEM images of the Al-BSFs of KU#04 were similar to those of samples without dielectric layers at each temperature. Aluminum fire-through occurred as the refractive index of the a-SiNx:H thin film increased.",aluminum,2.2,nan
10.1016/j.cap.2011.06.028," shows cross-sectional SEM images of fast-deposited a-SiNx:H thin films with refractive indexes of 1.9, 2.0, and 2.2. At a refractive index of 1.9, both the slow-((d)) and the fast-((a)) deposited a-SiNx:H thin films did not exhibit aluminum fire-through. At refractive index 2.2, both slow ((d)) and fast ((c)) deposition rates resulted in aluminum fire-through. Variation of deposition rate resulted in differences at a refractive index of 2.0, with aluminum not reacting with silicon in the slow-deposited sample ((d)). However, fast deposition led to aluminum fire-through.",aluminum,2.2,nan
10.1016/S0925-4005(01)01020-6,") consists of a silicon 〈1 0 0〉 wafer provided with a thermal SiO2 substrate layer with refractive index ns=1.459, produced by thermal oxidation of the wafer at 1150 °C, an LPCVD Si3N4 core layer with refractive index nF=2.036 grown at 800 °C, and a PECVD SiO2 cover layer with refractive index nc=1.464 grown at 300 °C. All refractive indices refer to λ=647 nm. The high refractive index contrast between the core layer and the cladding is chosen for the reason of achieving high sensitivity . The ridge-type channel waveguides are realized by locally etching the LPCVD Si3N4 core layer using BHF etching solution. The channel waveguides have a ridge height of 1 nm and width of 2 μm, being mono-modal both in transversal and lateral directions for the TE polarized light with a vacuum wavelength of 647 nm.",Si3N4,2.036,nan
10.1016/j.ejpb.2014.04.006,"where I is the intensity of light scattering from the solution relative to that from toluene, Is, c is the concentration (in g L−1), Mw is the mass-average molar mass of the solute, A2 is the second virial coefficient (higher coefficients being neglected), and K* is the appropriate optical constant (K∗=4π2(dn/dc)2nref2/(RrefNaλ4). Values of the specific refractive index increment, dn/dc, were determined to be 0.13413 ± 0.00001 m3
kg−1 by analyzing the concentration dependence of the polymer refractive index by using a refractometer RA-510M (Mettler-Toledo, Spain). Other quantities used were the Rayleigh ratio of toluene for vertically polarized light, Rref
= 2.57 · 10−5
· [1 + 3.68 · 10−3(t
− 25)] cm−1 (t in °C) and the refractive index of toluene, nref
= 1.4969 · [1 − 5.7 · 10−4(t
− 20)].",toluene,1.4969,nan
10.1016/j.solener.2012.08.020,"where np, n and p are the refractive indexes of porous and dense films, and the porosity volume percentage, respectively (). Previously, Thomas prepared porous SiO2 films with the refractive index 1.22 by sol–gel process. However, the film had high porosity, poor abrasion resistance, so it was not suitable for industrial applications. It can be seen from ",SiO2,1.22,nan
10.1016/j.mee.2007.01.179,"The first design step was the optimization of the waveguide thickness, looking for the highest sensitivity in front of changes of the external refractive index. In a first step, the thin grating approximation (TGA) was used, combined with the method described in . The waveguide structure consists in a Si3N4 layer, with a refractive index of 2.015, over a buffer layer of SiO2 (with an index of 1.45), resting over an ordinary silicon wafer. The reference external medium is water, because of its ability for supporting different bacteria cultures.",Si3N4,2.015,nan
10.1016/j.spmi.2015.08.015,"We consider, at the used wavelength, the refractive index and extinction coefficient of GaAs, as ns= 3.86 and ks= 0.20, respectively . The GaN optical constants (n and k) are parameters of simulation. The refractive index of the gaz-phase ambient is assumed to be equal 1.",GaAs,3.86,nan
10.1016/j.optmat.2018.08.008,"where, λ corresponds to the wavelength of incident light, ΔVout refers to the small change of the rms value of output voltage on application of electric field measured using the lock-in amplifier, ΔVapp represents the rms modulation voltage, Vpp refers to the transmittance voltage of half wave points corresponding to zero electric field, ne is the effective refractive index of SBN thin film (2.21), t represents the thickness between the electrodes parallel to the electric field (5 mm) and l refers to the optical passage of light within the SBN60 thin film (14 mm) in the present case ((c)) []. The laser light is focused on the SBN60 sample through the polarizer set at an angle of 45° with respect to the incident beam. The transmitted light through the sample with zero bias was allowed to pass through the quarter wave plate. The output of the photodetector was connected to the multimeter and the ac voltage was recorded for different angles of the quarter wave plate. The maximum value of the voltage was considered as Vpp in the present case, which corresponds to maximum intensity changes between half wave points [,].",SBN,2.21,nan
10.1016/j.triboint.2015.01.014,The discs were made of glass coated with approximately 20 nm of chromium and 500 nm of silica. The disc supports a maximum Hertz pressure of approximately 0.7 GPa. The silica spacer layer has a refractive index of 1.4785 according to the manufacturer.,silica,1.4785,nan
10.1016/j.mssp.2009.08.005,". A p-type single crystalline silicon substrate with thickness of 0.27 mm and resistivity of 2–4 Ω cm, obtained from BP SOLAR, was used in all our experiments. A silicon nitride (SiN) film with thickness of 150 nm and refractive index of about 2.4 was formed on n+ layer of pyramid-like shape by a low-pressure plasma chemical vapour deposition. Here, we used silicon substrates with thicker SiN films, which allowed us to grasp the etching state, easily. Additionally, 40-mm-square specimens were cut for experiments although the original size of a solar cell was 125×125 mm2. The arrangement of a stainless steel electrode whose one side is covered with a quartz glass layer having a convex part of 30 mm width, 60 mm length, and 9 mm height is a key to the surface discharge formation. The thickness of the quartz glass layer of the convex part was 1 mm. A cut specimen was sandwiched by the convex part and a stainless steel electrode of 70 mm diameter, and the silicon nitride surface faced the convex part. The height of a convex part of a dielectric electrode used in our previous study was only 5 mm, and dielectric barrier discharges were produced not only at the areas for electrode grooves but also at other areas at Vd=3.5 kV. For a newly designed dielectric electrode, dielectric barrier discharges were not be produced even at Vd=4.0 kV. That is, the surface discharges were formed only along boundary lines between the discharge electrode covered with the quartz glass and the silicon nitride film. This indicates that our technique can realize a mask-less plasma processing.",SiN,2.4,nan
10.1016/j.mee.2009.11.082,"The biomolecular layers’ thickness can be calculated accurately by applying WLRS and known refractive indices of the layers employed from literature. In particular, refractive index of APTES was found to be 1.46 and the respective of protein layers to be 1.40 . The fitting range selected, is from 550 to 750 nm, as the available from literature refractive index values correspond to the specific spectrum range. Furthermore the 990-nm thick SiO2 provides with two interference maxima and one minimum in this spectral range. The existence of more than one extrema increases further the accuracy of the calculated layer thickness. The spectra of the deposited layers in the case of RgG–antiRIgG system are depicted in ",APTES,1.46,nan
10.1016/j.solener.2011.06.027,"Uniform and highly adherent thin films of CNT:TiO2 were synthesized by sol–gel dip coating method. Both TiO2 and CNT:TiO2 films showed very identical structural characteristics and no significant changes in the lattice values were observed. The crystalline size decreased from 20 nm for TiO2 film to 17 nm for the 4%CNT:TiO2 film. The film surface was very smooth and compact, as indicated by the roughness data obtained from AFM measurements; the root mean square (rms) average of the roughness was as low as 3 nm. The HRTEM showed that the CNTs are embedded in the matrix of TiO2 indicating the formation of a composite. In Raman spectra the characteristic vibrations of the TiO2 are identified, the increase in the FWHM of main anatase peak (144 cm−1) in the case of the 4%CNT:TiO2 film is interpreted as due to the incorporation of CNTs in the film. At the wavelength of 600 nm the refractive index of pure TiO2 was 2.07 and the 4%CNT:TiO2 showed a value of 2.29. The photoresponse curves showed typical features of charge trapping centers in the band gap of the films.",TiO2,2.07,nan
10.1016/j.vacuum.2009.12.014," optical constants of the deposited films are plotted as a function of the sputter power. The refractive index corresponds to the value of crystalline quartz (n(550 nm) = 1.46), and the absorption is rather low. At target powers >1 kW (1 kW corresponds to a power density of 13 W/cm2) there is a small but measurable absorption due to a lack of oxygen in the process. Thus a more effective oxidation will be required to get stoichiometric films.",quartz,1.46,nan
10.1016/j.optmat.2018.10.005,"Furthermore, according to Reference [], simulated results by adopting multiple diffuse reflection method indicate that optical path length in powder material is proportion to refractive index, and optical path length increase 15% within refractive index range from 1.1 to 2.4. Absorption spectrum of Er3+-doped borosilicate glass and diffuse reflection spectra of its grinded powder are measured respectively, and a certain thickness h of borosilicate glass powder is determined, which has the same absorbility as the borosilicate glass with 3 mm thickness. In this article, absorption spectrum shown in is measured by making the thickness of Er3+/Yb3+ doped BaGd2ZnO5 powder sample be equal to h. In consideration of 6.5% revision of optical path length of BaGd2ZnO5 powder (n = 2.31) to borosilicate glass powder (n = 1.7), the realistic optical path length is d=3mm∗(1+6.5%)≅3.2mm.",BaGd2ZnO5,2.31,nan
10.1016/j.mee.2009.08.025,"TiO2 thin films were deposited using Sol–Gel spin coating technique using titanium isoperoxide as the Titania precursor. The films were characterized using X-ray diffraction, capacitance voltage measurement and Raman characterization technique. The XRD and Raman spectra indicate the presence of anatase TiO2 phase in the film. The grain size as calculated using the Scherrer’s formula was found to be 30, 66 and 59 nm for TiO2(0 0 4), TiO2(2 0 0) and TiO2(2 1 1), respectively. The grain size was found to increase after annealing at 800 °C. The dielectric constant as calculated using capacitance voltage measurement was found to be 25. The refractive index of the film was 2.34.",TiO2,2.34,nan
10.1016/j.bios.2016.08.010,"The quantum yield of CCDs was determined basing on an established procedure. Fluorescein (QY=0.925 at 496 nm) dissolved in 0.1 M NaOH (refractive index, 1.33) was used as reference (), while the CCDs was dispersed in ethanol (refractive index, 1.36). The absorbance of the two solution at 496 nm was kept below 0.1 to prevent the reabsorption phenomenon. Moreover, both solutions were measured in the same instrumental condition. The quantum yield was calculated as follows:",ethanol,1.36,nan
10.1016/j.optmat.2018.12.044," shows the refractive index spectra of compact TiO2 layers (or blocking, bl) and different mp-TiO2 thin films. For bl-TiO2 layer, the compact model fits quite well with its SE curve, giving a film thickness of approximately 33 nm. For mp-TiO2 layers, on the other hand, the models of porous media lead to the best fitting of SE curves. The closeness between alpha-step measured mp-TiO2 film thickness (red data in f) and those deduced from SE data (green data in f) ensures the reliability of the refractive index data in . From literature it is found that spray prepared compact anatase has a refractive index of 2.397 at wavelength of 800 nm []. Our bl-TiO2 thin films show a refractive index value of 2.253 at that wavelength. This suggests that spin coated bl-TiO2 films are less compact than the spray ones. Furthermore, our mp-TiO2 films give consistently lower refractive index values than that of bl-TiO2 in the whole wavelength range, which confirm the existence of volumetric porous structures in mp-TiO2 films.",TiO2,2.253,nan
10.1016/j.optmat.2018.12.034,"Thin motif-layered triclinic Cu3Nb2O8 was prepared through solid-state reaction at 700 °C, 12 h and their nonlinear optical (NLO) properties with ultrafast [800 nm, 150 fs (fs) pulses, 80 MHz repetition rate] pulse laser excitation were studied. A peculiar shift from reverse saturable absorption (RSA) to saturable absorption (SA) at a peak intensity of 40 MW/cm2 was observed. The involvement of excited state absorption (ESA) is confirmed from the decrease in the nonlinear absorption coefficient with increase in peak intensity and the observed nonlinearity is ascribed to a sequential 2 PA process (1 PA+ESA). Formation of layered structure in Cu3Nb2O8 acted as a transport layers which yielded high nonlinear absorption coefficient (7.8 × 10−10 m/W), nonlinear refractive index (5.17 × 10−16 m2/W) and nonlinear optical susceptibility (25.6 × 10−11 esu) when compared to other known copper niobates. The observation of low onset-limiting threshold (78.79–26.26 μJ/cm2) renders Cu3Nb2O8 a prospective material for ultrashort pulse laser protecting device and biomedical microsurgery tools. A transition of mixed phase CuNb2O6",Cu3Nb2O8,5.17,nan
10.1016/j.microrel.2018.07.119,"The refractive index of silicon is equal to 5.91 for a wavelength of 393 nm []. This index is lower for the other layers (2.1, 2.25 and 2.6 respectively for SiN, AlN, and GaN) []. A simple calculation, using Fresnel's equation (Eq. ), allows determining that about 15% of the light power will be reflected at the transition layer/substrate interface. These reflected rays can then reach the bottom of the contacts.",silicon,5.91,nan
10.1016/j.mee.2009.04.001,"Where D, h, n and λ are, respectively, the diameter, the sag height, the refractive index (1.47) of PDMS microlens and the diode laser emission wavelength (408 nm) used to probe the Lucifer yellow fluorophores. (d) shows a PDMS slab containing a microlens array with a calculated focal length of 226.6 μm, a numerical aperture of 0.22 and a depth of focus of 8.4 μm. The PDMS microlens array was supported by a 120-μmthick PDMS membrane.",PDMS,1.47,nan
10.1016/j.optmat.2018.08.031," (a). The cross sectional distribution of the optical field intensity in basic TE mode field simulated by the beam propagation method using Rsoft is shown in (b). We set the refractive indices of the SiON, SiO2 and cladding film as 1.81, 1.45, and 1.45, respectively, and the wavelength is set to 1550 nm. It is observed that most of the light in the waveguide extends deeply into the SiO2 layer. Such a field distribution can be attributed to both the high refractive index contrast and the ultra-thin SiON.",SiON,1.45,nan
10.1016/S0924-4247(00)00309-5,"The optical elements of the experiment are a diode laser with a wavelength of 1.55 μm and an InGaAs optical detector with an active area of 0.09 mm2. Silicon has a refractive index of 3.5, which gives a wavelength of 0.44 μm in the silicon crystal. Light from the laser is collimated on the silicon sample and reflected from the incident and etchant side before detection, as sketched in ",Silicon,3.5,nan
10.1016/S0022-2313(99)00457-3,"For the backward scattering, the wave vector of LO phonons is the sum of those of pump and stokes lights, ie the wavelength of LO phonons is estimated to be λLO=0.132 μm in GaP (refractive index is 3.16). Let us define a factor η as follows:",GaP,3.16,nan
10.1016/S0304-3991(00)00027-9," shows the electrical field energy density calculated in a two-dimensional model, for four positions of the probe. The porphyrin crystal was described by a rectangle of uniform fluorescence efficiency, refractive index 1.55, height 400 nm, and width 800 nm (see crossection of ). The tip aperture diameter was set to 120 nm, the surrounding metal coating had a thickness of 75 nm and the excitation wavelength was 514.5 nm. At each position of the probe, the emitted fluorescence is estimated by integrating the field energy density inside the crystal.",porphyrin,1.55,nan
10.1016/j.inoche.2009.05.022,"where OD(λ) is the absorption coefficient at wavelength λ; λ ̄ is the main wavelength of the specific absorption band; NEr is the concentration of Er3+ (NEr
= 6.02 × 1017
cm−3), L is the optical length of quartz suprasil cells (L
= 1 cm); e, h, and c are the electron charge, Plancks constant, and velocity of light, respectively; and n is the refractive index of the chloroform solution (n
1.446). According to Judd–Ofelt theory, the line strength for electric-dipole (ED) transition between the initial J manifold (S,L)J and terminal J′ manifold |(S′,L′)J′〉 can be expressed by Eq. ",chloroform,1.446,nan
10.1016/j.mee.2009.01.076,Organic semiconductor laser light sources are integrated on the chip to couple laser light from an active material slab waveguide which is combined with a distributed feedback (DFB) grating into a polymer strip waveguide . The active layer of the organic semiconductor laser is formed by vacuum deposition of aluminum tris(8-hydroxyquinoline) (Alq3) doped with the laser dye 4-dicyanomethylene-2-methyl-6-(p-dimethylaminostyryl)-4H-pyran (DCM). Alq3:DCM has a refractive index of 1.76. Lasing is induced by optical pumping with a UV light source. The Alq3:DCM layer thickness f is roughly 250–350 nm. The height of the DFB-grating e should be 70 nm and the periodicity roughly 200 nm (see ,DCM,1.76,nan
10.1016/j.mee.2009.01.064,"The samples were characterised by measuring the transmission and reflection spectra. Measurements have been performed with the spectrometer Perkin–Elmer Lambda950 in the range from 900 nm to 2500 nm for two polarisation states: the electric field is parallel (‘resonant’ polarisation) and perpendicular (‘non-resonant’ polarisation) to the “cut-wires”. Transmission measurements have been performed for normal incidence, and reflection measurements for 15°. The design of the structure and simulations of the produced geometry have been done using rigorous coupled wave analysis (RCWA) implemented in a commercially available solver from RSoft. The refractive index of MgO was assumed to be 1.72. The dielectric permittivity of gold was approximated with the Drude model using parameters from .",MgO,1.72,nan
10.1016/j.optlaseng.2016.08.012,"(a)), with diameter 50 mm, exhibiting a local planar wave front onto the entrance of the test column. The latter, represented in (b), is composed of a rectangular tank equipped with flat optical windows of width wrc=74mm and thickness erc=8mm. This tank, filled with demineralized water, encapsulates an optical-grade cylindrical glass cell of internal radius rcc=15mm and thickness ecc=5mm. Droplets of a well-controlled diameter, ranging from 0.5 to 2.8 mm, are generated at the bottom of the cylindrical glass cell using a bundle of seven carefully positioned chromatography needles . The free rising droplets have reached their terminal velocity when they pass through the illumination laser beam. The droplets are composed of Hydrogenated Tetra Propylene (HTP), a transparent liquid, immiscible in water that is used in the nuclear industry for the recycling of nuclear fuel and exhibiting physico-chemical properties typical of most liquid-liquid extraction processes. At the measurement temperature of 20 °C and for λ=632.8nm, the refractive index of HTP and water are equal to nHTP≈1.4425 and nW≈1.3317 respectively, leading to a droplet refractive index of n≈1.0832. The light scattered in the forward direction by the droplets is recorded by a CMOS camera (Camera 2 in (a)) positioned at a distancedcmos=0.4m of the center of the cylindrical cell. The sensor has a 12 bits dynamic and a resolution of 1024×1024 pixels, each pixel's side measuring 17 μm.",HTP,1.4425,nan
10.1016/j.mee.2007.12.009,"a shows the experimental data. First, as can be readily seen, there are no noticeable qualitative differences between the three different tapering profiles. The second aspect to be noted is that the fibers with air as the top cladding have the smallest coupling efficiencies (maximum value of only 9%). On the contrary, in the case of the PMMA (refractive index n
= 1.43) or PS (refractive index n
= 1.59) cladding layers, the coupling efficiency increases substantially and reaches 33% for the long taper and PS cladding. This result is counterintuitive since one expects that the material with the lowest index of refraction will increase the light confinement and hence increase the coupling efficiency.",PMMA,1.43,nan
10.1016/j.mee.2011.01.031," experimental and theoretical reflectivity data are compared at λ
= 725 nm and λ
= 626 nm for the null azimuth and the rotated configuration, respectively. Simulations have been performed with a numerical code which implements Chandezon’s differential method to solve the diffraction problem of light impinging on a multilayer grating. A grating pitch of 490 nm, a peak-to-valley height of 23 nm, a resist thickness of 120 nm, a silver (37 nm)/gold (7 nm) metallic bilayer, a PEO film 5 nm thick and with a refractive index of 1.47 are the physical parameters used in the code.",PEO,1.47,nan
10.1016/j.optmat.2018.10.003,"In this biosensor structure, Al as the noble metal for exciting SPs which is covered by a thin Au film, is deposited on the BK7 glass as the coupling prism. Si nanosheet is the next layer which is coated by different 2D materials and the last medium is the biomolecular analyte. The wavelength (λ) of the excitation light is set to be 633 nm. The optimized thickness of Al film is considered as 42 nm which is covered by 3 nm of Au layer. The refractive index of BK7 prism is 1.5151 [] and according to the Drude-Lorentz model, the wavelength dependency of the refractive indices of the metals is given by:",BK7,1.5151,nan
10.1016/j.solmat.2005.01.014,"Five different AR coatings were studied, alumina, silica, hybrid silica, and two compositions of silica–titania. Silica is well known to be a very resilient but static material. In order to make silica more flexible an organic compound can be incorporated into the structure and then the resulting material is called hybrid silica . A flexible material is more likely to perform well in accelerated aging tests since it is less prone to crack when heated or cooled. Alumina has a higher refractive index in the visible wavelength range than silica, 1.6 compared to 1.4. Pure titania has a refractive index of 2.7. Thus, refractive indices between 1.4 and 2.7 can be obtained by mixing silica and titania.",titania,2.7,nan
10.1016/j.mee.2009.11.094,"With the purpose of investigating the sensitivity of the nanocavities with respect to the refractive index of the cavity, a transmittance measurement has been carried out with the cavities filled with air and polystyrene with a refractive index of 1.59, respectively. From it is evident that the resonance is red-shifted when the refractive index of the cavity is increased. This effect has also been seen in similar and larger cavities and confirms that the LSPR is related to a plasmonic resonance mode in the cavity . It also illustrates the potential of the nanocavities acting as highly localized refractive index sensors with a resonance shift sensitivity of Δλ/Δn
≅ 68 nm/RIU.",polystyrene,1.59,nan
10.1016/S0022-2313(99)00250-1,"Structures fabricated in such a manner consist of nearly spherical silica clusters with size ranging from 0.2 to 0.3 mm which are arranged in the face-centered cubic (FCC) lattice. Under certain synthesis conditions, each silica globule may in its turn have an internal substructure. In this case, depending on the porosity, the effective refractive index of silica globules ranges from the value n=1.45 inherent in bulk silica down to neff=1.26. Opals show a dip (stop band) in the optical transmission spectrum with the spectral position depending on the lattice period and on the n value. This can be understood in terms of Bragg diffraction of optical waves. From a different viewpoint, formation of a pronounced stop band is indicative of a reduced density of propagating electromagnetic modes (photon density of states (DOS)) inside the structure.",silica,1.45,nan
10.1016/j.fuel.2008.04.026,"The asphaltenes were extracted from the asphalt CIB using 100 ml n-heptane (n-C7) per gram added to the asphalt. The mixture was subjected to digestion with stirring for 1 h and then filtered with a filter paper of 0.02 μm pore. The asphaltenes remaining in the filter paper were continually washed with n-C7 until the filtrate became colorless. Additionally, particle size distribution measurements of asphaltenes precipitated in n-heptane solvent, of original CIB asphalt and the CIB-250 asphalt thermo-oxidized in the rheo-reactor was determined in an equipment of laser diffraction technology (Mastersizer 2000, Malvern Instruments), with an interval of measurement from 0.02 μm to 2000 μm. The measures were made at room temperature. The used dispersing means were ethanol with a refractive index of 1.46. The density and the refractive index of the asphaltenes were 1200 kg/m3 and 1.70 respectively.",ethanol,1.46,nan
10.1016/j.ejpb.2013.10.013,"Both the particle size of the IgG:PLGA microspheres and the spray-dried (SD) IgG microparticles were evaluated in triplicate using a Malvern Mastersizer Hydro 2000 S (Malvern Instruments, Malvern, UK). The particle size of the SD IgG microparticles was evaluated by laser diffraction after dispersion in isopropanol (refractive index = 1.38). A refractive index of 1.52 was used for the SD IgG microparticles. PLGA microspheres were analyzed in water as the dispersion medium, using refractive indexes of 1.33 and 1.55 for water and PLGA, respectively. The volumetric mean diameter D[4.3] was used to evaluate the particle size of the produced microparticles.",isopropanol,1.38,nan
10.1016/S1369-7021(09)70179-8,"Modern integrated optical structures require access to materials covering a wide range of refractive indices and dense materials with very low refractive indices (n < 1.39) do not exist. MgF2, CaF2, and SiO2 are dense materials with refractive indices among the lowest available but their refractive indices, nMgF2 = 1.39, nCaF2 = 1.44, nSiO2 = 1.46, are much higher than that of air. An optical, thin film material with a refractive index close to that of air could enhance the performance of many photonics applications, such as broad-band anti-reflection coatings, omni-directional reflectors, distributed Bragg reflectors (DBRs), optical micro-resonators, light-emitting diodes (LEDs), and optical inter-connects. Films fabricated by evaporation-induced self-assembly or oblique-angle deposition have refractive index values which can bridge the gap between conventional solid materials and air. Using these techniques, thin SiO2 films with refractive index values as low as 1.05 were achieved. Conductive films of indium-tin-oxide(ITO) have been produced with a refractive index as low as n = 1.17.",SiO2,1.05,nan
10.1016/j.jpcs.2015.10.005,"where νmd is barycenter for 5D0→7F1 emission in wavenumber (cm−1), n is the refractive index of the host, h is Planck's constant and equals to 6.626×10−27 erg·s; 2J+1 is the degeneracy of the initial state J, Smd is the magnetic dipole transition line strength (Smd=7.83×10−42), which is independent from the host. The refractive index of the host KLa(MoO4)2 can be deduced to be 2.02 from Eq. since AF17 is already known as listed in . Once the radiative transition rates AFJ7 (J=2, 4 and 6) for the electric transitions are derived, the J–O parameters ΩJ can be estimated from following equation,",KLa(MoO4)2,2.02,nan
10.1016/j.solmat.2004.07.030,"The thickness of nine-layer films having different TiO2 mixture percentages vary between 250 and 280 nm, and 11-layer films vary between 310 and 345 nm. The thickness increment per layer was about 30 nm. TiO2-mixed Nb2O5 (Nb2O5:TiO2) films exhibit high transmittance values in the visible and near infrared region. The films coated by sol–gel method have porous structure, and thus, they have smaller refractive indices compared to the other methods. Refractive index of Nb2O5 film is reported as 1.82 at 550 nm wavelength , and that of TiO2 film is measured as 1.80. Refractive indices of 270 nm thick (nine layer) films with respect to the wavelength are shown in ",Nb2O5,1.82,nan
10.1016/S0925-4005(02)00148-X,"where d0=d2−d3. Because the refractive index of the semiconductor GaAs is much greater than that of other materials in the sensing probe (about ns=3.34, when the incident light wavelength is in the range between 0.78 and 8.0 μm), and additionally the semiconductor crystal is very thin, the refracted angle at the GaAs/glass interface is fairly small and the beam deviation due to its effect maybe ignored. And this ignored effect can be as an invariant systematic error, which can be eliminated by the calibration process. Here, in case of s1, s3⪢s2, t, the third term of could be neglected, and the beam deviation d would be the function of (n0/n), which is independent on the temperature variation.",GaAs,3.34,nan
10.1016/S0925-4005(02)00245-9,"It can be supposed that owing to a relatively small diameter of the fiber, the temperature of the fiber in the sensing region closely followed the changing temperature of water in the cell. From the response in it follows that a temperature decrease of 1.3 °C resulted in a signal decrease of ≈6.5 a.u., which corresponded to an average signal decrease of ≈1.4%/°C. On this basis, e.g. slightly different values of the output signal for the fiber in air at the beginnings of static exposures can be explained by changes of the temperature in the laboratory. From the given value of 1.4%/°C and responses in , it can be found that approximately the same decrease of the output signal could be obtained by decreasing the temperature of water in the cell by 1 °C as by a 2.5-min dynamic exposure of the fiber to a toluene solution with a concentration of 19 mg/l. By taking a value of −4.2×10−4/°C as an approximate temperature coefficient of the refractive index of the dimethylpolysiloxane cladding , a refractive index increase of 4.2×10−4 of the cladding at the core/cladding boundary at the end of the dynamic exposure to a solution with a toluene concentration of 19 mg/l can be estimated. A slight decrease of the output signal at the end of the repeated exposure to 24.6 °C-warm water against the first exposure to water of this temperature can be explained by the previously observed gradual output signal decrease caused by penetration of water into the cladding.",dimethylpolysiloxane,4.2,nan
10.1016/j.mee.2008.12.082,", the influence of the fluorination degree on their absorption spectra is shown. By increasing the degree of fluorination, the absorption is decreasing as a result of the reduced hydrogen content, leading to a higher optical transparency than that of PMMA in the spectral range 300–900 nm. The refractive indices of the various methacrylates were also measured and found to vary between 1.43 and 1.49 (at 400 nm), mainly influenced by the fluorination degree and the film polarizability. In particular, a higher degree of fluorination results in a lower polarizability (as a result of the lower polarizability of the fluorine atoms ) and a lower refractive index than that of PMMA (n
= 1.51 at 400 nm). The refractive index of all the materials reported here shows similar wavelength dependence in the ultraviolet and visible (an initial fast decrease in the ultraviolet followed by a more gradual decrease in the visible). As one can see in ",PMMA,1.51,nan
10.1016/j.mee.2010.12.113,"a, is based on a three holes defect L3 cavity structure . The Q factor of the device was numerically optimized by sequentially shifting three groups of air holes (labeled A, B, and C in a) and performing Finite Difference Time Domain (FDTD) simulations. The thickness of the membrane was set to t =
200 nm while the refractive index of SiN was set to n
= 2.01. The optimal device was attained when the radius of air holes and lattice constant were set to r =
70.2 nm and a =
250.9 nm, respectively. A maximum Q of 3280 was attained at a wavelength of λ
= 620 nm when the hole shifts for groups A, B and C were displaced by a distance of 0.07a, 0.04a and 0.24a, respectively. b plots the y-component of the electric field of the cavity mode that achieves the optimal Q.",SiN,2.01,nan
10.1016/j.mee.2009.11.092,"A 50 nm-thick gold film was thermally deposited on the polished glass slides in a diffusion-pumped evaporation system (BOC Edwards Auto 500) at a rate of ∼16 nm/min and a pressure of 2 × 10−6
mbar. The deposition rate and thickness of the films were measured and displayed by a film thickness monitor (FTM), which is based on crystal microbalance. The measurement of SPR response curves was performed in a Biosuplar 3 SPR Reflectometer (Mivitec Co.). The refractive index of sensing layer was changed by using water and ethanol as buffer solutions. The refractive index units of DI water and ethanol are 1.3321 and 1.3592, respectively. Each sample was tested three times on the same machine. An SPR curve was obtained by averaging the three testing results. The performance of the SPR biosensors was evaluated in terms of two aspects. First, the shift in resonance angle for a given change in the sensing layer refractive index should be maximized. Second, the FWHM corresponding to the SPR curves should be minimized so that the error in determining the resonance angle is minimal.",ethanol,1.3321,nan
10.1016/j.ejpb.2014.07.007,"Mass median diameter was measured using Malvern Mastersizer 2000® laser diffractometer attached to a dry sampling system (Scirocco 2000, Malvern Instruments, Malvern, UK) with a suitable standard operating procedure (SOP). SOP was generated using lactose as a sample at refractive index of 1.33, 50% vibration feed rate, 12 s measurement time, 2 bar dispersive air pressure. Particle size is characterized by the mass median diameter (d0.5), i.e., the size in microns at which 50% of the sample is smaller and 50% is larger. Values reported are the average of three observations.",lactose,1.33,nan
10.1016/j.spmi.2015.07.048,"Here μ0 is the vacuum permeability, ω – angular frequency of the absorbed photon, n – refractive index (3.49 for silicon), Ei and Ej are the energy levels of subbands for the absorptive transition, Ef – Fermi energy, Γ=ħ/τ is the broadening of absorption peak, where τ is the intersubband relaxation time, m∗ – effective mass of electrons, T – lattice temperature, kB – Boltzmann constant, L – quantum well width, σij the difference in electron concentration. For the broadening we took the newest value Γ=2
meV, obtained experimentally and supported by theoretical calculations for the structures similar to ours. To make our results closer to the realistic situation we also took into account the depolarization shift according to :",silicon,3.49,nan
10.1016/j.apenergy.2011.05.037,"where R is the reflectivity, and n1 and n2 are the refractive indexes of the first and second medium, respectively. As an approximation, the refractive indices of the four liquids shown in , and the cuvette quartz with a refractive index of 1.460, are assumed to be wavelength-independent, since the reflection losses between liquid sample and cuvette walls are comparatively small. The actual computed values, from the Fresnel equation, are 0.43%, 0.17%, 0.19% and 0.10% respectively for DI water, IPA, ethyl acetate, and dimethyl silicon oil, arising solely from the refractive index difference between two liquid–quartz interfaces.",quartz,1.46,nan
10.1016/j.fusengdes.2014.01.029,"At this time, two spheres at the downstream region were fixed by a metal wire mesh not to flow out and the other spheres were arrayed regularly. Since diameters of the cylindrical domain and the spheres have high-accuracy, all of the spheres did not move in the process of measurement. The observed area was more than 6 layers of a sphere pair away from the mesh. A 62.9 wt% NaI solution at 21 °C matched its refractive index to 1.4905. This combination of the concentration and temperature resulting in an refractive index of 1.4905 has already been proven as shown in . The visualization of the flow field is conducted at a Reynolds number (Red
=
Ud
·
d/ν) of 700, where Ud and d stand for inlet velocity and sphere diameter. The mean inlet velocity, which is equivalent to the superficial velocity in the SPP, is 0.154 m/s. When the refractive indices between the working fluid and the sphere are matched, the hologram fringe image of the particles behind the sphere can be observed, and the particle positions can be reconstructed by a digital hologram. In this work, the hologram fringe images were captured through a high-resolution digital CCD camera (IDT NR5S2) without a lens with a resolution of 2336 pixels × 1728 pixels (7 μm/pixel). This technique captured the images at 1 kHz, and used 1024 pixels × 1024 pixels in the full imaging area. The camera and the laser were synchronized by a pulse generator, and the exposure time was set to 100 μs. The system was design to work with 2169 frames using the camera memory with a sampling rate of 1 kHz.",NaI,1.4905,nan
10.1016/j.spmi.2015.09.028,"InGaN-based quantum well structures have been widely used for active layers in light emitting diodes (LEDs) due to the tenability of the emitted light from UV through visible spectral range . The photoluminescence (PL) efficiency of LEDs is generally determined as the product of the light extraction efficiency (LEE) and the internal quantum efficiency (IQE). However, due to most commercial LEDs being fabricated based on a conventional structure with a planar light-extracting surface, further development of efficient InGaN-based LEDs has being obstructed by two main drawbacks. First, the LEE of a conventional planar GaN-based LED is limited by an internal reflection effect due to the large difference in the refractive index between the GaN (n = 2.5) and air (n = 1) . Second, it is well-known that there is a strong strain-induced piezoelectric polarization field in the conventional c-plane InGaN/GaN multi quantum well (MQW) active region due to the lattice mismatch between GaN and InN (of up to 11%). The piezoelectric polarization field results in a quantum-confined Stark effect (QCSE), which can cause a red-shift in emission peak and a decrease in wave function overlap between the electron and the hole in a QW . Thus, conventional c-plane InGaN/GaN MQW LEDs, especially for green LEDs with higher In concentrations, suffer from a reduction of IQE . Therefore, to obtain high-performance LEDs with high-quantum efficiency, improvements to LEE and IQE are required.",GaN,2.5,nan
10.1016/j.mee.2010.07.042,"Metal films were thermally evaporated under a pressure of 5 × 10−6
Torr without heating the substrate. The thickness was monitored during deposition with a microbalance and calibrated using an optical profiler. The precursor solution for ZTO films was synthesized by dissolving 0.03 M zinc acetate (Zn(CH3COO)2) and 0.03 M tin chloride (SnCl2) in 2-methoxyethanol separately. To get a more stable solution, the precursors were chelated with acetylacetone (CH3COCH2COCH3) with an equivalent molar ratio. Two solutions were then mixed and stirred for 6 h at room temperature. The mixed solution was finally filtered through a 0.2 μm syringe filter. ZTO films were deposited by spin-coating the precursor solution. The film thickness was controlled by rpm and measured by an alpha step. Sintering was carried out for 1 h at 500 °C in ambient atmosphere. A pulsed Nd–YAG laser (wavelength = 1064 nm, pulse width = 6 ns, repetition rate = 10 Hz, maximum average power = 8.5 W) was used as the laser source. The output laser beam of 0.9 cm diameter was expanded by a beam expander (3× or 5×) when necessary. A single pulse was used for all patterning. Patterning by three-beam interference was carried out using a refracting prism made of quartz (refractive index = 1.48). The prism has the shape of a trigonal-pyramid. A laser beam was made incident onto the bottom surface of the prism and this made the simultaneous split and recombination of the beam possible with a single prism. I–V curves of TFTs were measured using a semiconductor parameter analyzer (HP 4156A, MS-Tech).",quartz,1.48,nan
10.1016/j.infrared.2017.11.026,"In general, optical granular scattering occurs in two-component composite materials due to the difference between their refractive indices . In our case, however, the measured refractive index of DDA was 1.536 at 1 THz and this value is almost same as that of the PE powder (=1.54). Consequently, scattering could not occur in the mixtures of PE powder and DDA particles. In our experiment, the intensity of the reference THz spectrum shows highest value at 0.5 THz. Hence, we obtained the THz transmittances of the DDA filters before and after heating at 0.5 THz as shown in ",DDA,1.536,nan
10.1529/biophysj.103.037697,"where P is the time-averaged incident laser power, R=[(n1−n2)/(n1+n2)]2 the Fresnel reflection coefficient for reflection from a surface at normal incidence, using n1
= 1.59 as the refractive index for the polystyrene microsphere and n2
= 1.33 for the surrounding buffer. Θ Stands for the average angle of incidence of the laser beam that is truncated at x
=
b in the back focal plane,",polystyrene,1.33,nan
10.1016/j.optmat.2018.12.057, where provides three dimensional schematic and shows top view of the design. The structure comprises of circular gold resonators and gold ground plane separated by SiO2 substrate. Circular resonators are arranged in 4 × 4 array as represented in . The refractive index of SiO2 is considered as 1.45. The refractive index of gold is considered to be frequency dependent and taken from the tabulated data []. Gold circular resonators arranged in array on SiO2 substrate acts as metasurface which enhances the absorptance of the structure.,SiO2,1.45,nan
10.1016/j.electacta.2012.10.131,"where Γmax is the maximum surface concentration of the surfactant, μorg and μw represent the average permanent dipole moment normal to the surface of adsorbed DMAP(H+) and water molecules respectively, m is the number of water molecules displaced by a single DMAP(H+) molecule and ɛ represents the permittivity of the inner layer. As the orientation of water molecules on Au(1 1 1) is largely random the value of μw should be negligible. The refractive index of DMAP was assumed to be 1.57 which was then used to estimate the inner layer permittivity and calculate the average dipole moment of the adsorbed molecules. The results are presented in ",DMAP,1.57,nan
10.1016/j.inoche.2008.12.001,"where OD(λ) is the absorption coefficient at wavelength λ; λ ̄ is the mean wavelength of the specific absorption band; NNd is the concentration of Nd3+(NNd=3.01×1017cm-3), L is the optical length (L
= 1 cm); e, h, and c are the electron charge, Planck’s constant, and velocity of light, respectively; and n is the refractive index of the chloroform solution (n
= 1.446).According to Judd–Ofelt theory, the line strength for electric-dipole (ED) transition between the initial J manifold ",chloroform,1.446,nan
10.1016/j.optmat.2018.11.034,". In this structure, the nanocomposite layer is sandwiched between of two MoS2 layers. The thickness of nanocomposite layer is 30 nm. The graphene layer is deposited on the second MoS2 layer as the biological diagnosis component. An air gap is created between the first MoS2 layer and the prism base. The thickness of the air layer is 35 nm. Also, refractive index of air is 1. The refractive indexes of layers are considered as follows: The first layer is prism (BK7, SF10 and 2S2G) having refractive index of 1.515 [], 1.723 [] and 2.358 [] at λ = 633 nm, respectively. The complex refractive of MoS2 layer is 5.9 + 0.8i [] and its thickness is as dM = M × 0.65 nm (M is the number of MoS2 layers). The complex refractive index of graphene in visible range is 3 + 1.1487i [] and its thickness is as dG = L × 0.34 nm (L is the number of graphene layers). The refractive index of nanocomposite depend on the nanoparticles materials which are dispersed in a continuous host dielectric matrix of other component [] and it is explained in the mathematical modeling for nanocomposite film in section . The refractive index of the sensing medium is given as ns = 1.33. Variation in the refractive index of the sensing medium is due to the adsorption of bio-molecules on the surface of graphene and its numerical value is considering 0.005 in this paper. Also, the wavelength of the incident light is 633 nm.",BK7,1.515,nan
10.1016/j.jfoodeng.2007.12.027,"The particle size distributions of the high-pressure homogenized samples and the native sample were determined using the laser scattering method. The equipment used was a Mastersizer 2000 laser diffractometer (Malvern Instruments, UK) equipped with a He–Ne laser with wavelength of 632.8 nm. The dry starch samples were dispersed in anhydrous alcohol in the diffractometer cell before measurements. The refractive indices of anhydrous alcohol and the starch used were 1.32 and 1.53, respectively. The absorbance of starch granules was taken as 0.1 ().",alcohol,1.32,nan
10.1016/j.compositesa.2016.07.024,"Refractive indices of the aligned PA-6 nanofiber mats obtained at rotating speeds of 500, 1000, and 1500 rpm were determined by the immersion liquid set method . Briefly, PA-6 nanofiber strips (50 mm × 10 mm × 0.05 mm) were respectively suspended in a set of acetone-methylene diiodide mixtures with varied refractive indices ranging from 1.500 to 1.620 at a step interval of 0.005, where the refractive indices of acetone (n = 1.355) and methylene diiodide (n = 1.742) were prior measured by an Abbe refractometer (WAY-1S, Shanghai Precision Scientific Instrument, Shanghai, China) at room temperature. Then, the transmission data of PA-6 nanofiber mats in acetone-methylene diiodide mixtures were measured at 589 nm wavelength using a UV–vis spectrometer (TU-1810, Beijing Purkinje General Instrument) at room temperature. Lastly, transmission curves as a function of the refractive indices of the acetone-methylene diiodide mixtures were drawn to derive the refractive indices of different PA-6 nanofiber mats by identifying the locations with maximal transmittance through Gauss-fitting.",acetone,1.355,nan
10.1016/j.compositesa.2016.07.024,"Poly(methyl methacrylate) (PMMA) (Mw
= 3.0 × 107
g/mol, refractive index n = 1.49) was purchased from the Aladdin Chemistry (Shanghai, China), whereas PA-6 (Mw
= 52,800 g/mol) was supplied by the Shanghai Elite Plastic (Shanghai, China). Hexafluoroisopropanol (HFIP, purity ⩾98%) from the Shanghai Darui Fine Chemicals (Shanghai, China) was used as the common solvent for dissolving PMMA and PA-6 separately. Acetone, methylene diiodide, fluorescein isothiocyanate (FITC) and Rhodamine B were purchased from Sinopharm Chemical Reagents (Shanghai, China). These materials and chemicals were used as received without further purification.",PMMA,1.49,nan
10.1016/j.cherd.2010.03.004,". The crystals are modeled as a simple elongated rectangle which should provide a good representation of their actual appearance. Important in this context is the ratio between length and width of the crystals. As can be seen in the pictures the particles are usually quite elongated. For the sieved crystals an average ratio of length to width of approximately three to one has been measured. For the actual seed crystals and crystals inside the process an average length to width ratio of approximately six to one has been found. These geometries are an important input to the model. Another input variable that has to be provided is the refractive index of the medium. For the calibration experiments (see next chapter) the refractive index of ethanol, used as the liquid phase, has been inserted (n
= 1.36). For the crystallization system the refractive index depends on the mass fraction of threonine in solution. It has been set to a value of n
= 1.36 corresponding to a mass fraction of 15% ",ethanol,1.36,nan
10.1016/S0022-4073(03)00262-0,"Using formulae the calculations of the resulting flux distribution over emitting bases of the conical and cylindrical enclosures were performed over a wide range of geometrical parameters and values of absorption coefficient a. Refractive index n was chosen to be equal 2.0, close to the values of the refractive index of such optical crystals as sapphire (n=1.75) and bismuth germanate (n=2.15). The reflection coefficient was calculated in most cases by Fresnel's formula. However, for comparison the specular reflection coefficient independent of the angle of incidence was also considered. The bulk temperature Tvol was assumed to be equal to T0 that is not violating the generality of the results obtained.",sapphire,1.75,nan
10.1016/j.mssp.2018.09.004,"a. Since the Schottky emission is field dependent process, it is dominant at the higher voltage region (from -1V to −1.5 V) shown by the linear regions in the a. The Schottky barrier heights and dynamic dielectric constants of the MOS capacitors with various Mg concentrations are tabulated in . The dynamic dielectric constant κsc must be equal to the square of the refractive index of the material. The values of κsc in the are almost close to 4.32 which is exactly matching with the square of the refractive index (2.08) of ZrO2 thin films reported . Therefore, Schottky emission is a dominant conduction mechanism in all the MOS capacitors. However, it can be noticed from that the Schottky barrier height φsc has decreased with increasing Mg ion concentration. The other type of conduction that occurs due to barrier lowering is Poole-Frenkel emission. It is similar to Schottky emission but rather bulk limited conduction where the barrier height of the traps present in the dielectric material gets lowered with the electric field. The linear plot of ln(J/V2) versus V1/2 represent that the conduction mechanism is due to Poole-Frenkel emission. The current density following Poole-Frenkel emission is given by following Eq. .",ZrO2,2.08,nan
10.1016/j.spmi.2015.11.007,"Current crowding and light trapping play a vital role in effecting LEE, which limits the device performance. Current accumulation near the electrodes leads to a non-uniform current distribution across the device, which results in overheating of the active region, thus leading to decrease in emission efficiency of light at high operating current. Uniform current distribution in active region is quite important for improved LED performance. The light extraction efficiency had been the bottleneck of LED efficiency due to the relatively high refractive index semiconductors. The large difference in the refractive index between GaN (n = 2.3) and the surrounding air (n = 1) causes light emitted from the active region to be reflected internally and eventually to be absorbed back. Only 4% of emitted light from active layer can escape from LED because of low escape cone (23.6°) at the GaN-air interface . Hence, a great amount of photons emitted from the quantum wells are lost within the GaN layer due to light confinement and consequent re-absorption. Various methods have been anticipated to improve the light extraction efficiency of LEDs such as micro-patterning , nano-patterning , surface roughening , coating of porous films , photonic crystals , use of transparent conducting layers , current blocking layers , quaternary alloys and many more. As mentioned, a lot of work has been done to improve light extraction efficiency. Bogdanov et al. reported about 69% of LEE at 1000 mA .",GaN,2.3,nan
10.1529/biophysj.105.065482,"in which p and ɛ express the orientation factor for transition moment of fluorescent molecules and the frequency-dependent complex dielectric constant composed of real (ɛ′) and imaginary (ɛ′′) parts, respectively. The subscripts 1 and 2 denote the dielectric and gold layers, respectively. Depending on whether the transition moment aligns to the direction parallel or perpendicular to the substrate surface, the value of p can be set as 3/4 or 3/2, respectively. The transition moment of fluorescent molecule, DiD, used in this study is considered to tilt at ∼75–80° to the metal surface normal , i.e., to be almost parallel to the surface . Therefore, the value of p was set to 0.8 in this study. The fluorescence quantum yield of DiD could be assumed to be near 1.0 by referring to the previous reports . Under the currently used experimental conditions (gold layer thickness (d2) = 48 ± 5 nm, refractive index of SiO2 (n1) = 1.45, and fluorescence wavelength (λem) = 670 nm), Eq. is considered to be valid for d1
< ∼70 nm. As found from Eq. , bˆET can be expressed by the product of the constant value, β, and the reciprocal of the third power of d1. By introducing Eqs. to Eq. , F(d1)/F0 is derived to be",SiO2,1.45,nan
10.1016/j.mee.2009.10.033,"The use of stress-free SiN-layers to build membranes is important. Traditionally, options for fabricating such films have been to use low pressure chemical vapor deposition (LPCVD) , dual frequency plasma enhanced chemical vapor deposition (PECVD) or He-containing plasma in PECVD . Wei et al. have recently proposed a novel way to deposit such films using high RF-power in PECVD . The reported deposition recipe shows low residual stress (4 MPa) and an extraordinarily high deposition rate of 320 nm/min with 600 W plasma power. This demonstration is interesting since it allows faster deposition rates compared to other methods. We modified their recipe for our PECVD system (Oxford Plasmalab 80 plus, Oxford instruments) which only allows excitation powers up to 300 W at 13.56 MHz. By tuning the process parameters we were able to achieve high deposition rate and low stress of the films. With a power of 235 W we achieved less than −4 MPa strain. The flow rates of the precursors were 20 sccm for SiH4, 960 sccm for N2 and 30 sccm for NH3 and the pressure was 1 Torr. The deposition rate under these conditions was 40 nm/min, the refractive index of SiN was 1.92 and the etch rates in BHF (7:1) and KOH:H20 (30% at 80 °C) were 160 nm/min and 2.7 nm/min, respectively. Strain was determined by measuring wafer curvature prior to and after deposition.",SiN,1.92,nan
10.1016/S0022-2313(00)00223-4," shows the absorption cross-sections for pump radiation in fluoroaluminate glass and in ZBLAN. It is seen that the pump wavelength can be anywhere between ∼440 nm and ∼480 nm, and therefore is available from a number of convenient sources such as He–Cd laser and blue diode laser. The absorption cross-section is somewhat (∼5%) larger in ZBLAN than in fluoroaluminate glass, due to its higher refractive index (1.50 in ZBLAN, 1.45 in fluoroaluminate). The absorption spectrum in fluoroaluminate glass is noticeably broader than in ZBLAN. This is in consequence of the large variety of dopant sites offered by fluoroaluminate glass, which arise from the presence of many different network modifiers. Referring to the glass compositions quoted above, ZBLAN has four network modifiers, whilst fluoroaluminate has 8, two of which are oxides (Al(PO3)3 and LiPO3). The peak wavelengths in the two glasses differ slightly; this is highly relevant to the possibility of generating 589 nm lasing, as discussed below.",fluoroaluminate,1.5,nan
10.1016/j.optmat.2018.11.026,"Theoretically derived absorption band based on Mie theory is shown in (b). Observed theory and measured optical absorption show some variations, because in the measured optical absorption there will be distribution of Au particles sizes whereas the theory considers only a single size. But in practicality, another suspension (H2O) is a factor to be taken into consideration along with SiO2. For the theory, the refractive index of nano sized SiO2 is taken as 1.45.",SiO2,1.45,nan
10.1016/j.solmat.2006.05.001,"Nb-doped TiO2 films have been fabricated by RF magnetron sputtering as protective material for transparent-conducting oxide (TCO) films used in Si thin film solar cells. It is found that TiO2 has higher resistance against hydrogen radical exposure, utilizing the hot-wire CVD (catalytic CVD) apparatus, compared with SnO2 and ZnO. Further, the minimum thickness of TiO2 film as protective material for TCO was experimentally investigated. Electrical conductivity of TiO2 in the as-deposited film is found to be ∼10−6
S/cm due to the Nb doping. Higher conductivity of ∼10−2
S/cm is achieved in thermally annealed films. Nitrogen treatments of Nb-doped TiO2 film have been also performed for improvements of optical and electric properties of the film. The electrical conductivity becomes 4.5×10−2
S/cm by N2 annealing of TiO2 films at 500 °C for 30 min. It is found that the refractive index n of Nb-doped TiO2 films can be controlled by nitrogen doping (from n=2.2 to 2.5 at λ = 550 nm) using N2 as a reactive gas. The controllability of n implies a better optical matching at the TCO/p-layer interface in Si thin film solar cells.",TiO2,2.2,nan
10.1016/j.solmat.2005.07.002,"Light scattering relies upon change in the refractive index between the active layer of TiO2 (effective refractive index 2.0 with the adsorbed dye and the electrolyte ) and the scattering layer cast on top of the active layer. Light scattering abilities of these scattering layers also depend on the relative sizes of the particles in the layers. In this paper we demonstrate the use of ZrO2 with refractive index of 2.1, TiO2-Rutile with refractive index 2.8 and various mixtures of TiO2-Rutile and ZrO2 as light scattering layers. The sizes of the scattering particles range from 500 to 1000 nm. The scattering effect of TiO2-Rutile and ZrO2 can be calculated using Mie theory for single scattering surrounded by an effective medium. It was observed that the effective Mie scatterers are those particles whose dimensions are comparable to the wavelength of light and the back scattering efficiency can be taken as an indication of absorption enhancement due to higher light trapping in the device, which increases with higher refractive indices .",TiO2,2,nan
10.1016/j.solmat.2005.07.002,"Light scattering relies upon change in the refractive index between the active layer of TiO2 (effective refractive index 2.0 with the adsorbed dye and the electrolyte ) and the scattering layer cast on top of the active layer. Light scattering abilities of these scattering layers also depend on the relative sizes of the particles in the layers. In this paper we demonstrate the use of ZrO2 with refractive index of 2.1, TiO2-Rutile with refractive index 2.8 and various mixtures of TiO2-Rutile and ZrO2 as light scattering layers. The sizes of the scattering particles range from 500 to 1000 nm. The scattering effect of TiO2-Rutile and ZrO2 can be calculated using Mie theory for single scattering surrounded by an effective medium. It was observed that the effective Mie scatterers are those particles whose dimensions are comparable to the wavelength of light and the back scattering efficiency can be taken as an indication of absorption enhancement due to higher light trapping in the device, which increases with higher refractive indices .",ZrO2,2.1,nan
10.1016/S0925-4005(02)00324-6,"A TiO2 film/K+ ion-exchanged glass composite OWG based on tapered velocity couplers was developed in our laboratory. Titanium dioxide film is very transparent, stable and has a high refractive index (2.3–2.5). This type of composite OWG is extremely sensitive to surface conditions because the intensity of the evanescent wave at the guiding film surface is very strong; it has been applied to a refractive index sensor to enhance sensitivity . Although this system has outstanding sensitivity, it alone cannot be used for guided wave or evanescent wave absorption-based chemical sensors because the TiO2 thin films sputtered onto the K+ ion-exchanged glass OWGs are chemically passive. It is necessary to coat the films with a sensing layer when they are being used as active composite OWG chemical sensors.",TiO2,2.3,nan
10.1016/S0925-4005(02)00324-6,"It is clear that SOWG increases with nf. This means that the intensity of the electric field on the surface of the OWG becomes stronger when nf is large, making SOWG higher. Thin films with high refractive indexes deposited onto transparent substrates exhibit very high sensitivity, but they also usually show large losses of guided light, mainly because of surface roughness . Thus, high sensitivity and low loss have been mutually exclusive properties in OWGs when applied to chemical or biological sensors. We have proposed an approach to overcome this difficulty, constructing a composite structure with both a low loss part and a high sensitivity part on one substrate. The low loss part has a small refractive index (K+ ion-exchanged glass OWGs: 1.515–1.518) and the highly sensitive part (a much smaller area than the substrate surface) has large refractive index. Recently we built this type of composite OWG using BTB film/K+ ion-exchanged glass, polytungstic acid (PTA) thin film/K+, and FePO4 film/K+; the refractive indexes of the thin films were 1.69, 1.95 and 1.72, respectively . Since the TiO2 thin film has a very large refractive index (>2.3), the maximum relative sensitivity (SOWG) of the TiO2 film/K+ ion-exchanged glass composite OWG should theoretically be greater than 3.8×104 times/cm; in fact, the SOWG proved too high to be accurately measured by the dye adsorption method .",TiO2,2.3,nan
10.1016/S0925-4005(02)00324-6," shows the composite OWG used in this experiment. The width of the TiO2 film (including the 2 mm long slopes) was about 9 mm. The TiO2 film prepared was likely amorphous, because it was formed at relatively low substrate temperatures. The refractive index of the TiO2 films measured 2.28–2.36 at thicknesses of 17, 19, 38 and 54 nm.",TiO2,2.3,nan
10.1016/S0925-4005(02)00324-6,"where x is the distance from the surface towards the bulk, ns the refractive index of the glass substrate, ΔnTiO2 and ΔnBTB are the difference in refractive index between substrate and thin film, and Teff,TiO2 and Teff,BTB are the thicknesses of each OWG layer. We set the refractive index (TiO2: 2.30, BTB: 1.69, substrate: 1.51, K+: 1.518) and thickness of the TiO2 film at 10, 15, 18, 20 and 35 nm, and changed the thickness of the BTB film and obtained the results shown in ",TiO2,2.3,nan
10.1016/j.optlaseng.2016.10.011,"To prove the feasibility of the proposed method, experiments are carried out using a phase plate made of BK7 glass (refractive index n=1.5168) as the specimen. The step height of the specimen is supplied by BRUKER Atomic Force Microscopy (AFM) and the result is about 580.22 nm, which provides an optical path difference (OPD) of 0.95π rad at λ=632.8 nm. Before the measurement of specimen, two interferograms with phase shift of π/2 shown in ",BK7,1.5168,nan
10.1016/j.optlastec.2016.10.013,"In recent years, nanocrystalline ZnO is widely studied in gas sensing applications due to significant physical properties . ZnO exhibits high chemical and thermal stabilities. The optical properties of ZnO have not been much explored for optical sensing applications and it has about 80% transparency in visible and UV regions with a refractive index of 1.901. In this study, therefore, ZnO is used as gas sensing medium.",ZnO,1.901,nan
10.1016/j.solmat.2006.06.008,"TiO2-overcoated SnO2:F transparent conductive oxide films were prepared by atmospheric pressure chemical vapor deposition (APCVD) and an effect of TiO2 layer thickness on a-Si solar cell properties was investigated. The optical properties and the structure of the TiO2 films were evaluated by spectroscopic ellipsometry and X-ray difractometry. a-Si thin film solar cells were fabricated on the SnO2:F films over-coated with TiO2 films of various thicknesses (1.0, 1.5 and 2.0 nm) and I–V characteristics of these cells were measured under 1 sun (100 mW/cm2 AM-1.5) illumination. It was found that the TiO2 film deposited by APCVD has a refractive index of 2.4 at 550 nm and anatase crystal structure. The conversion efficiency of the a-Si solar cell fabricated on the 2.0 nm TiO2-overcoated SnO2:F film increased by 3%, which is mainly attributed to an increase in open circuit voltage (Voc) of 30 mV.",TiO2,2.4,nan
10.1016/S0378-7753(00)00428-6," to be compatible with our ellipsometer. A fused silica prism with a trapezoidal cross-section directed the incident probing light beam to the Li/polymer electrolyte interface, and then guided the light beam to the detector port after reflection from the electrode. The two inclined prism surfaces were carefully machined and finished so that their normals were exactly parallel (to within 0.5°) to the propagating light beam wave vectors. Therefore, the probing light beam was not refracted by the prism before it reached the Li/polymer electrolyte interface or after reflection from the Li electrode surface. Thus, the probing light could be represented accurately as a homogeneous plane wave when it reached the bottom plane of the prism and entered the polymer electrolyte. Fused silica was identified as an excellent prism material because of its mechanical strength, thermal stability, chemical inertness, small absorbance and absence of birefringence. The refractive index of fused silica (n=1.46) is close to that of PEO-based polymer (n=1.47), therefore the reflection loss at the prism/polymer interface could be ignored without introducing a significant error.",silica,1.46,nan
10.1016/j.fuel.2009.08.037,"The size of the carbon particle in the boiler is relative big comparing with the detected wavelength 0.56 μm, whose diameter is in the range of 10–250 μm. The complex refractive index m of the carbon particle equal to 1.3–0.01i at 0.56 μm . The absorption efficiency factor of the carbon particle is calculated based on the Mie theory, as shown in ",carbon,1.3,nan
10.1016/S0925-4005(03)00029-7,"By using straight PCS sensing fibers coated in the detection region with thin layers of the commercially available polymer Cablelite 950-701 and excited by an inclined collimated beams, toluene dissolved in water in concentrations higher than 10 mg/l can be detected. This type of polymer has a suitable value of the refractive index of about 1.44 and exhibits hydrophobic nature necessary for toluene to dissolve in it. This concentration value allows us to conclude that the studied detection approach seems suitable for monitoring the quality of water, e.g. from refineries or for detecting fuel leakages.",toluene,1.44,nan
10.1016/j.optlastec.2016.09.038,"where d is the coated film thickness, nm is the refractive index of the coated material, and λ1&λ2 are the two adjacent dips in the interference spectrum. The refractive index of the coated ZnO has been assumed to be constant in the NIR range and equal to 1.92 at 1550 nm . The results also predicted the thickness of the thin film coated on the mirror to be of 13 μm. Wei et al. have discussed further, in detail, as to how the cavity formation leads to the interference pattern, which was also seen in our case ((a)).",ZnO,1.92,nan
10.1016/j.solmat.2006.09.005,"where n, N, αp, ε0, and ρ are refractive index, number of diploes per unit volume, polarizability of dipoles, permittivity of free space, and film density, respectively. Assuming a refractive index of 2.5 for bulk WO3, the relative film density ρ/ρ0 can be estimated as ∼0.80 for S1, S2, and 0.83 for S3 at λ=550 nm. The increased density in S3 samples could be attributed to the densification of films by the impact of energetic particles on the growing film surface during deposition. Particularly, the negative oxygen ions reflected from the target due to ‘negative ion effects’ is presumed to be the main source of film densification. The spectral dependence of extinction coefficients (k) of the films deposited at various oxygen pressures is presented in (inset). At λ=550 nm the k value of samples S1, S2, and S3 are found to be 0.03, 0.02, and 0.04, respectively. The experimentally determined k values are in close agreement with the reported literature values for WO3 films .",WO3,2.5,nan
10.1016/j.solmat.2006.08.005,"In the present study, ZnO thin films having a refractive index of approximately 2.0 for AR coatings were formed on spherical Si solar cells by chemical deposition from an aqueous solution of zinc nitrate and dimethylamineborane (DMAB). The fabrication method and resultant ZnO film properties are described. Furthermore, the effects of the ZnO film on the performance of the spherical Si solar cells are discussed.",ZnO,2,nan
10.1016/j.dyepig.2011.04.004,"From the β and n2 values, the effective third-order NLO susceptibility χ(3) values of the title compounds can be calculated according to the equations: XI(3)=9×108ɛ0n02c2β/(4ωπ), XR(3)=cn02n2/(80π), X(3)=[(XI(3))2+(XR(3))2]1/2. The second hyperpolarizability γ′ of the compounds was obtained by γ′=X(3)/[N((n02+2)/3)4], where N is the density of molecules in the unit of number of molecules per cm3 and n0 is the linear refractive index of the CH3CN (n0 = 1.53). The detailed parameters of the NLO properties of the title compounds were tabled as follows.",CH3CN,1.53,nan
10.1016/j.solmat.2005.09.021,"For a given Eg of the solar cell C1 the position of the intermediate level and the relaxation energy inside the UC were varied to give the maximum efficiency (this variation corresponds to the variation of the band-gap energies Eg,3 and Eg,4, respectively). The limiting efficiency of the UC-system also depends on the refractive index of the solar cell and of the UC-materials . We used a refractive index n=3.6 for all calculations, a value that is representative of solar cell materials like e.g. silicon and GaAs. ",silicon,3.6,nan
10.1016/j.fuel.2011.04.019,"It is known that the refractive index of oils increases with increasing triglyceride chain lengths and increasing degrees of unsaturation, which is described by the iodine index . This relation is observed when comparing jupati oil with sunflower and palm oils because jupati oil has refractive and iodine indices of 1.4630 and 75.06, respectively, while sunflower and palm oil have refractive indices of 1.4679 and 1.4550 and iodine values of 143.0 and 53.0, respectively. The sunflower oil refractive and iodine indices are higher because of its higher percentage of unsaturated fatty acids (88.0%) compared to jupati oil (67.2%), which in turn has higher indices than palm oil (52.4%).",iodine,1.4679,nan
10.1016/j.solener.2011.07.014,"Rare earth complex EuTT is firstly synthesized by a procedure previously reported (). Then LSC employing EuTT is fabricated by dip coating of PMMA solution onto a piece K9 glass (100 × 100 × 3 mm3 and its refractive index n
= 1.52) which is prepared by dissolving 10 wt% EuTT/PMMA into cyclopentanone. Thus LSC with 25 μm–thick film atop the glass was obtained. At last a piece of single silicon solar cell (10 × 3 mm2) is attached to one edge of LSC by epoxy glue while the other three edges are blocked using black paper.",PMMA,1.52,nan
10.1016/j.measurement.2016.05.023,"Fine Alumina powder product code A2320, average particle size 50 μm, which is equivalent to mesh size 70 with a purity of up to 99.9% metal basis an average density of 3.95 g/cm3, refractive index 1.768, melting point 2980 °C was supplied by Rankem Chemicals, Mumbai, India. PC having an average molecular weight (MW) 20,000 was procured from Sigma Aldrich, India and white PMMA powder was procured from Sigma Aldrich, India, with an average MW. 15,000 (CAS No. 9011-14-7).",Alumina,1.768,nan
10.1016/j.colsurfb.2011.11.027,"The ζ-potential measurements and flavonoid particle sizing measurements were carried out using a Nanoseries ZS instrument (Zetasizer Nano-ZS, Malvern Instruments, Worcestershire, UK). The instrument measures the direction and velocity of particles in an applied electrical field via phase analysis light scattering and laser Doppler velocimetry. The calculated electrophoretic mobility was automatically converted into ζ-potential values using the Smoluchowski model (directly by the instrument software). Flavonoid dispersions were prepared by mixing the flavonoid powder with buffer (or water) via a vortex mixer (Genie 2, Scientific Industries, USA) operating at full speed for 2.5 min at an initial concentration of 100 μM or 500 μM. Two readings of ζ-potential were made per sample and each measurement was repeated on three separately prepared samples on different days. All readings were obtained with a count rate > 200 kcps. For flavonoid particle size measurement, in the absence of further information, a refractive index of 1.429, i.e., the value for n-tetradecane was used. Difficulty occurred when attempting to size rutin and naringin particles at all pH investigated.",flavonoid,1.429,nan
10.1016/j.solmat.2004.11.012,"A. Titanium Dioxide White. Titanium dioxide white (a) scatters strongly in most of the solar spectrum but absorbs strongly in the UV (below 400 nm). In most of the visible and infrared spectra there is little absorption. The inferred scattering coefficient S declines by two orders of magnitude between 400 and 2500 nm, which is typical behavior for scattering pigments. For generic TiO2 (rutile) we have 200-nm particles of refractive index ≈2.7. For well-dispersed particles that are much smaller than the wavelength, we expect Rayleigh behavior in which the scattering cross section decreases as λ-4. Thus we might expect S to decline by more than three orders of magnitude between 400 and 2500 nm. On a log–log plot (not shown), the slope of the scattering curve is increasingly negative at longer wavelengths, reaching about -3 at 2500 nm, so that the Rayleigh limit is not quite reached. The “background” or minimum absorption coefficient here of 0.5mm-1, multiplied by film thickness, is about 0.015. Since, as mentioned earlier, absorptance measurement uncertainties are on the order of 0.01, no definite conclusion can be reached about the actual minimum absorptance. In fact, the underprediction of reflectance over white from 600 to 1400 nm suggests that the film absorptance may be slightly overestimated.",TiO2,2.7,nan
10.1016/j.solmat.2006.06.046," shows the schematic apparatus for the CBD method. The deposition process is simple; first, a water bath is warmed up at certain temperature, and then a glass beaker (growth bath) containing a chemical solution is soaked in the water bath, at the same time substrates are immersed in the beaker and a film deposition is performed for certain duration. Here, a CdS thin film is utilized as an AR coating for its well-understood deposition mechanism and a relatively suitable refractive index of 2.6. The chemical solution for the CdS deposition consists of four chemicals; 0.001 M (mol/l) Cd(CH3COO)2·2H2O, 0.005 M (NH2)2CS, 0.01 M CH3COONH4 and 0.4 M NH4OH. The water bath temperature and growth duration are 80 °C and 13 min, respectively. The films were deposited on silicon spheres, silicon wafers and glass substrates to investigate film coverage, surface morphology and reflectance.",CdS,2.6,nan
10.1016/j.mimet.2012.08.004,"The results of this comparison revealed that no additional distortion or shrinkage of protozoa was observed in a modified technique when compared with the standard technique. The protozoa appeared more deeply stained; peripheral chromatin and karyosome of E. histolytica/dispar cyst and E. coli trophozoite, and remnant flagellum, axostil and parabasal body of G. intestinalis are clearly observed in a modified technique. A generally modified technique demonstrated better contrast background when compared with the standard technique. In optics, the refractive index of a substance is a number that describes how light or any other radiation propagates through that medium. Xylene has a refractive index of 1.486 whereby Wintergreen oil has a refractive index of 1.536 (). High refractive index will give a high clarity of the image. In conclusion, based on findings of this present study and considering the adverse effects of xylene on human health and environment, we concluded that Wintergreen oil should be used as a substitute of xylene in Wheatley's trichrome staining technique.",Xylene,1.486,nan
10.1016/S0924-4247(01)00564-7,"The second one uses microcavities made in a silicon substrate, which are filled with the scintillator . The problem of this approach is that CsI has a low refractive index (≈1.8) at 560 nm when compared with silicon (≈4). Only the light produced by the scintillator that reaches the silicon wall at low angles is reflected. The remainder light is absorbed by the silicon walls or transmitted to the adjacent wells.",CsI,1.8,nan
10.1016/j.matlet.2012.07.086,"It should be noted that, the refractive index depends on the film deposition method since the mass density of materials and crystal orientations will affect the refractive index. According to Lorentz–Lorenz equation, refractive index increases with rising of the film density . The crystal structure of CaF2 is cubic formation. Measured refractive index of CaF2 thin films by Filmetrics F20 is 1.44 at 550 nm. This result is in good agreement with literature .The spectral dependence of the refractive index for a CaF2 film is presented in .",CaF2,1.44,nan
10.1016/j.jtice.2018.07.004,". The nD values were 1.62–1.67 and Abbe numbers were 32–43. Poly(MY-co-SO2) has a higher refractive index and Abbe's number than commercial polysulfone (nD = 1.63 and νD = 25) and polymyrcene. In previous reports, the researchers presented that the combination of –SO2– and –S– groups should be effective in increasing both the refractive index and Abbe's number .",polysulfone,1.63,nan
10.1016/j.solmat.2007.06.009,", where the etching time was 17 min. The reflectance is remarkably reduced by the texturization for all wavelength regions in . About a half of the remained reflectance is due to the residual specular surfaces as shown in , because the reflectance is reduced to about 10% at the wavelength of 600 nm by a measurement without an angle spacer (not shown). The incident light into the depressions will reflect averagely three times at the wavelength of 600 nm. It should be noted that the absolute values of reflectance would be overestimated in the raw data shown in . For example, the reflectance of the mirror surfaces of silicon is calculated to be about 35.5% from the reported refractive index of 3.95 at 600 nm , but the experimental value is 47.8% at 600 nm as shown in . This experimental error is due to our measurement system including the reference plate.",silicon,3.95,nan
10.1016/j.radmeas.2016.06.006,"Poly (ethylene terephthalate) (PET) is available worldwide and has a broad range of applications. However, its basic properties as a scintillation material that is undoped with fluorescent guest molecules are not completely known. Here, we optically characterise undoped PET for use in radiation detection. Light absorption is primarily below 350 nm, with an emission maximum at 385 nm. An effective refractive index, determined from the emission spectrum and the wavelength dependence of the refractive index, is 1.62, which is greater than that for the sodium D line (ND = 1.57). The density of PET is 1.33 g/cm3, and its stopping power for 1-MeV electrons is 1.72 MeV cm2/g. Distinct peaks generated by alpha particles from 210Pb and 241Am radioactive sources appear in PET light-yield distributions. The PET response to 5-6-MeV alpha particles is approximately one-eighth that for electrons. These results demonstrate that undoped PET has special attributes for alpha particle detection. This knowledge will enable better performance of radiation equipment based on PET and its blends with other aromatic ring polymers.",sodium,1.57,nan
10.1016/j.solmat.2008.03.005,"Primary reflection can be reduced by refractive-index matching between adjacent layers. Therefore, a TiO2 layer can be employed since the refractive index of TiO2 is about 2.5 and thus between that of zinc oxide and silicon. It has already been shown experimentally that such a thin interlayer reduces reflection losses . The TiO2 thin-film deposition process has to be adjusted carefully to realize a transparent and sufficiently conductive film for the device application (for details see e.g. Ref. ). A chemical reduction of TiO2, which will appear during the exposure to hydrogen plasma in PECVD deposition of microcrystalline silicon, leads to additional absorption losses. This can be prevented by a thin (approx. 10 nm thickness) coating of plasma-resistant ZnO on top of the TiO2 layer . Accordingly, a TiO2/ZnO bilayer is used as an anti-reflection structure between the TCO front contact and silicon.",TiO2,2.5,nan
10.1016/j.polymdegradstab.2005.05.013,"1,2,4 Trichlorobenzene (TCB), 99% of purity was provided by Accros Organics (Belgium). One hundred and twenty-five milligram per litre of butylated hydroxy toluene (BHT) provided by Sigma Aldrich (France) was added to stabilize it. TCB has a refractive index of 1.5524 at 25 °C.",TCB,1.5524,nan
10.1016/j.cap.2013.05.016,"The sensor setup was fabricated by Renganathan et al. . It consists of a white light source (Model SL1, Stellar Net Inc., USA) with emission wavelengths from 100 to 2000 nm and a miniature fiber optic spectrometer (EPP-2000, Stellar Net Inc., USA) with spectral response from 100 to 1100 nm. The signal from the spectrometer is interfaced with a computer and the spectral graphs are recorded separately. Multimode plastic (PMMA) step index optical fiber (length 42 cm, diameter 750 μm and numerical aperture 0.51) is used with cleaved ends. The refractive index of the core is 1.492 and cladding 1.402. The refractive index of SnO2 is 1.945.",SnO2,1.945,nan
10.1016/j.carbpol.2012.11.058,". The refractive index of PPC is 1.46 and that of CAB is reported to be 1.47. Therefore, the nice transparency of the blends is attributed to the very close refractive index for the neat PPC and the neat CAB. Although the blends are phase separated, the good transparent CAB/PPC blends can be obtained. It is considered that the transparency is very important for the application of PPC/CAB blends as a package material.",PPC,1.46,nan
10.1016/j.ejpb.2015.04.015,"Particle size measurement of TA microparticles was conducted using a Malvern Mastersizer (Mastersizer 3000, Malvern Instruments, Worcestershire, UK) with the Hydro MV dispersion unit (Hydro MV, Malvern Instruments, Worcestershire, UK). TA was dispersed in ethanol and measured with a refractive index of 1.36 in triplicate.",ethanol,1.36,nan
10.1016/j.ijheatmasstransfer.2015.10.019,"The tracer particles used are Fluoro-Max red particles (Fisher, Waltham, MA, USA) with a particle diameter of 0.8 μm. These polystyrene particles have a density of 1.05 g/cm3 and a refractive index of 1.59 for 589 nm wavelength light at 298 K. This particle size, used in conjunction with the aforementioned lens, yielded a depth of correlation of 27 μm .",polystyrene,1.59,nan
10.1016/j.cap.2013.06.025,"Tellurite glasses have an advantages over other host glass due to their relative low-phonon energy (≈700 cm−1), high refractive index values (≈2.0), high dielectric constant, good corrosion resistance, large transmittance window in the visible and near infrared (≈360–6500 nm), high solubility of rare-earth (RE) ions, thermal and chemical stability . In addition, they posses relatively low transformation temperatures, high densities and non-hygroscopic properties, which limit the application of phosphate and borate glasses . Presently, RE ions coupled with plasmonic metallic nanoclusters have been developed to optimize the luminescence intensity of RE ions since the trivalent ion is one of the most widely exploited RE ions due to its favorable energy level structure and it offers simultaneous green and red emissions for laser applications .",Tellurite,2,nan
10.1016/S0925-4005(03)00414-3,"). In this case the descending part of the time response curve showing the effect of an increase of the toluene concentration in the cell (CTol.↑) and the ascending part showing the effect of the concentration decrease (CTol.↓) differ. The interaction of the xerogels with aqueous toluene solutions (e.g. of 20 ppm of toluene) can be characterized by a rapid decrease of the output power due to a concentration increase which is followed by a slow decrease of the power to a steady-state value (see ). At high concentrations (40 and 50 ppm) one can see that the slow decrease is followed by a slow increase of the output power. The power decrease can be explained by an increase of the refractive index of the xerogel due to penetration of liquid toluene with a refractive index of about 1.5 , while the power increase can be attributed to a refractive index decrease, probably due to swelling of the xerogel matrix. Similar effects, but more pronounced, have been observed in fiber-optic sensors based on polysiloxane polymer detection membranes .",toluene,1.5,nan
10.1016/j.commatsci.2014.03.035,"First principles calculations were performed for Ta3N5 compound using FP-LAPW within DFT. We have calculated electronic band structure, total and partial density of states, electronic charge density distribution and the dispersion of the optical properties for Ta3N5 as a visible light photocatalyst. Due to its specialty, mBJ presents better band gap value close to experimental result as compared to other approximations namely LDA, GGA and EVGGA. The successful value of band gap using mBJ for Ta3N5 is 2.1 eV which is agree well with the experimental result 2.1 eV and much better then the previous calculations. The band gap is indirect as the CBM is situated at point Y and VBM occur at the center of the Brilliouin zone. From the partial DOS we observed that valence band maximum is mostly dominated by N-p, and Ta-d states in the energy range between −6.0 and 0.0 eV. Hybridization of the states shows that covalent bond exist between Ta and N. electronic charge density contour plots represents covalent nature of chemical bonding. We found the refractive index for Ta3N5 and it bear 2.68 value in this calculation. The calculated absorption spectrum confirms that Ta3N5 compound is an active photocatalyst under visible light irradiation. The energy loss function and extinction coefficient is also calculated and discussed in details. The peaks in the energy loss function represent reduction in the trailing edges of reflectivity spectrum. The dispersion of the optical functions show that there exists a strong anisotropy between the three polarization directions which confirmed by the calculated value of the uniaxial anisotropy and the birefringence.",Ta3N5,2.68,nan
10.1016/S0925-4005(03)00123-0," illustrates an intensity spectra shift with an increase in analyte concentration. As the concentration of the ethanol increases (the refractive indices of water and ethanol are approximately 1.33 and 1.38, respectively), the effective index of the “cladding” layer on the sampling arm increases from that of pure water. As the effective index of the sampling arm becomes closer to the effective index of the reference arm, Δneff, the effective index difference between the sampling and reference arms, decreases. For this situation, a decreasing Δneff leads to a shift in the interference peaks to shorter wavelengths. illustrates a similar behavior for methanol. In both cases, the spectral profile spreads and shifts as the analyte concentration increases. The device response time is not expected in this case to be limited by the optical instrumentation but rather by the desorption and re-absorption rates of the analyte samples on the sensing arm.",ethanol,1.33,nan
10.1016/j.jqsrt.2004.08.022,"An artificial skin has been made in this study to empirically examine the surface reflection and transmission at skin surface. The artificial skin is a thin plate (about 0.5 mm) made of polyurethane that has the refractive index of 1.49 close to that of human skin (1.45–1.55) in the visible wavelength region. This has a skin structure of cheek (a female, middle twenty) on one side. In this experiment, we put the plate on an acrylic substratum having the same refractive index as the plate to exclude the reflection by the other side of the plate so that the artificial skin enables us to evaluate only the reflection by the surface having the skin structure.",polyurethane,1.49,nan
10.1016/S0925-4005(03)00257-0,". The waveguide substrate is silicon (ns=3.85−j0.019 at the working wavelength of 632.8 nm). The second cladding is a Thermally grown silicon dioxide (SiO2) layer with a refractive index of 1.46 and a thickness of 2 μm (). The first cladding is a silicon nitride (Si3N4) layer with a thickness of 0.12 μm and a refractive index of 2.00 deposited by low pressure chemical vapour deposition (LPCVD) at 800 °C (). Finally, the waveguide core is a non-stoichiometric silicon oxide (SiOx) layer with a refractive index that can be modulated according to x (). The technology of growing SiOx by plasma enhanced chemical vapour deposition (PECVD) has been developed previously in our group and we are capable of varying the refractive index between 1.46 and 1.9, depending on x. The core thickness is varied between 1.5 and 4 μm. To obtain lateral confinement of light, a rib structure is defined. The rib depth is designed to be around 60% of the core thickness to obtain good confinement of light. The rib is defined on the core layer by reactive ion etching (RIE) (). Several devices were designed with different widths, ranging from 4 to 7 μm, to experimentally analyse its influence in the guiding properties of the structure.",SiO2,1.46,nan
10.1016/j.solmat.2008.02.029,"Also due to the non-flatness of the film the MLP constructed from SilverluxTM is not suitable for obtaining images of the output irradiance pattern of the MLP. To obtain such images a solid MLP was constructed from PMMA and illuminated by the LED. The dimensions of the solid MLP was 132mm×40mm×40mm. To test the expression for the angular spread of the rays leaving the MLP the output of a solid MLP was projected onto a screen. A refractive index value for PMMA of 1.49 was used to determine the angle incidence within the solid MLP. The direction of light entering the MLP was defined as in (-cosβ,+sinβ,-cosθ).",PMMA,1.49,nan
10.1016/j.spmi.2016.02.037,"where λ0 is the wavelength used for monitoring at normal incidence, d(t) is the thickness of film which would increase linearly versus time (t) for a constant growth rate. N = n – ik is the complex refractive index of materials (NGaN for GaN film and Ns for GaAs substrate). n and k are respectively the real part of the refractive index and the extinction coefficient of the different materials. Values for the refractive index and extinction coefficient of GaAs were taken as ns = 3.86 and ks = 0.20 . The GaN optical constants (n and k) were parameters of the simulation. The refractive index of the gas-phase ambient is assumed to be equal to1. r12 and r23 are Fresnel reflection coefficients at interfaces ij for a smooth surface film. In the virtual interface model developed by Breiland et al. for rough surfaces, we used the effective Fresnel coefficients, in which the modification factors α(t),β(t)andγ(t) are related to the surface roughness σ(t) whatever the GaAs orientation.",GaAs,3.86,nan
10.1016/j.matchemphys.2005.01.042,"Recently, high-frequency broad-band pass surface acoustic wave devices with delay line structures have been theoretically or experimentally demonstrated using multilayer systems containing c-oriented LiNbO3 thin films deposited onto silicon , diamond-coated silicon or sapphire substrates . If the use of higher-acoustic velocity substrates, such as Al2O3 or C-coated Si, can substantially increased the Rayleigh wave velocity of LiNbO3-based systems, the price of such a technology remains a limitation when talking about large-scale production. On the contrary, from a technological point of view, the prospect of LiNbO3 thin films on Si substrates is particularly attractive in view to combine the ferro-piezoelectric processing capabilities of LN with the obvious advantages of Si. Indeed, Si technology continues to dominate the microelectronics market, providing a rigid substrate ideal for lithographic techniques. This will make possible the development of integrated devices in which sources, detectors and electronics, as well as ferroelectric and waveguiding components may be produced on the same wafer. Since the refractive index of Si (nSi
= 3.42) is higher than the refractive index of LiNbO3 (nLiNbO3=2.2), an appropriate buffer layer with a smaller index is thus required between the substrate and the ferroelectric material to confine the waves in the active layer. For this purpose, different works report on the use of amorphous silicon oxide (nSiO2=1.46) as a suitable intermediate layer for waveguiding applications .",LiNbO3,2.2,nan
10.1016/j.infrared.2018.07.001,"-glucose has its inflection points at 1.43, 2.07, 2.55, 2.67, 2.94, 3.34, and 3.75 THz. These results are agreed with the previous data . These observed absorption features can be accounted for intermolecular vibrational modes of the samples, dependent on the degree of crystallinity. HDPE which is used as control sample and buffer of glucose pellet has a refractive index of 1.39 and its slope is almost flat. HDPE is, consequently, almost transparent in the THz frequency even though its absorption coefficient was 10.2 cm−1 around 4 THz.",glucose,1.39,nan
10.1016/j.solmat.2010.09.014,". The SiNx films using the higher NH3 flow rate have a low silicon content and hence a low, slightly wavelength dependent, refractive index of around 2. As the silicon content in the film increases, the refractive index increases and the wavelength dependence becomes more pronounced. The refractive index of the SiNx film with the largest silicon content approaches 3.2 eV at a photon energy of around 4 eV.",silicon,3.2,nan
10.1016/j.micromeso.2006.06.034,"Inverse opal having mesoporous silica walls has been synthesized using close-packed polystyrene beads and octadecyltrimethylammonium chloride as a templates, and tetramethoxysilane as a silica precursor. The synthesized bimodal porous silica was characterized by XRD, N2 sorption, SEM and TEM. Hollow silica with inverted opaline structure had a macroporous diameter of 390 nm and a wall thickness of approximately 30 nm, and the mesoporous silica walls had a specific surface area of 367 m2/g, a mesopore diameter of 2.9 nm and a wall thickness of 1.8 nm. The refractive index (n) of this material was found be 1.05, which is lower than that of silica (n
= 1.44) and also close to that of the air.",silica,1.05,nan
10.1016/j.micromeso.2006.06.034,"Low density and low refractive index meso/macroporous silica having an inverted opaline structure has been successfully synthesized. The macroporous silica shells had a macropore diameter of 390 nm and a wall thickness of 30 nm. The N2 adsorption study of silica shells revealed a mesocopic structure having a mesopore size of 2.9 nm and a wall thickness of 1.8 nm. The refractive index of the hierarchical porous silica was found to be 1.05 which is lower than that of silica (n
= 1.44) and that of inverse opal silica without mesopores (n
= 1.11). The present inverted opaline structure having a combination of different pore-sizes could be applied in areas such as catalysis, adsorption/sorption and optical applications.",silica,1.44,nan
10.1016/j.commatsci.2014.06.045, shows the refractive index n(ω) and extinction coefficient k(ω) of two compounds. The static refractive index for SrZrN2 is 3.174 and that for SrHfN2 is 3.083. The origin of the peaks in ε2(ω) and k(ω) is the same. Other optical properties are presented in ,SrZrN2,3.174,nan
10.1016/j.carbpol.2012.09.076,"The LbL coatings topography was investigated on a scanning force microscope DI-3100 (Digital Instruments, Santa Barbara, USA) in the tapping mode. The thickness and refractive index of the polymer layers (in dry state on the surfaces of silicon wafers) were measured at λ
= 633 nm and an angle of incidence of 70° with a null-ellipsometer in a polarizer compensator-sample analyzer (Multiscope, Optrel Berlin) microfocus ellipsometer. Initially, the thickness of the native SiO2 layer was calculated at refractive indices n
= 3.858 −
i
× 0.018 and n
= 1.4598 for the Si wafer and the SiO2 layer, respectively.",SiO2,3.858,nan
10.1016/j.solmat.2006.02.031,"Furthermore, reflectance was higher for a wavelength shorter than 0.4 μm and for a wavelength longer than 1.1 μm. In the case of a short wavelength, the refractive index of silicon is approximately 5.5. Consequently, R is as high as 0.48. In the case of long wavelength, light is transmitted through the silicon substrate; therefore, the reflection on the back surface is added to that on the surface.",silicon,5.5,nan
10.1016/j.solmat.2006.02.031," shows a comparison between the simulation and experimental results obtained using the structure of the silicon substrate attached by a cover glass shown in . In this figure, good agreement is also observed between the experimental and simulation results. R ranged from 0.2 to 0.4; the values are comparatively lower than those in the case without glass. This is attributable to the lower R between the glass and the silicon substrate. Assuming the refractive index of the glass and silicon substrate to be 1.5 and 4, respectively, we determined R to be 0.2, which agrees well with the result in .",silicon,1.5,nan
10.1016/S0022-2313(01)00371-4,". The Bragg mirrors consist of seven λres/4 layers of alternatively high and low refractive index, ZnS (nH=2.3) and cryolite (nL=1.35), deposited by electron beam-assisted physical vapor deposition. The central spacer is a λres LiF film deposited by thermal evaporation which has been irradiated after the growth over 1.5×1 mm2 areas by electron beams in order to create F2 defects. We have selected two electron energies Ee, 4 and 6 keV, whose penetration is less than the spacer thickness . Then the production of active centers is limited to the LiF spacer, without damaging the bottom mirror. The electron beam current has been set at 2 nA, while the dose has been kept constant at 2×10−4
C/cm2. The whole layered structures have been deposited on fused silica substrates. In order to point out changes in the F2 centers photoemission inside the microcavity, also a single layer of LiF film () has been evaporated on a silica substrate in the same run and colored with identical irradiation conditions.",ZnS,2.3,nan
10.1016/j.infrared.2017.07.021,"where l
= 30 mm is the crystal length, d
= 5 mm is interelectrode gap, λ is the laser wavelength, and n is the refractive index of the crystal. The refractive index of CdTe crystal is equal to 2.68 at the wavelength of 6 μm . Neglecting dispersion in the crystal, our calculation demonstrates that the half-wave voltage increases from 6.2 to 7.5 kV in the wavelength range from 5 to 6 μm (",CdTe,2.68,nan
10.1529/biophysj.106.097071,". The image in represents a 645 × 430
μm spatial map of the ellipsometric angle Δ of a photochemically patterned DMPC bilayer on a silicon substrate . A corresponding thickness map derived using a refractive index of 1.44 is also shown (). Note that patterning, although not required for absolute determination of ellipsometric film thicknesses, alleviates the need for independent substrate characterization and provides an optical (and topographic) contrast to facilitate visualization and analysis.",DMPC,1.44,nan
10.1529/biophysj.106.097071,"Significant quantitative topographic information can also be obtained by calculating bilayer ellipsometric thickness from the spatially resolved Δ information in . The resulting thickness map derived using a single composite refractive index of 1.50 for the entire lipid phase is shown in . We note that the use of a single refractive index of 1.50, approximating the optical properties of the gel-phase GalCer domains, considerably simplifies the thickness calculations but introduces errors in accurately estimating absolute height differences between coexisting phases. These simplified calculations reveal that the dendritic features are indeed taller than the surrounding lipid, further supporting the longer acyl-chained GalCer as the primary constituent of these domains. Further, the taller GalCer domain regions correspond directly to the high-intensity regions in and to the low-Δ regions in .",GalCer,1.5,nan
10.1016/j.expthermflusci.2018.02.036," shows a schematic representation of the test section which, in its original configuration, consisted of three flush-connected sections manufactured in Plexiglas with a total length of 100D. Water kept at 20 °C±0.1°C was used as the working fluid for the hot-film measurements. The large difference in the refractive indices of water (n=1.33) and Plexiglas (n=1.49) obstructs PIV measurements close to the wall. To overcome this problem, one of the Plexiglas sections were interchanged for a tube made out of fluorinated ethylene propylene (FEP). FEP has a refractive index of 1.34, which is close to that of water. The length of the FEP tube was 10D, and the PIV measurements were performed close to the end of the tube not to have the connection between the materials next to the measurement section, although effort was spent to make the connection flush. To maintain the length of the test section, a different set of Plexiglas pipes were used during the PIV measurements. To match the refractive indices of the FEP tube and the working fluid, approximately 5% of glycerine and 95% of water (by volume) were mixed and used as the working fluid. Furthermore, a rectangular box filled with the same water-glycerine solution was placed around the FEP tube. This refractive index matching enabled measurements of the mean velocity down to a wall-normal distance of y+=2, based on the time-averaged viscous scale. Hence, the wall shear stress could be estimated by fitting a polynomial to the near-wall data and calculating the gradient of this curve fit at the wall.",FEP,1.34,nan
10.1016/j.enconman.2015.02.043,"The bottom-mounted LSCs were prepared by attaching commercial monocrystalline silicon solar cell (Trina Solar Co., Ltd., with dimension of 78 mm × 7 mm) to the bottom of the plates with ultraviolet (UV) adhesives (XSSS Optical adhesive UV-3129, with refractive index of 1.49). For comparison purpose, the conventional LSC with edge-mounted PV cells was also prepared by attaching four pieces of same monocrystalline silicon solar cells to the four edges of the plates and connecting them in series. The measured efficiency of the used monocrystalline silicon solar cell under AM 1.5 illumination was 17.0% with short-circuit current of 204 mA, open-circuit voltage of 0.605 V and fill factor of 0.752. For the bottom-mounted LSCs, silver mirrors (>85% reflectance for visible light) were attached to the four waveguide edges with UV adhesives. A white reflector was added to the bottom side of LSC (separated by an air gap) to increase the energy output, which was made by spraying a cardboard sheet with white paint (Dulux).",silicon,1.49,nan
10.1016/S0921-5107(02)00436-1,"Only two values of refractive indices have been reported for ZnSiP2: n=3.31 at 600 nm and n=3.06 at 900 nm. The direct energy gap in this compound was calculated at 2.98 eV, and modulated reflectance spectra on ZnSiP2 show the first direct transition occurs at 2.97 eV followed by another strong transition at 3.06 eV. These values correspond to electronic band transitions (Γ4, Γ5)→Γ1, respectively . Electronic band structure calculations have been carried out by J.L. Shay et al. ; C.V. de Alvarez et al. ; J.E. Jaffe et al. ; A. Heinrich et al. . The origin of experimentally observed transition in ZnSiP2 corresponding to an energy of 2.0 eV has not been explained to date.",ZnSiP2,3.31,nan
10.1016/j.solmat.2010.05.023,"In summary, mild solvothermal treatments on the organically modified TiO2 system resulted in the precise control of the particle size and crystallinity without significant agglomeration of the nanoparticles. The spin-coated TiO2 film showed the refractive index as high as 1.91 without thermal treatment. The non-aggregated TiO2 nanoparticles were successfully infiltrated into colloidal crystal template, which were consequently converted to the inverse opal structure which can be directly utilized as a photoelectrode of light-amplified DSSC.",TiO2,1.91,nan
10.1016/j.carbon.2015.10.063,"From Eq. and the Fresnel equations, it can be calculated that the Brewster angle of the quartz substrate (refractive index 1.955, non-absorbing ) is approximate 63°. It can explain the dramatic decline of the pulse 1 from quartz reference as shown in . From Eq. , the diversity of pulses 2 from graphene interface can be attributed to the changes of the sheet conductivity (as shown in Eq. ), and that of the impedance (as shown in ). Therefore, quantitative discussions are needed to reveal the variable angle dependent impedance matching properties of graphene.",quartz,1.955,nan
10.1016/j.carbon.2015.10.063,"From the view point of applications, there are many external treatment method to reduce the optimal layer number, taking the advantage of tunable Fermi energy and carrier density of graphene. For example, thermal annealing , chemical doping , electrical gating , and optical doping , and so on. Thermal annealing, which is used in this work, has reduced the doping degree of graphene and led to a Fermi energy of −0.06 eV. Chemical doping with HNO3 has been used previously , and has shown the ability to change the Fermi energy from −0.11 eV of untreated sample to −0.25 eV. In our previous work, the results also suggest that the optimal layer number for silicon substrate (refractive index 3.42) can be reduced to as low as 5, which is the same with the optimal layer number in this work for quartz (refractive index 1.955). It means that the optimal layer numbers could vary for various doping conditions. In the , the optimal layer number ranges have also been proposed with Fermi energy range of graphene limited by the annealed and the chemical doped situations. The results suggest that the optimal graphene layer number can be reduced by enhancing the doping level to meet the need of high refractive index substrate.",silicon,3.42,nan
10.1016/j.aquatox.2009.02.014,"The growth of the diatom community was followed by live cell density assessment based on the score of cells with chloroplasts determined with a Nageotte counting chamber. Following the French standard for the determination of the Diatom Biological Index (DBI) (AFNOR NF T90-354) samples were treated with hydrogen peroxide [CAS No.: 7722-84-1] to digest organic cell content and subsequently centrifuged (2571 ×
g for 10 min) in demineralised water four times to eliminate the hydrogen peroxide. An aliquot of 200 μL was dried on a cover slip. Siliceous diatom frustules fixed on the cover slip were mounted on a microscope slide with Naphrax (Brunel Microscope Ltd.), a resin with a high refractive index (1.74) dissolved in toluene. The slides were scanned with a light microscope (Leica DMRD Microsystems GmbH, Wetzlar, D) at a magnification of 1000× and about 400 frustules were identified as recommended by French standard NF T90-354. On each slide, between 10 and 15 parallels were run to identify and count diatom cells.",toluene,1.74,nan
10.1016/S0921-5107(02)00198-8,"The values for n and k reported in this paper compare well with other results reported in literature for titanium dioxide thin films obtained not only by the same technique , but by other methods: plasma-induced chemical vapor deposition , sol-gel method , ion-assisted deposition using a gridless end-Hall ion source , etc. So, using a sol-gel method, Gartner et al. report values for refractive index of 2.146 for TiO2 on glass and 2.051 for TiO2 on Si, at 546 nm (samples heat treated till 300 °C for 1 h). Gilo et al. , referring to titanium dioxide films obtained onto unheated substrates prepared by ion-assisted deposition using a gridless end-Hall ion source, give for n the values 2.1 (without IAD) and 2.4 (for layers evaporated at an ion gun voltage of 100 V), at 550 nm. Turner , obtained TiO2 films by plasma-induced chemical vapor deposition, 1 μm thick, with n=2.46, at 550 nm.",TiO2,2.146,nan
10.1016/j.optlastec.2017.05.009,"Using the analytical field model, we present results on near-field (NF) and the far-field (FF) distribution as well as its evolution from near-to-far-field of the mode radiating out from the end-facet of MOF with square-lattice of circular air-holes. The light is coupled in undoped silica core with refractive index of 1.45, created by a single “missing’’ air-hole. Our model is equipped well to take into account the field asymmetries around the air-holes, and it is capable for interpretation of the transition in shapes of near and the far-field patterns. The transition from near to far-field of the fundamental mode radiating out of an index-guiding MOF with triangular lattice has been investigated by Mortensen and Folkenberg . We have studied the evolution of the fundamental mode radiating out from the end-facet (i.e., z
= 0) of the fiber by using the Fresnel diffraction integral , from near to far-field domain with square-lattice of air-holes in the cladding with lattice constant of Ʌ = 3.5 μm and normalized air-hole diameter of d/Λ
= 0.5 at the free-space wavelength of 0.635 μm.",silica,1.45,nan
10.1529/biophysj.107.122747,"SPR spectroscopy was performed in a setup using the Kretschmann configuration with a measuring cell designed for use of SPR in combination with electrochemistry. The glass slide (LaSFN9 from Hellma Optik, Jena, Germany, refractive index n
= 1.85 at λ
= 633 nm) was optically matched to the base of a 90° glass prism (LaSFN9). Monochromatic light from a He-Ne laser (Uniphase, San Jose, CA; λ
= 632.8 nm) was directed through the prism and collected by a custom-made photodiode detector. Recording the change of reflectivity at a fixed angle in the linear regime of the SPR curve (",LaSFN9,1.85,nan
10.1016/j.vacuum.2013.03.015,"The influence of the deposition parameters on the mechanical properties of the deposited coatings was determined by means of an FT-IR Bio-Rad FTS 175 C spectrophotometer (Germany) equipped with an IRS microscope unit (with a silicon crystal with a refractive index of 3.736 and an angle of incidence plane refraction θ = 45°) (Harrick Scientific, USA). The samples were scanned 32 times in the wave number range 400÷4000 cm−1 at three different surface points (a–c) with a resolution of 4 cm−1. Out of the obtained spectra (",silicon,3.736,nan
10.1016/j.polymer.2016.04.026,"A Bruker Vertex 70 FTIR spectrometer equipped with an ATR (Attenuated Total Reflectance) accessory (ZnSe crystal, 45° angle of incidence and refractive index of 2.4) was employed for ATR-FTIR analysis of the skin layers of the membranes to investigate the presence of functional groups on their skin surfaces. The membranes' skin surfaces were kept faced down onto the ATR crystal element and a light pressure was applied using a MIRacle high pressure clamp with torque-limited press. The radiation penetration depth was 2 μm. All infrared spectra were recorded in absorbance mode over a wave number range 600–4000 cm−1 at 25 °C. For evaluation, 200 scans were taken with a spectral resolution of 2 cm−1.",ZnSe,2.4,nan
10.1016/j.cherd.2014.08.008,"The solids employed were poly(methyl methacrylate) (PMMA) particles of density, ρs
= 1300 kg m−3 and Sauter Mean diameters 18.0 μm, 75.3 μm and 195.5 μm (hereinafter referred to as d18.0, d75.3 and d195.5, respectively), while the liquid was tap water (ρl
= 1000 kg m−3). The Sauter Mean diameter of the PMMA particles (Refractive Index 1.49) is measured with a Malvern Mastersizer (Hydro MU 2000). Microscopic images of the particles presented in ",PMMA,1.49,nan
10.1016/j.dyepig.2012.07.007," and (supplementary data) respectively. The strong nonlinear refractions were exhibited for dyes. The valley-peak shape presented a positive nonlinear refraction for the samples, which indicated a self-focusing behavior. The nonlinear refractive data can be obtained from the ratio of the closed aperture transmittance divided the open aperture transmittance. The effective third-order nonlinear refractive index n2 can be calculated from the equations: ΔZV−P = 1.72πω02/λ, n2eff = λα0ΔTV−P/[0.812πI (1−e−αL)], where ΔZV−P is the difference between the normalized transmittance values at the valley and peak positions, L is the sample thickness, λ is the wavelength of the laser, I is the peak irradiation intensity at focus and α0 is the linear coefficient . The effective third-order nonlinear optical (NLO) susceptibility values of cyanine dyes 3–5 can be derived from the equations: χI(3) = 9 × 108ɛ0n02c2β/(4ωπ), χR(3) = cn02n2/(80π), χ(3) = [(χI(3))2+(χR(3))2]1/2. The second-order hyperpolarizabilities γ' of the compounds were obtained by equation: γ' = χ(3)/[N ((n02+2)/3)4], where N is the density of molecules in the unit of number of molecules per cm3 and n0 is the linear refractive index of the DMF (n0 = 1.4305). The detailed parameters of nonlinear optical (NLO) properties of these dyes were collected in ",DMF,1.4305,nan
10.1016/j.optlastec.2017.01.003,". The functional device comprises a single anisotropic metasurface described by a patterned Ag film on a semi-infinite thick SiO2 (glass) substrate with a refractive index of 1.44. The metasurface is consisted of a subwavelength broken rectangular annulus (BRA) arrays, in which four corners of a regular rectangular annulus are eliminated. The period of the array is P, thickness of Ag film is H. The length and width of the gaps along X and Y directions are Dx, Dy and Wx, Wy, respectively. Finite difference time domain (FDTD) method (Lumerical FDTD solutions, Canada) is used to calculate the transmitted fields in the numerical simulation. Periodic boundary conditions and perfectly matched layers condition are applied, respectively, at boundaries along X and Y axis and boundaries along Z axis. A linearly polarized plane wave with prescribed polarization orientation θ with respect to X axis normally illuminates the structure from the SiO2 substrate side. Far-field electric field intensity is observed above the whole system.",SiO2,1.44,nan
10.1016/j.solmat.2006.09.001,"The conducting glass was purchased from Nippon Sheet Glass, Japan. shows a six-phase configuration, air/glass substrate/SiO2/F-SnO2/homogeneous TiO2 nanoporous layer/air, of the system. The refractive index for the glass substrate and SiO2 are 1.524 and 1.460, respectively. The extinction coefficients for these layers are assumed to be zero at >350 nm. The refractive indices and the extinction coefficients for the F-SnO2 film were provided by Nippon Sheet Glass. The refractive index of the TiO2 film is dependent on the film porosity and was calculated using Eq. (see below). Transparent anatase TiO2 nanoporous films for the ellipsometry and transmittance measurements were prepared by the screen printing method, using the TiO2 paste purchased from Solaronix (Nanoxide HTSP). After the paste was deposited on the F-SnO2 conducting glass, the film was heated at 500 °C for 1 h. The TiO2 film thickness was 8.5±0.5 μm, and the porosity was 0.59±0.04.",SiO2,1.524,nan
10.1016/S0001-8686(01)00081-1,"All phases in a are dielectrics with refractive indices — real numbers. The refractive index of the aqueous phase is n2=1.331. It is convenient to introduce the notations β=2πn2h/λ and γ=2πn3dSiC/λ. Here h is the aqueous solution film thickness, dSiC is the thickness of the silicon carbide layer (equal to 300 nm) and 2π/λ is the wave number. The index of refraction of SiC is n3=2.697 . The refractive index of silicon is n4=3.87 . For the air phase n1=1.",silicon,3.87,nan
10.1016/j.bpj.2009.11.043,"As shown in , there was a point during protein microdroplet dissolution into the alcohol medium during which the refractive indices of the two liquids matched and the microdroplet became optically invisible. Lys concentration was calculated based on volume throughout the whole experiment, but this point provided a way to accurately and independently measure the concentration at a point close to solidification. A calibration curve (n versus C) for Lys solutions is shown in . The linear trend-line, setting n at C = 0 to 1.3319 (our average value for DI water), is n = 1.3319 + 0.1943C (R2 = 0.9905, C here is in g/mL). This is consistent with the line obtained by Fredericks et al. (), who found a slope of 0.2 mL/g. The refractive index of water-saturated decanol was measured as 1.4326, which intersects the Lys line at 518 mg/mL (Cn). This is the concentration at which the refractive indices of the concentrated Lys solution microdroplet and the immediate surrounding water-saturated decanol match and the droplet becomes invisible. For droplets made with Lys solution of known concentration and whose initial sizes could be accurately measured (N = 42 of 286), the average correction factor (kn =Cn/Cn′) was 1.01 ± 0.05, which confirms the accuracy of using the n-match to determine Lys concentration.",decanol,1.4326,nan
10.1016/j.carbon.2015.12.010,"where m is the mode number of cavity-photon modes, nc and dc are refractive index and thickness of resonator layer, respectively, and λc is the central wavelength where the reflectivity occurs. Inserting the central wavelength λc = 375 nm (UV FX emission), the refractive index of ZnO (n ≈ 2.45) at UV range and mode number m = 2 into the equation, we calculated the cavity thickness to be about 153 nm. In principle, such a value of cavity thickness correlates with results presented in , where the enhancement effect is observed at the thicknesses not exceeding 200 nm. In this regime, the exciting e-h pairs or excitons can interact with the confined optical field (cavity photons) in the ZnO microcavity, thereby improving radiative recombination efficiency . It is interesting to note that equation predicts that in the case of central wavelength as large as λc = 550 nm (visible luminescence) the optimal cavity thickness for the first cavity mode (m = 1) is approximately equal to 120 nm with consideration of wavelength-dependent refractive index of ZnO (n ≈ 2.3 for λc = 550 nm). It explains why we observed the PL enhancement not only within UV region, but also in the visible at the appropriate thicknesses.",ZnO,2.45,nan
10.1016/S0921-5107(02)00599-8,"The refractive index of the films deposited at ambient and at higher substrate temperatures were estimated at 546 nm using ellipsometer. The refractive index of SiO2 films deposited at ambient temperature was 1.45. As the substrate temperature was increased, the refractive index increased to 1.46, 1.475 and 1.480 for the films deposited at substrate temperatures 200, 300 and 400 °C, respectively. Pulker reported refractive index in the range 1.45–1.46 at 550 nm for SiO2 films deposited at room temperature and post-backed up to 600 °C. Narasimha Rao et al. reported that the refractive index was 1.45 and 1.46 at 550 nm for SiO2 films deposited at ambient and 250 °C, respectively. The present values of refractive index are in good agreement with the reported values.",SiO2,1.45,nan
10.1016/j.solmat.2010.04.015,"In terms of Eq. , the matched refraction index for ITO thin film is n=1.85 for the refractive index of silicon substrate with ns=3.42. Thus, the prime effect of intensified transmission and lessened reflection can be obtained for the wavelength of solar spectrum near 480 nm, when the thickness of the ITO film is about 65 nm. The diminished reflection of ITO (refraction index is 1.8–1.9) on textured Si can be well compared with the Si3N4 thin film of PECVD processing in the industry that was obtained within the visible region of sun spectra, as shown in . Additionally, the excelled antireflection from ITO layer on the textured Si was obtained for the wavelength extended over blue and ultraviolet region. The effect implies that the configuration of the ITO layer on the textured Si is suitable for the blue and ultraviolet cells owing to the less loss of the number of photons with a short wavelength, which is more favorable for high efficiency cells.",silicon,3.42,nan
10.1016/S0001-8686(01)00077-X,". Again we have no adjustable parameter (for the calculation of Aeff the refractive index of toluene was 1.4969). In spite of the much smaller interfacial tension and van der Waals attraction in comparison with the ones for foam systems (), the calculated critical thickness describes, again very well, all experimental data. The obtained stability thicknesses of bounded waves and the transitional thicknesses almost coincide () as it was for foam films. This fact could not be proven mathematically — it is the result only of numerical calculations.",toluene,1.4969,nan
10.1016/S0927-7765(99)00046-6,"). For the ABDMS- and for the SA-layer, a density of 1.15 g cm−3 was estimated assuming the same refractive index as the silica layer (1.466). The molar surface loading of 2.6 pmol mm−2 corresponds to a surface coverage of about 1012 ABDMS molecules mm−2. This figure is in good agreement with results from measurements using fluorescamine for determination of the amine group surface density (data not published). The molar loading of 2.5 pmol mm−2 by SA indicates that most of the amino groups (>90%) were converted by this reaction. Hence, the concentration of reactive groups on the surface for the attachment of the AMD was approximately 1012 mm−2.",silica,1.466,nan
10.1016/S0925-3467(99)00029-4,"Opals are ordered arrangements of silica nanoparticles. As such they can be viewed as photonic crystals. Spheres of silica with a refractive index of 1.45 immersed in air constitute a periodic system with a rather low index contrast. They occur in nature and are appreciated as gems. The colours they show are the consequence of multiple Bragg reflections in different planes and can be compared to X-ray diffractions by ordinary solid state crystals. Artificial opals can be synthesized in the laboratory by several methods. We have adopted that by Söber–Fink–Böhn that is a sol–gel process in which a Si metalorganic compound is hydrolyzed wherefrom Si–O chains are created and condensed leading to amorphous silica nanoparticles. Under controlled reaction conditions, monodisperse spheres with diameters in the range between tenths of a micron and a micron can be produced .",silica,1.45,nan
10.1016/j.optlastec.2017.03.037," shows the non-duplicated crazed microinterferogram of the drawn polypropylene fibre with draw ratio 2.3 immersed in a liquid of refractive index = 1.492, at temperature 23 °C. The craze density in the surface layers of this pattern was calculated using the modified (MIAS) and it was found to be 40%.",polypropylene,1.492,nan
10.1016/j.ijheatmasstransfer.2016.02.090,"where the refractive indices of the air, na, and the quartz glass with a wavelength of 3.39 μm, ng, are 1.00 and 1.41, respectively. nl is the liquid refractive index for a wavelength of 3.39 μm; for water, nl
=
nw
= 1.42 (Dorsey ), and for ethanol, nl
=
nE
= 1.34 (calculated by Kedenburg et al. ). The influence of the optical refraction in water was examined because the refraction in water is more sensitive than in ethanol. ",quartz,3.39,nan
10.1016/j.saa.2012.02.093,"For As2S3 film and bulk glass, linear refractive index is 2.40 and 2.45, respectively . At 532 nm the numerical value of third order nonlinear susceptibility (χ3) for As2S3 film is 2.8 × 10−15
esu and for bulk glass is 2.3 × 10−18
esu. As chalcogenide As2S3 thin film possesses greater magnitude of nonlinear parameters as compared to As2S3 glass therefore, it is better candidate for optical device applications than bulk sample.",As2S3,2.4,nan
10.1016/j.ijbiomac.2017.03.031,"Granule size measurement was carried out using a Malvern Mastersizer 2000 laser-diffraction analyzer (Version 5.22, Malvern, UK) using a 1000 mL flow-through reservoir. Each sample was added to the reservoir and fully dispersed in anhydrous ethanol until an obscuration value of between 12% and 17% was achieved. The refractive index of the starch samples and the dispersing reagent ethanol was 1.54 and 1.36, respectively. All the results are reported as the averages of three replicates.",ethanol,1.54,nan
10.1016/j.optlastec.2017.07.050,The optical components used in this study were right angle prims hot pressed from DURAN® borosilicate glass with high chemical resistance. In the spectral range from about 310–2200 nm the absorption of DURAN® glassware and consumer glass is negligibly low with refractive index 1.473 (λ=587.6nm). In untreated state it is clear and colourless. The approximate composition (in wt.%) of the glassy DURAN® is shown in ,DURAN,1.473,nan
10.1016/j.carbon.2015.06.018,"where the subscript “x” designates the C-dots, the subscript “std” designates quinine sulfate, “QY” stands for the quantum yield, “I” stands for the integrated PL intensity, “A” stands for the absorbance, and “η” stands for the refractive index of the solvent. Quinine sulfate (QY: 54.6%) was dissolved in 0.1 M H2SO4 (refractive index: 1.33) and the C-dots were dissolved in water (refractive index: 1.33). In order to minimize reabsorption effects, absorbance value of the individual solution was kept below 0.10 at the excitation wavelength.",H2SO4,1.33,nan
10.1016/j.bioelechem.2012.06.001,"The analysis and modeling of the obtained ellipsometric parameters Ψ and Δ within the spectral range: 400 nm to 800 nm with use of SpectraRay 2 Program (Sentech Instruments GmbH, Germany), allowed us to obtain the DMPC monolayer thickness equal to 2.3 nm ± 0.1 nm (refractive index for DMPC monolayer was set to 1.561) which is in excellent agreement with the literature data .",DMPC,1.561,nan
10.1016/j.solmat.2010.02.031,"Despite of the potential advantages of bringing together anti-reflection and photocatalytic self-cleaning (SC) capacity, reported developments are scarce. Z. Liu et al. reported a photoactive anti-reflection coating prepared from commercial colloidal solutions of TiO2 and SiO2 nanoparticles . Besides the latter, a multilayer AR/SC coating has been developed by means of pulse magnetron sputtering . Both of them, evaluate the super-hydrophilic behaviour under UV irradiation, but they do not report any study of the self-cleaning or photodegradation capacity of the multifunctional coatings. It must be considered, that outer SC TiO2 layers use to increase the reflectance of glass or plastic surfaces, due to its relatively high refractive index (ca. 2.5 for anatase phase) . Thus, such behaviour means a potential incompatibility between both functionalities, unless the composition and the structure are conveniently modulated.",TiO2,2.5,nan
10.1016/j.solmat.2010.02.031,"The use of the organic template in the preparative stage, has led to a noticeably reduction of refractive index of the TiO2 coatings (2.33 and 1.57 at 590 nm for DSC-4 and PSC-4, respectively). Such reduction of the refraction index represents the key that permits to build a TiO2 interference mono-layer, which improves the transmittance of the substrate over a wide range of the visible spectrum. AFM measurements on PSC-1 coating show a random distribution of discrete and connected pores with semi-circular sections (",TiO2,2.33,nan
10.1016/j.geomorph.2007.09.007,"Sedimentological analyses were conducted in the Laboratoire de Géographie Physique de Meudon (UMR 8591 — Centre National de la Recherche Scientifique, France). Grain-size analyses were also conducted at 5 cm intervals. The samples were mixed with a dispersing agent (0.5% of sodium hexametaphosphate) and left in deionised water for two hours to disperse the clay particles, and then exposed to ultrasound. The grain-size distribution was measured using a Coulter LS 230 laser granulometer with a range of 0.04 to 2000 μ, in 116 fractions. The calculation model (software version 2.05) uses Fraunhofer and Mie theory, which is applicable down to a grain-size of about 0.04 μm. For the calculation model, we used water as the medium (RI = 1.33 at 20 °C), a refractive index in the range of that of kaolinite for the solid phase (RI = 1.56), and absorption coefficients of 0.15 for the 750-nm laserwave length and 0.2 for the polarized wavelengths (). Samples containing fine particles were diluted using deionised water, so that we measured between 6 and 10% of obscuration and between 50 and 57% P.I.D.S. (Polarization Intensity Differential Scattering) obscuration.",kaolinite,1.56,nan
10.1016/j.infrared.2019.03.021,"where d is the thickness of the sample; Aω is the amplitude ratio of the Fourier transforms of the power transmission of the solution sample Is and the reference (the blank sample cell) Iref; nq=1.95 is the refractive index of quartz . And nω is the refractive index of the sample, determining how much the path of the THz beam is bent or refracted when entering a material, can be obtained by ",quartz,1.95,nan
10.1016/j.solmat.2011.09.052,"Silicon oxynitride (SiON) is being increasingly used for antireflection coatings and passivation layers to improve the efficiency of solar cells. Recent research has shown that multi-layered antireflection coatings using SiON and silicon nitride (SiN) give better transmission coefficients than single layered silicon nitride, therefore increasing the penetration of photons into the solar cell . SiON films have a highly tunable refractive index from SiO2 with a refractive index of 1.46 through to Si-rich SiN films of refractive index >2.7. This allows for the combination of desired dielectric properties of SiO2 with the low permeability and chemical inertness of SiN , and the optimisation of SiON films for front surface antireflection coatings with a refractive index of 2. In addition to this, rear surface films can be optimised for surface passivation using high refractive index films, or as back surface reflectors using low refractive index films such as SiO2.",SiO2,1.46,nan
10.1016/j.solmat.2011.09.052,"Silicon oxynitride (SiON) is being increasingly used for antireflection coatings and passivation layers to improve the efficiency of solar cells. Recent research has shown that multi-layered antireflection coatings using SiON and silicon nitride (SiN) give better transmission coefficients than single layered silicon nitride, therefore increasing the penetration of photons into the solar cell . SiON films have a highly tunable refractive index from SiO2 with a refractive index of 1.46 through to Si-rich SiN films of refractive index >2.7. This allows for the combination of desired dielectric properties of SiO2 with the low permeability and chemical inertness of SiN , and the optimisation of SiON films for front surface antireflection coatings with a refractive index of 2. In addition to this, rear surface films can be optimised for surface passivation using high refractive index films, or as back surface reflectors using low refractive index films such as SiO2.",SiON,2.7,nan
10.1016/j.micromeso.2006.09.038,"The titania of the realized skeleton structures is anatase, which has a refractive index of 2.5 in its dense form . In addition, the titania cylinders are porous, which will lower the effective refractive index. Because of these two reasons, the refractive index is not high enough to achieve a full band gap. In this paper, we investigate the porosity of the synthesized titania skeletons in detail and deduce a hypothesis for the formation mechanism of the skeletons. Based on the porosity, we propose a core-shell strategy to introduce high-refractive index components into this structure. It is theoretically shown that a full photonic band gap can thereby be achieved on the basis of existing structures.",titania,2.5,nan
10.1016/j.carbpol.2013.08.036,"The median particle size of CaCO3 and SrCO3 were determined using a particle size analyzer, Mastersizer S, from Malvern Instruments. The particles were dispersed in isopropanol (refractive index: 1.39) and treated with ultrasound for 3 × 15 s to disrupt agglomerations. The average value ± standard error (SE) from the median values of 9 runs from 3 separate sample additions is reported. Refractive index/imaginary indexes of CaCO3 and SrCO3 were 1.590/0.010 and 1.518/0.010, respectively. The reported specific particle surface areas were provided by the supplier.",isopropanol,1.39,nan
10.1016/j.diamond.2003.12.003,"The tips from both sides of each optical fibre were cut off. OF was placed in a special holder ensuring system's balance during measurements. The middle section of each OF was covered by a container allowing to fill it with some liquid (H2O, refractive index n=1.32). One end of the OF was supplied by a laser diode (λ=670 nm) whose amplitude was modulated with 1 MHz frequency. The other tip of the OF was connected to a detector system allowing a gain of input signal and demodulation. Four values of the transmission were measured: dry OF transmission, transmission for OF held over the liquid, transmission of OF drowned in the liquid and transmission of OF pulled out rapidly from the liquid.",H2O,1.32,nan
10.1016/j.polymdegradstab.2011.09.023,FT-IR spectra of aged and unaged XLPE films were obtained by an Avatar 330 (Thermo-Nicolet) instrument with a resolution of 4 cm−1 in transmission and in ATR (Attenuated Total Reflection) mode. In ATR mode a crystal of ZnSe (refractive index 2.4 at 1700 cm−1) and a minimum or 256 scans were used in order to obtain a high signal-to-noise ratio. IR spectra were recorded on samples derived by the coated ones after removal of the external coating by a suitably slight abrasion with a razor blade.,ZnSe,2.4,nan
10.1016/j.solmat.2012.02.009,". The Ag film used for the cell has a thickness of 23 nm. The SiO2 passivating layer was thinned to be 40 nm, as a compromise between the coupling and scattering behaviour of the Ag surface plasmons and the surface passivation provided by the SiO2 layer. The plasmon resonance is sensitive to the surrounding medium and is red-shifted to longer wavelengths with increased effective refractive index due to depolarisation effects . Hence 10 nm ZnS which has a refractive index of 2.2 was used to overcoat the nanoparticles by inducing a change in refractive index of the surrounding medium. Note: the “back reflector”, as illustrated in (b), is absent in variations 1, 2 and 5, but is present in variations 3 and 4 as a detached Al reflector layer and in variation 6 as an evaporated Al layer. Detached Al uses air as the overcoating layer whereas evaporated Al uses a dielectric (MgF2 in this case) as the overcoating layer.",ZnS,2.2,nan
10.1016/j.vacuum.2013.07.015,"Compared to silicon substrate with a refractive index of 3.43 at 3.8 μm, zinc sulfide (ZnS) has a smaller refractive index of 2.25 at 3.8 μm, which means that a coated film material with a refractive index nf ≈ 1.5 at 3.8 μm would be just right to realize a perfect antireflection effect on ZnS, according to the following formula :",silicon,3.43,nan
10.1016/j.vacuum.2013.07.015,"Compared to silicon substrate with a refractive index of 3.43 at 3.8 μm, zinc sulfide (ZnS) has a smaller refractive index of 2.25 at 3.8 μm, which means that a coated film material with a refractive index nf ≈ 1.5 at 3.8 μm would be just right to realize a perfect antireflection effect on ZnS, according to the following formula :",ZnS,2.25,nan
10.1016/j.orgel.2012.04.017,"pHEMA (75 wt.%; 50 mg/mL), 8OH-POSS (25 wt.%; 16,7 mg/mL), and dye (10 mM with respect to the polymer) were added to ethanol and stirred for 24 h to fully solve dye and polymer. Increasing the amount of 8OH-POSS above 25% in weight resulted in the excess of 8OH-POSS being exuded from the sample. Films 1 m thick were obtained by spin coating (1000 rpm, 30 s) the polymer solution onto quartz substrates and left at room temperature for several minutes to remove the remaining solvent. We have found no way to measure directly the refractive index of the hybrid matrix since the film surface is rough and this leads to errors when using, for example, variable angle spectroscopic ellipsometry (VASE). We have estimated it taking into account that the refractive index of pHEMA is 1.51, and the one of 8OH-POSS is close to this value, as we have shown previously . Then, the mixture of both must have a refractive index ∼1.51. As this refractive index is higher than that of the quartz substrate (n
= 1.456), the prepared samples defined asymmetric slab optical waveguides, where total internal refraction confines and guides the light along the film.",quartz,1.456,nan
10.1016/j.solmat.2012.02.020," shows the optical constants of the deposited Al2O3 and AZO thin films measured by spectroscopic ellipsometry. In the measurement of Al2O3 thin film, a standard Cauchy relationship was used . In addition, the Tauc–Lorentz model has been employed to model the AZO film. Recently, this model has been applied to dielectric function modeling of transparent conductive oxide . The refractive indices of the Al2O3 and AZO films at 550 nm were 1.69 and 1.87, respectively. To minimize reflection loss at the glass/AZO interface, the ARL requires a refractive index of about 1.67, which was calculated by finding the geometric mean of the two surrounding indices (i.e. n1=n0n2 where n0=1.5 (glass), n2=1.87 (AZO)). The refractive index of the deposited Al2O3 (1.69) is very close to the optimum value (1.67). The extinction coefficient values were found to be negligible in all wavelength regions, implying that incident photon loss caused by absorption in the Al2O3 ARL can be neglected.",Al2O3,1.67,nan
10.1016/j.carbpol.2013.10.103,"Ellipsometry measurements of RChitin and chitin NC films were conducted at multiple-angles-of-incidence (60–80°, 1° steps) using a He:Ne laser at a constant wavelength of 632.8 nm (Picometer Ellipsometer, Beaglehole Instruments). The thicknesses of the films were deduced from modeling with TFCompanion software (Semiconsoft) with an assumption of a refractive index of 1.51 for both RChitin and chitin NCs ().",chitin,1.51,nan
10.1016/j.jphotobiol.2010.12.005,"Two methods were used to determine the UV–visible transmission properties of the sporopollenin exine shells. For both methods, the overall light transmission is determined by a combination of light absorption, reflection and scattering processes. Light reflection and scattering is proportional to the square of the difference in refractive index (RI) of the exine and surrounding medium and so is significant for sporopollenin exines in air when the RI difference between the exine and surrounding medium is large. As reported in Ref. , sporopollenin exines are approximately refractive index matched to their surrounding fluid when dispersed in glycerol (RI = 1.475 ). Hence, light transmission of sporopollenin is expected to be determined almost entirely by absorption when the exines are dispersed in either glycerol or toluene (RI = 1.496 ) which both have RI values close to that of sporopollenin. Using both methods described below, optical transmission measurements were made both under air and dispersed in either glycerol or toluene in order to separate effects due to light absorption and reflection/scattering.",glycerol,1.475,nan
10.1016/j.bios.2017.07.051,"SFS400/440B Superguide G UV–vis silica fibers (Fiberguide Industries, Stirling, USA) were used for all experiments. The fibers had an original numerical aperture (NA) of 0.22, a core diameter of 400 μm (refractive index of 1.457 at 633 nm) and a surrounding silica cladding with a width of 40 μm (refractive index of 1.44 at 633 nm), in addition to a 150-μm-thick silicon buffer and a 210-μm-thick black Tefzel® jacket. The length of a single fiber used in the experiments was 20 cm. The black Tefzel® jacket and silicon buffer were mechanically stripped away using a fiber stripping tool (Micro-Strip®, from Micro-Electronics Inc., USA) to expose a 2 mm naked optical fiber core tip.",silica,1.44,nan
10.1016/j.jtice.2018.11.001,"This experimental work reports refractive index, extinction coefficients, and dielectric functions at different incident angles in visible range for the first time. The refractive index of CsPbI3 thin film is 2.46 at 435 nm with this result implies that Cs based lead halide solar cells may be, ideal antireflection coating for many tandem solar cells. Thus lower refractive index of CsPbI3 inorganic perovskite material is beneficial for perovskite device fabrications because of the minimum light looses to reflection at the front of the active layer. Furthermore microstructure of the cubic phase Pm-3 m was investigated by X-ray diffraction. CsPbI3 perovskite thin film showed the sharp absorption edge and PL emission near infrared region with direct band gap of 1.67 eV with high color purity of red emission. In addition, the higher dielectric function value of CsPbI3, will helps to many optoelectronic devices.",CsPbI3,2.46,nan
10.1016/j.optlastec.2017.08.019,"where p is the self-image number, nNCF and DNCF are the effective RI and diameter of the fundamental mode of the NCF, respectively. From the above equation, it is clearly seen that the peak wavelength of the BPF is determined by the three parameters LN, nNCF and DNCF. For a SNS structure with given NCF, the peak wavelength response of the BPF could be modified by changing the LN. The NCF (NCF125, POFC) used in our experiment has a core refractive index of 1.44 and diameter of 125 μm. The SNS structure is easy to be fabricated by a common commercial fiber fusion splicer (FSM-60s, Fujikura) with the AUTO MODE in the splicer menu. In order to achieve minimum insertion loss and relatively compact structures, the fourth self-image (p = 4) is chosen in our experiment . The black spectrum in ",NCF125,1.44,nan
10.1016/j.mee.2013.01.065,"In this work, the long-throw sputtering technique was used for depositing thin films with good conductivity and a high refractive index . The refractive index spectra are shown in (c). It can be seen that a small increase of effective refractive index occurred (ranging from 1.82 up to 2.0) due to an increase of the annealing temperature. Daniela et al. reported that the refractive index of RF-sputtered ZnO thin film increased with the increase in annealing temperature which was due to a decrease in the porosity of the films . This could be attributed to the changes in packing density within the film and slight increases in the arc-ZnO:TiO2 crystallinity. It is worth noticing that the effective refractive index of ITO glass (i.e., 1.78) still lies below the index of the ITO/arc-ZnO:TiO2 samples. Therefore, this indicates that the gradient refractive index of (narc-ZnO > nITO> nglass > nair) has been successfully tailored and become an effective means for reflection control in this multilayered conducting substrate.",ITO,1.78,nan